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publication number 26503 revision b amendment 2 issue date june 10, 2005 am29dl642g data sheet retired product this product has been retired and is not recommended for designs. for new and current designs, s29pl127j supersedes am 29dl642g as the factory-recommended migration path. please refer to the s29pl127j datasheet for specifications and order ing information. availability of this document is retained for reference and historical purposes only. april 2005 the following document specifies spansion memory products that are now offered by both advanced micro devices and fujitsu. although the document is marked with the name of the company that originally developed the specification, these produc ts will be offered to customers of both amd and fujitsu. continuity of specifications there is no change to this datasheet as a result of offering the device as a spansion product. any changes that have been made are the result of n ormal datasheet improvement and are noted in the document revision summary, where supported. future routine revisions will occur when appro- priate, and changes will be noted in a revision summary. for more information please contact your local amd or fujitsu sales office for additional information about spansion memory solutions.
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this data sheet states amd?s current technical specif ications regarding the products described herein. this data sheet may be revised by subsequent versions or modi fications due to changes in technical specifications. publication# 26503 rev: b amendment/ +2 issue date: june 10, 2005 refer to amd?s website (www.amd.com) for the latest information. am29dl642g 128 megabit (8 m x 16-bit) cmos 3.0 volt-only simultaneous read/write flash memory distinctive characteristics two 64 megabit (am29dl640g) in a single 63-ball 12 x 11 mm fine-pitch bga package (features are described herein for each internal am29dl640g) two chip enable inputs ? two ce# inputs to control selection of each internal am29dl640g devices single power supply operation ? 2.7 to 3.6 volt read, erase, and program operations simultaneous read/write operations ? data can be continuously read from one bank while executing erase/program functions in another bank. ? zero latency between read and write operations flexible bank tm architecture ? read may occur in any of the three banks not being written or erased. ? four banks may be grouped by customer to achieve desired bank divisions. boot sectors ? top and bottom boot sect ors in the same device ? any combination of sectors can be erased secsi? (secured silicon) sectorsecsi tm (secured silicon) sector: extra 256 byte sector ? factory locked and identifiable: 16 bytes available for secure, random factory electronic serial number; verifiable as factory locked through autoselect function. expressflash opti on allows entire sector to be available for factory-secured data ? customer lockable: one-time programmable only. once locked, data cannot be changed high performance ? 70 or 90 ns access time manufactured on 0.17 m process technology cfi (common flash interface) compliant ? provides device-specific information to the system, allowing host software to easily reconfigure for different flash devices ultra low power consumption (typical values at 3.0 v, 5 mhz) for the part ? 10 ma typical active read current ? 15 ma typical erase/program current ? 400 na typical standby mode current flexible sector architecture ? two hundred fifty-six 32 kword sectors compatibility with jedec standards ? except for the added ce2#, the fine-pitch bga is pinout and software compatible with single-power supply flash ? superior inadvertent write protection minimum 1 million erase cycle guarantee per sector 63-ball fine-pitch bga package software features data management software (dms) ? amd-supplied software manages data programming, enabling eeprom emulation ? eases historical sector erase flash limitations supports common flash memory interface (cfi) erase suspend/erase resume ? suspends erase operations to allow reading from other sectors in same bank data# polling and toggle bits ? provides a software method of detecting the status of program or erase cycles unlock bypass program command ? reduces overall programming time when issuing multiple program command sequences hardware features ready/busy# output (ry/by#) ? hardware method for detec ting program or erase cycle completion hardware reset pin (reset#) ? hardware method of resetting the internal state machine to the read mode wp#/acc input pin ? write protect (wp#) functi on protects sectors 0, 1, 140, and 141, regardless of sector protect status ? acceleration (acc) function accelerates program timing sector protection ? hardware method of locking a sector, either in-system or using pr ogramming equipment, to prevent any program or er ase operation within that sector ? temporary sector unprotec t allows changing data in protected sectors in-system this product has been retired and is not recommended for designs. for new and current designs, s29pl127j supersedes am29dl642g as the factory-recommended migration path. please refer to the s29pl127j datasheet for specifications and ordering information. availability of this document is retained for reference and historical purposes only.
