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  january 2003 ? 2003 fairchild semiconductor corporation fdn358p rev g (w) fdn358p single p-channel, logic level, powertrench ? ? ? ? mosfet general description this p-channel logic level mosfet is produced using fairchild semiconductor advanced power trench process that has been especially tailored to minimize the on-state resistance and yet maintain low gate charge for superior switching performance. these devices are well suited for portable electronics applications: load switching and power management, battery charging circuits, and dc/dc conversion. features ? ?1.5 a, ?30 v. r ds(on) = 125 m ? @ v gs = ?10 v r ds(on) = 200 m ? @ v gs = ?4.5 v ? low gate charge (4 nc typical) ? high performance trench technology for extremely low r ds(on) . ? high power version of industry standard sot-23 package. identical pin-out to sot-23 with 30% higher power handling capability. g d s supersot -3 tm d s g absolute maximum ratings t a =25 o c unless otherwise noted symbol parameter ratings units v dss drain-source voltage ?30 v v gss gate-source voltage 20 v i d drain current ? continuous (note 1a) ?1.5 a ? pulsed ?5 power dissipation for single operation (note 1a) 0.5 p d (note 1b) 0.46 w t j , t stg operating and storage junction temperature range ?55 to +150 c thermal characteristics r ja thermal resistance, junction-to-ambient (note 1a) 250 c/w r jc thermal resistance, junction-to-case (note 1) 75 c/w package marking and ordering information device marking device reel size tape width quantity 358 fdn358p 7?? 8mm 3000 units fdn358p
fdn358p rev g (w) electrical characteristics t a = 25c unless otherwise noted symbol parameter test conditions min typ max units off characteristics bv dss drain?source breakdown voltage v gs = 0 v, i d = ?250 a ?30 v ? bv dss ? t j breakdown voltage temperature coefficient i d = ?250 a, referenced to 25 c ?22 mv/ c v ds = ?24v, v gs = 0 v ?1 a i dss zero gate voltage drain current v ds = ?24v, v gs = 0 v, t j =55 c ?10 i gssf gate?body leakage, forward v gs = 20 v, v ds = 0 v 100 na i gssr gate?body leakage, reverse v gs = ?20 v, v ds = 0 v ?100 na on characteristics (note 2) v gs(th) gate threshold voltage v ds = v gs , i d = ?250 a ?1 ?1.9 ?3 v ? v gs(th) ? t j gate threshold voltage temperature coefficient i d = ?250 a, referenced to 25 c 4 mv/ c v gs = ?10 v, i d = ?1.5 a 105 125 m ? v gs = ?10 v, i d = ?1.5 a,t j =125 c 148 210 r ds(on) static drain?source on?resistance v gs = ?4.5 v, i d = ?1.2a, 161 200 i d(on) on?state drain current v gs = ?4.5 v, v ds = ?5 v ?5 a g fs forward transconductance v ds = ?5 v, i d = ?1.5 a 3.5 s dynamic characteristics c iss input capacitance 182 pf c oss output capacitance 56 pf c rss reverse transfer capacitance v ds = ?15 v, v gs = 0 v, f = 1.0 mhz 26 pf switching characteristics (note 2) t d(on) turn?on delay time 5 10 ns t r turn?on rise time 13 23 ns t d(off) turn?off delay time 12 21 ns t f turn?off fall time v dd = ?15 v, i d = ?0.5 a, v gs = ?10 v, r gen = 6 ? 2 4 ns q g total gate charge 4 5.6 nc q gs gate?source charge 0.8 nc q gd gate?drain charge v ds = ?15v, i d = ?1.5 a, v gs = ?10 v 0.8 nc drain?source diode characteristics and maximum ratings i s maximum continuous drain?source diode forward current ?0.42 a v sd drain?source diode forward voltage v gs = 0 v, i s = ?0.42 a (note 2) ?0.76 ?1.2 v notes: 1. r ja is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the so lder mounting surface of the drain pins. r jc is guaranteed by design while r ca is determined by the user's board design. a) 250 c/w when mounted on a 0.02 in 2 pad of 2 oz. copper. b) 270c/w when mounted on a minimum pad. scale 1 : 1 on letter size paper 2. pulse test: pulse width 300 s, duty cycle 2.0% fdn358p
fdn358p rev g (w) typical characteristics 0 1 2 3 4 5 00.511.522.5 -v ds , drain to source voltage (v) -i d , drain current (a) v gs =-10v -4.5v -3.5v -3.0v -6.0v 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 012345 -i d , drain current (a) r ds(on) , normalized drain-source on-resistance v gs =-4.0v -10v -6.0v -5.0v -7.0v -4.5v figure 1. on-region characteristics. figure 2. on-resistance variation with drain current and gate voltage. 0.6 0.8 1 1.2 1.4 1.6 -50 -25 0 25 50 75 100 125 150 t j , junction temperature ( o c) r ds(on) , normalized drain-source on-resistanc e i d = -1.5a v gs = -10v 0 0.1 0.2 0.3 0.4 246810 -v gs , gate to source voltage (v) r ds(on) , on-resistance (ohm) i d = -0.75a t a = 125 o c t a = 25 o c figure 3. on-resistance variation with temperature. figure 4. on-resistance variation with gate-to-source voltage. 0 1 2 3 4 5 1.5 2 2.5 3 3.5 4 -v gs , gate to source voltage (v) -i d , drain current (a) t a = -55 o c 25 o c 125 o c v ds = -5v 0.0001 0.001 0.01 0.1 1 10 0.0 0.2 0.4 0.6 0.8 1.0 1.2 -v sd , body diode forward voltage (v) -i s , reverse drain current (a ) v gs = 0v t a = 125 o c 25 o c -55 o c figure 5. transfer characteristics. figure 6. body diode forward voltage variation with source current and temperature. fdn358p
fdn358p rev g (w) typical characteristics 0 2 4 6 8 10 01234 q g , gate charge (nc) -v gs , gate-source voltage (v) i d = -1.5a v ds = -5v -10v -15v 0 50 100 150 200 250 0 5 10 15 20 25 30 -v ds , drain to source voltage (v) capacitance (pf) c iss c oss c rss f = 1 mhz v gs = 0 v figure 7. gate charge characteristics. figure 8. capacitance characteristics. 0.01 0.1 1 10 0.1 1 10 100 -v ds , drain-source voltage (v) -i d , drain current (a) dc 10s 1s 100ms r ds(on) limit v gs = -10v single pulse r ja = 270 o c/w t a = 25 o c 10ms 1ms 0 5 10 15 20 0.001 0.01 0.1 1 10 100 1000 t 1 , time (sec) p(pk), peak transient power (w) single pulse r ja = 270c/w t a = 25c figure 9. maximum safe operating area. figure 10. single pulse maximum power dissipation. 0.001 0.01 0.1 1 0.0001 0.001 0.01 0.1 1 10 100 1000 t 1 , time (sec) r(t), normalized effective transient thermal resistance r ja (t) = r(t) + r ja r ja = 270 c/w t j - t a = p * r ja (t) duty cycle, d = t 1 / t 2 p (p k ) t 1 t 2 single pulse 0.01 0.02 0.05 0.1 0.2 d = 0.5 figure 11. transient thermal response curve. thermal characterization performed using the conditions described in note 1b. transient thermal response will change depending on the circuit board design. fdn358p
 
   

    
         
            
  
  
   
       
      
        
      
  
  
    
  

  
    

       
 
    
 



       
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