GT8G121 2002-02-06 1 toshiba insulated gate bipolar transistor silicon n channel igbt GT8G121 strobe flash applications 4th generation (trench gate structure) enhancement ? mode low saturation voltage : v ce (sat) = 7 v (max.) (@i c = 1 50 a) 4 v gate drive maximum ratings (ta = 25c) characteristic symbol rating unit collector ? emitter voltage v ces 400 v dc v ges 6 v gate ? emitter voltage pulse v ges 8 v dc i c 8 a collector current 1 ms i cp 150 a ta = 25c p c 1.1 w collector power dissipation tc = 25c p c 20 w junction temperature t j 150 c storage temperature range t stg ? 55~150 c electrical characteristics (ta = 25c) characteristic symbol test condition min typ. max unit gate leakage current i ges v ge = 6 v, v ce = 0 D D 10 a collector cut ? off current i ces v ce = 400 v, v ge = 0 D D 10 a gate ? emitter cut ? off voltage v ge (off) i c = 1 ma, v ce = 5 v 0.8 D 1.5 v collector ? emitter saturation voltage v ce (sat) i c = 150 a, v ge = 4 v (pulsed) D 3.5 7 v input capacitance c ies v ce = 10 v, v ge = 0, f = 1 mhz D 3800 D pf rise time t r D 2.3 D turn ? on time t on D 2.5 D fall time t f D 1.7 D switching time turn ? off time t off D 2.1 D s thermal resistance r th (j ? c) D D D 6.25 c / w these devices are mos type. users should follow proper esd handling procedures. operating condition of turn-off dv / dt should be lower than 400 v / s. unit: mm jedec D jeita D toshiba (a) 2 ? 7b5c (b) 2 ? 7b6c weight: 0.36g
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GT8G121 2002-02-06 5 toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others. the information contained herein is subject to change without notice. 000707ea a restrictions on product use
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