2 am29dl642g june 10, 2005 preliminary general description the am29dl642g is a 128 mbit, 3.0 volt (2.7 v to 3.6 v) that combines two am29dl640g single power supply flash memory devices in a single 63-ball fortified bga package. each am29dl640g is a 64 mbit, 3.0 volt (2.7 v to 3.6 v) device organized as 4,194,304 words. data ap- pears on dq15-dq0. the device is designed to be pro- grammed in-system with t he standard system 3.0 volt v cc supply. a 12.0 volt v pp is not required for program or erase operations. the am29dl642g is equipped with two ce# inputs for flexible selection between the two in- ternal 64 mb devices. the device can also be pro- grammed in standard eprom programmers. the am29dl642g offers an access time of 70 or 90 ns. to eliminate bus contention the am29dl642g device has two separate chip enables (ce# and ce2#). each chip enable (ce# or ce2#) is connected to only one of the two dice in the am29dl642g package. to the system, this device will be the same as two independent am29dl640g on the same board. the only difference is that they are now packaged together to reduce board space. each device requires only a single 3.0 volt power sup- ply (2.7 v to 3.6 v) for both read and write functions. in- ternally generated and regulated voltages are provided for the program and erase operations. simultaneous read/write operations with zero latency the simultaneous read/write architecture provides si- multaneous operation by dividing the memory space of each am29dl640g device into four banks, two 8 mb banks with small and large sectors, and two 24 mb banks of large sectors. sector ad dresses are fixed, system soft- ware can be used to form user-defined bank groups. during an erase/program operation, any of the three non-busy banks may be read from. note that only two banks can operate simultaneously. the device can im- prove overall system performance by allowing a host sys- tem to program or erase in one bank, then immediately and simultaneously read from the other bank, with zero latency. this releases the system from waiting for the completion of program or erase operations. each am29dl640g can be organized as both a top and bottom boot sector configuration. am29dl642g features the secsi? (secured silicon) sector is an extra 256 byte sector capable of being permanently locked by amd or customers. the secsi indicator bit (dq7) is perma- nently set to a 1 if the part is factory locked , and set to a 0 if customer lockable . this way, customer lockable parts can never be used to replace a factory locked part. factory locked parts provide several options. the secsi sector may store a secure, random 16 byte esn (elec- tronic serial number), customer code (programmed through amd?s expressflash service), or both. customer lockable parts may utilize the secsi sector as bonus space, reading and writing like any other flash sector, or may permanently lock their own code there. dms (data management software) allows systems to easily take advantage of the adv anced architecture of the simultaneous read/write product line by allowing removal of eeprom devices. dms will also allow the system soft- ware to be simplified, as it will perform all functions nec- essary to modify data in file structures, as opposed to single-byte modifications. to write or update a particular piece of data (a phone number or configuration data, for example), the user only needs to state which piece of data is to be updated, and where the updated data is lo- cated in the system. this is an advantage compared to systems where user-written software must keep track of the old data location, status, logical to physical translation of the data onto the flash memory device (or memory devices), and more. using dms, user-written software does not need to interface with the flash memory di- rectly. instead, the user's software accesses the flash memory by calling one of only six functions. amd pro- vides this software to simplify system design and soft- ware integration efforts. the device offers complete compatibility with the jedec single-power-supply flash command set standard . commands are written to the command register using standard microprocessor write timings. reading data out of the device is similar to reading from other flash or eprom devices. the host system can detect whether a program or erase operation is complete by using the device status bits: ry/by# pin, dq7 (data# polling) and dq6/dq2 (toggle bits). after a program or erase cycle has been completed, the device automatically returns to the read mode. the sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. the device is fully erased when shipped from the factory. hardware data protection measures include a low v cc detector that automatically i nhibits write operations dur- ing power transitions. the hardware sector protection feature disables both program and erase operations in any combination of the sectors of memory. this can be achieved in-system or via programming equipment. the device offers two power-saving features. when ad- dresses have been stable for a specified amount of time, the device enters the automatic sleep mode . the sys- tem can also place the device into the standby mode . power consumption is great ly reduced in both modes. bank megabits sector sizes bank 1 8 mb eight 4 kword, fifteen 32 kword bank 2 24 mb forty-eight 32 kword bank 3 24 mb forty-eight 32 kword bank 4 8 mb eight 4 kword, fifteen 32 kword
