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TCD2901D 2001-10-15 1 toshiba ccd image sensor ccd (charge coupled device) TCD2901D the TCD2901D is a high sensitive and low dark current 10550 elements3 line ccd color image sensor which includes ccd drive circuit and clamp circuit. the sensor is designed for scanner. the device contains a row of 10550 elements3 line photodiodes which provide a 48 lines / mm (1200dpi) across a a4 size paper. the device is operated by 5 v pulse, and 12 v power supply. features number of image sensing elements : 10550 elements3 line image sensing element size : 4m by 4m on 4m centers photo sensing region : high sensitive and low dark current pn photodiode distance between photodiode array : 48m (12 lines) clock : 2 phase (5 v) power supply : 12 v power supply voltage internal circuit : clamp circuit package : 22 pin cerdip package color filter : red, green, blue maximum ratings (note 1) characteristic symbol rating unit clock pulse voltage v a shift pulse voltage v sh reset pulse voltage rs v clamp pulse voltage cp v ? 0.3~8 v power supply voltage v od ? 0.3~15 v operating temperature t opr 0~60 c storage temperature t stg ? 25~85 c note 1: all voltage are with respect to ss terminals (ground). weight: 5.2g (typ.) (top view) pin connection
TCD2901D 2001-10-15 2 circuit diagram pin names pin no. symbol name pin no. symbol name 1 os3 signal output 3 (red) 22 os2 signal output 2 (green) 2 ss ground 21 os1 signal output 1 (blue) 3 rs reset gate 20 od power 4 cp clamp gate 19 nc non connection 5 nc non connection 18 nc non connection 6 nc non connection 17 nc non connection 7 nc non connection 16 nc non connection 8 2a2 clock 2 (phase 2) 15 2a1 clock 1 (phase 2) 9 1a2 clock 2 (phase 1) 14 1a1 clock 1 (phase 1) 10 sh3 shift gate 3 13 sh1 shift gate 1 11 ss ground 12 sh2 shift gate 2
TCD2901D 2001-10-15 3 optical / electrical characteristics (ta = 25c, v od = 12 v, v = v sh = v rs = v cp = 5 v (pulse), f = 0.5mhz, f rs = 1 mhz, t int = 11 ms, light source = a light source+cm500s filter (t = 1 mm), load resistance = 100 k ? ) characteristic symbol min typ. max unit note red r (r) 1.7 2.5 3.3 green r (g) 1.6 2.4 3.2 sensitivity blue r (b) 0.9 1.4 1.9 v / (lxs) (note 2) prnu (1) D 15 20 (note 3) photo response non uniformity prnu (3) D 3 12 mv (note 4) register imbalance ri D 1 D (note 5) saturation output voltage v sat 2.9 3.5 D v (note 6) saturation exposure se 0.91 1.46 D lxs (note 7) dark signal voltage v drk D 0.5 2.0 mv (note 8) dark signal non uniformity dsnu D 2.0 7.0 mv (note 8) dc power dissipation p d D 260 450 mw total transfer efficiency tte 92 98 D output impedance z o D 0.3 1.0 k ? dc compensation output voltage v os 4.0 5.0 6.0 v (note 9) random noise n d D 0.8 D mv (note 10) reset noise v rsn D 0.3 1.0 v (note 9) masking noise v ms D 0.2 1.0 v (note 9) note 2: sensitivity is defined for each color of signal outputs average when the photosensitive surface is applied with the light of uniform illumination and uniform color temperature. note 3: prnu (1) is defined for each color on a single chip by the expressions below when the photosensitive surface is applied with the light of uniform illumination and uniform color temperature. % 100 ) 1 ( prnu where is average of total signal output and is the maximum deviation from . the amount of incident light is shown below. red = 1 / 2 se green = 1 / 2 se bule = 1 / 4 se note 4: prnu (3) is defined as maximum voltage with next pixels, where measured at 5 of se (typ.). note 5: register imbalance is defined as follows. % 100 10549 10549 1 n 1 n n ri
TCD2901D 2001-10-15 4 note 6: v sat is defined as minimum saturation output of all effective pixels. note 7: definition of se s lx g r sat v se note 8: v drk is defined as average dark signal voltage of all effective pixels. dsnu is defined as different voltage between v drk and v mdk when v mdk is maximum dark signal voltage. note 9: dc signal output voltage is defined as follows. reset noise voltage is defined as follows. note 10: random noise is defined as the standard deviation (sigma) of the output level difference between two adjacent effective pixels under no illumination (i.e. dark conditions) calculated by the following procedure.
