ligitek electronics co.,ltd. property of ligitek only doc. no : qw0905- rev. : a date : - 2005 03 - nov. data sheet lsd355/62p-xx lsd355/62p-xx single digit led display(0.39inch)
2.54x4= 10.16 (0.4") 12.9 (0.508") 10.0 (0.394) ? 0.45 typ. note : 1.all dimension are in millimeters and (lnch) tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. lsd355/62p-xx ligitek 5.0 0.5 7.62 (0.3") 1.2(0.047") 9.85 (0.388") pin no.1 package dimensions lsd355/62p-xx part no. 7.0 (0.276") page1/7 ligitek electronics co.,ltd. property of ligitek only
f lsd3562p-xx 3,8 9 10 7542 c a b d e 7 9 10 2 4 5 16 g dp 16 f lsd3552p-xx 3,8 ligitek electronics co.,ltd. property of ligitek only lsd355/62p-xx internal circuit diagram part no. c a b d e 2/7 g dp page
electrical connection part no. pin no.1 5 10 7 9 8 6 4 3 2 1 cathode d anode d 5 anode a common cathode anode c anode b anode dp cathode a 10 cathode b common anode cathode dp cathode c 7 9 8 6 ligitek electronics co.,ltd. property of ligitek only lsd3562p-xx common cathode anode e anode f anode g lsd3552p-xx lsd355/62p-xx cathode e cathode f common anode cathode g 4 3 2 1 pin no.1 page3/7
ligitek electronics co.,ltd. property of ligitek only iv(mcd) part no lsd3552p-xx lsd3562p-xx part selection and application information(ratings at 25) note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. p ( nm) common cathode or anode chip emitted green gap material common cathode common anode electrical min. 1.7 30 555 (nm) 2.6 2.10.5 max. typ. vf(v) min. part no. operating temperature storage temperature peak forward current per chip (duty 1/10,0.1ms pulse width) reverse current per any chip power dissipation per chip forward current per chip absolute maximum ratings at ta=25 solder temperature 1/16 inch below seating plane for 3 seconds at 260 parameter symbol tstg t opr ir pd i fp i f 10 -25 ~ +85 -25 ~ +85 pg 120 100 30 lsd355/62p-xx ratings 2:1 1.0 iv-m typ. unit a mw ma ma page4/7
test condition for each parameter parameter forward voltage per chip peak wavelength luminous intensity matching ratio reverse current any chip spectral line half-width luminous intensity per chip part no. lsd355/62p-xx unit symbol test condition iv-m ir a iv p vf mcd nm nm volt vr=5v if=10ma if=20ma if=20ma if=20ma ligitek electronics co.,ltd. property of ligitek only 5/7 page
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 fig.4 relative intensity vs. temperature ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage f o r w a r d c u r r e n t ( m a ) forward current(ma) fig.2 relative intensity vs. forward current r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0101001000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40-200204060 1.0 1.1 1.2 500550600650 0.0 0.5 1.0 2.03.04.05.0 80100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 3.5 pg chip fig.6 directive radiation 4.0 page6/7 lsd355/62p-xx part no.
solderability test solder resistance test thermal shock test high temperature high humidity test operating life test low temperature storage test high temperature storage test test item reliability test: part no. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 1.t.sol=230 5 2.dwell time=5 1sec 1.t.sol=260 5 2.dwell time= 10 1sec. this test intended to see soldering well performed or not. mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 reference standard ligitek electronics co.,ltd. property of ligitek only mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.under room temperature 2.if=10ma 3.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this test is the resistance of the device under tropical for hous. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. lsd355/62p-xx test condition description page 7/7
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