silicon epitaxial planar diode semelab limited reserves the right to change test c onditions, parameter limits and package dimensions without notice. information furnished by semelab is believed to be both accurate and reliable at the time of going to press. however semelab assumes no responsibility for any errors or omissions discovered in its use. semelab encourage s customers to verify that datasheets are current before placing o rders. semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8271 issue 2 page 1 of 4 1n4148d2a / 1n4148d2b low leakage fast switching low forward voltage hermetic ceramic surface mount package suitable for general purpose, switching application s. space level and high-reliability screening options av ailable absolute maximum ratings (t a = 25c unless otherwise stated) v br breakdown voltage 100v v rwm working peak reverse voltage 75v i o average rectified output current, t a = 75c (1) 200ma i fsm surge current, half sine wave, t p = 8.3ms (2) 2a t j junction temperature range -65 to +200c t stg storage temperature range -65 to +200c (1) i o is rated at 200ma @ t a = 75 c for pc boards where thermal resistance from mount ing point to ambient is sufficiently controlled whe re t j (max) does not exceed 175 c (2) t a = 25 c @ i o =0 and vrwm for ten 8.3ms surges at 1 minute interv als.
silicon epitaxial planar diode 1n4148d2a / 1n4148d2b semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8271 issue 2 page 2 of 4 thermal properties symbol parameter min typ max units r ja thermal resistance junction to ambient 325 c/w electrical characteristics (t a = 25c unless otherwise stated) symbols parameters test conditions min. typ. max. units i f = 10ma 0.8 i f = 100ma 1.2 i f = 10ma (3) t a = 150c 0.8 v f forward voltage i f = 100ma (3) t a = -55c 1.3 v v r = 20v 25 v r = 75v 500 na v r = 20v 35 i r reverse current v r = 75v t a = 150c 75 a dynamic characteristics v r = 0v 4.7 c capacitance v r = 1.5v f = 1.0mhz 4.7 pf i f = i r = 10ma r l = 100 t rr reverse recovery time i rec = 1.0ma 5 ns notes notes notes notes (3) pulse width 300us, 2%
silicon epitaxial planar diode 1n4148d2a / 1n4148d2b semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8271 issue 2 page 3 of 4 mechanical data * the additional contact provides a connection to t he lid in the application. connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the space weather link www.semelab.co.uk/dlcc2.html on the semelab web site. package variant to be specified at order. other package outlines may be available ? contact s emelab sales to enquire dlcc2 variant a (d2a) pad 1 anode pad 2 cathode dimension mm inches a 5.00 0.10 0.197 0.004 b 2.61 0.10 0.103 0.004 c 1.08 0.10 0.043 0.004 d 1.76 0.10 0.069 0.004 dlcc2 variant b (d2b) pad 1 anode pad 2 cathode pad 3 lid contact to anode* dimension mm inches a 5.00 0.10 0.197 0.004 b 2.61 0.10 0.103 0.004 c 1.08 0.10 0.043 0.004 d 1.76 0.10 0.069 0.004 a b c solder pad layout d - 5a dimension mm inches a 6.25 0.246 b 1.70 0.067 c 2.67 0.105 dlcc2/ d-5a melf overlay
silicon epitaxial planar diode 1n4148d2a / 1n4148d2b semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8271 issue 2 page 4 of 4 screening options space level (jqrs/esa) and high reliability options a re available in accordance with the high reliability and screening options handbook available for download from the from the tt electronics semelab web site. esa quality level products are based on the testing procedures specified in the generic escc 5000 and in the corresponding part detail specifications. semelabs qr216 and qr217 processing specifications (jqrs), in conjunction with the companies iso 9001: 2000 approval present a viable alternative to the america n mil- prf-19500 space level processing. qr217 (space level quality conformance) is based on the quality conformance inspection requirements of mil- prf- 19500 groups a (table v), b (table via), c (table vi i) and also esa / escc 5000 (chart f4) lot validation tests. qr216 (space level screening) is based on the scree ning requirements of mil-prf-19500 (table iv) and also e sa /escc 5000 (chart f3). jqrs parts are processed to the device data sheet a nd screened to qr216 with conformance testing to q217 groups a and b in accordance with mil-std-750 method s and procedures. additional conformance options are available, for ex ample pre-cap visual inspection, buy-off visit or data pac ks. these are chargeable and must be specified at the o rder stage (see ordering information). minimum order quantities may apply. alternative or additional customer specific conforma nce or screening requirements would be considered. contact semelab sales with enquires. marking details parts can be laser marked with approximately 7 char acters on two lines and always includes cathode identifica tion. typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. customer specific marking requirements can be arrang ed at the time of order. example marking: ordering information part numbers are built up from type, package varian t, and screening level. the part numbers are extended to i nclude the additional options as shown below. type ? main part number package variant ? see mechanical data screening level ? see screening options (esa / jqrs) additional options: customer pre-cap visual inspection .cvp customer buy-off visit .cvb data pack .da solderability samples .ss scanning electron microscopy .sem radiography (x-ray) .xray total dose radiation test .rad mil-prf-19500 (qr217) group b charge .grpb group b destructive mechanical samples .gbdm (12 pi eces) group c charge .grpc group c destructive electrical samples .gcde (12 pi eces) group c destructive mechanical samples .gcdm (6 pie ces) esa/escc lot validation testing (subgroup 1) charge .lvt1 lvt1 destructive samples (environmental) .l1de (15 pieces) lvt1 destructive samples (mechanical) .l1dm (15 pie ces) lot validation testing (subgroup 2) charge .lvt2 lvt2 endurance samples (electrical) .l2d (15 pieces ) lot validation testing (subgroup 3) charge .lvt3 lvt3 destructive samples (mechanical) .l3d (5 piece s) additional option notes: 1) all ?additional options? are chargeable and must be specified at order stage. 2) when group b,c or lvt is required, additional el ectrical and mechanical destructive samples must be ordered 3) all destructive samples are marked the same as o ther production parts unless otherwise requested. example ordering information: the following example is for the 1n4148 part with pa ckage variant a, jqrs screening, additional group c conform ance testing and a data pack. part numbers: 1n4148d2a-jqrs (include quantity for flight parts) 1n4148d2a-jqrs.grpc (chargeable conformance option) 1n4148d2a-jqrs.gcde (charge for destructive parts) 1n4148d2a-jqrs.gcdm (charge for destructive parts) 1n4148d2a-jqrs.da (charge for data pack) customers with any specific requirements (e.g. marki ng or screening) may be supplied with a similar alternati ve part number (there is maximum 20 character limit to part numbers). contact semelab sales with enquiries high reliability and screening options handbook link : http://www.semelab.co.uk/pdf/misc/documents/hirel_ and_screening_options.pdf
|