TCD2901D 2001-10-15 5 1) two adjacent pixels (pixel n and n+1) in one reading are fixed as measurement points. 2) each of the output level at video output periods averaged over 200ns period to get v (n) and v (n+1). 3) v (n+1) is subtracted from v (n) to get ? v. ? v = v (n) ? v (n+1) 4) the standard deviation of ? v is calculated after procedure 2) and 3) are repeated 30 times (30 readings). 30 1 i 2 v vi 30 1 30 1 i vi 30 1 v 5) procedure 2), 3) and 4) are repeated 10 times to get sigma value. 6) 10 sigma values are averaged. 30 1 j j 10 1 7) value calculated using the above procedure is observed 2 times larger than that measured relative to the ground level. so we specify random noise as follows. 2 1 nd
TCD2901D 2001-10-15 6 operating condition characteristic symbol min typ. max unit note ?h? level 4.75 5.0 5.5 clock pulse voltage ?l? level v a 0 D 0.3 v ?h? level v a?h? 0.5 v a?h? v a?h? shift pulse voltage ?l? level v sh 0 0 0.5 v (note 11) ?h? level 4.5 5.0 5.5 reset pulse voltage ?l? level rs v 0 0 0.5 v ?h? level 4.5 5.0 5.5 clamp pulse voltage ?l? level cp v 0 0 0.5 v power supply voltage v od 11.4 12.0 13.0 v note 11: v a ?h? means the high level voltage of v a when sh pulse is high level. clock characteristics (ta = 25c) characteristic symbol min typ. max unit clock pulse frequency f a 0.15 0.5 2.5 mhz reset pulse frequency rs f 0.3 1.0 5.0 mhz clamp pulse frequency cp f 0.3 1.0 5.0 mhz clock capacitance (note 12) c a D 350 450 pf shift gate capacitance c sh D 50 100 pf reset gate capacitance rs c D 10 20 pf clamp gate capacitance cp c D 10 20 pf note 12: v od = 12 v
TCD2901D 2001-10-15 7 timing chart
TCD2901D 2001-10-15 8 timing requirements
TCD2901D 2001-10-15 9 timing requirements (cont?d) characteristic symbol min. typ. (note 13) max. unit t1 110 1000 D pulse timing of sh and 1a t5 200 1000 D ns sh pulse rise time, fall time t2, t4 0 50 D ns sh pulse width t3 1000 2000 D ns 1 , 2 pulse rise time, fall time t6, t7 0 50 D ns rs pulse rise time, fall time t8, t10 0 20 D ns rs pulse width t9 45 (note 15) 100 D ns cp pulse rise time, fall time t11, t13 0 20 D ns cp pulse width t12 40 100 D ns pulse timing of 1a , 2a and cp t14 20 40 ns pulse timing of rs and cp t15 45 100 ns video data delay time (note 14) t16, t17 D 80 D ns pulse timing of sh and cp t18 0 500 D ns note 13: typ. is the case of f rs =1.0 mhz. note 14: load resistance is 100 k ? . note 15: in line clamp operation, t9 is 70 ns (min.).
TCD2901D 2001-10-15 10 typical spectral response
TCD2901D 2001-10-15 11 typical drive circuit
TCD2901D 2001-10-15 12 caution 1. window glass the dust and stain on the glass window of the package degrade optical performance of ccd sensor. keep the glass window clean by saturating a cotton swab in alcohol and lightly wiping the surface, and allow the glass to dry, by blowing with filtered dry n2. care should be taken to avoid mechanical or thermal shock because the glass window is easily to damage. 2. electrostatic breakdown store in shorting clip or in conductive foam to avoid electrostatic breakdown. ccd image sensor is protected against static electricity, but interior puncture mode device due to static electricity is sometimes detected. in handing the device, it is necessary to execute the following static electricity preventive measures, in order to prevent the trouble rate increase of the manufacturing system due to static electricity. a. prevent the generation of static electricity due to friction by making the work with bare hands or by putting on cotton gloves and non-charging working clothes. b. discharge the static electricity by providing earth plate or earth wire on the floor, door or stand of the work room. c. ground the tools such as soldering iron, radio cutting pliers of or pincer. it is not necessarily required to execute all precaution items for static electricity. it is all right to mitigate the precautions by confirming that the trouble rate within the prescribed range. 3. incident light ccd sensor is sensitive to infrared light. note that infrared light component degrades resolution and prnu of ccd sensor. 4. lead frame forming since this package is not strong against mechanical stress, you should not reform the lead frame. we recommend to use a ic-inserter when you assemble to pcb. 5. soldering soldering by the solder flow method cannot be guaranteed because this method may have deleterious effects on prevention of window glass soiling and heat resistance. using a soldering iron, complete soldering within ten seconds for lead temperatures of up to 260c, or within three seconds for lead temperatures of up to 350c.
TCD2901D 2001-10-15 13 package dimensions note 1: top of chip to bottom of package note 2: glass thickness (n = 1.5) note 3: no.1 sensor element (s1) to center of no.1 pin. weight: 5.2g (typ.)
TCD2901D 2001-10-15 14 toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. the products described in this document are subject to the foreign exchange and foreign trade laws. the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others. the information contained herein is subject to change without notice. 000707eb a restrictions on product use

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