june 10, 2005 am29dl642g 3 preliminary table of contents distinctive characteristics . . . . . . . . . . . . . . . . . . 1 general description . . . . . . . . . . . . . . . . . . . . . . . . 2 product selector guide . . . . . . . . . . . . . . . . . . . . . 4 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 connection diagram . . . . . . . . . . . . . . . . . . . . . . . . 6 pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 logic symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 ordering information . . . . . . . . . . . . . . . . . . . . . . . 8 device bus operations . . . . . . . . . . . . . . . . . . . . . . 9 table 1. am29dl642g device bus operations ................................9 requirements for reading array data ..................................... 9 writing commands/command sequences .............................. 9 accelerated program operation ............................................. 10 autoselect functions .............................................................. 10 simultaneous read/write operati ons with zero latency ....... 10 standby mode ........................................................................ 10 automatic sleep mode ........................................................... 10 reset#: hardware reset pin ............................................... 10 output disable mode .............................................................. 11 table 2. am29dl642g sector architecture ....................................11 table 4. bank address ....................................................................17 secsi tm sector addresses............................................................. 17 autoselect mode ..................................................................... 17 table 6. am29dl642g autoselect codes, (high voltage method) 18 sector/sector block protection and unprotection .................. 19 table 7. am29dl642g boot sector/sector block addresses for protection/unprotection ...........................................19 write protect (wp#) ................................................................ 20 table 8. wp#/acc modes ..............................................................20 temporary sector unprotect .................................................. 20 figure 1. temporary sector unprotect operation........................... 20 figure 2. in-system sector pr otect/unprotect algorithms .............. 21 secsi? (secured si licon) sector flash memory region ............................................................ 22 hardware data protection ...................................................... 22 low vcc write inhibit ............................................................ 22 write pulse ?glitch? protection ............................................... 23 logical inhibit .......................................................................... 23 power-up write inhibit ............................................................ 23 common flash memory interfac e (cfi) . . . . . . . 23 table 9. cfi query identification string .......................................... 23 system interface string................................................................... 24 table 11. device geometry definition ............................................ 24 table 12. primary v endor-specific extended query ...................... 25 command definitions . . . . . . . . . . . . . . . . . . . . . . 26 reading array data ................................................................ 26 reset command ..................................................................... 26 autoselect command sequence ............................................ 26 enter secsi? sector/exit secsi sector command sequence .............................................................. 26 word program command sequence ..................................... 27 unlock bypass command sequence ..................................... 27 figure 3. program operation .......................................................... 28 chip erase command sequence ........................................... 28 sector erase command s equence ........................................ 28 erase suspend/erase resu me commands ........................... 29 figure 4. erase operation.............................................................. 29 table 13. am29dl642g command definitions .............................. 30 write operation status . . . . . . . . . . . . . . . . . . . . 31 dq7: data# polling ................................................................. 31 figure 5. data# polling algorithm .................................................. 31 ry/by#: ready/busy# ............................................................ 32 dq6: toggle bit i .................................................................... 32 figure 6. toggle bit algorithm........................................................ 32 dq2: toggle bit ii ................................................................... 33 reading toggle bi ts dq6/dq2 ............................................... 33 dq5: exceeded timing limits ................................................ 33 dq3: sector erase timer ....................................................... 33 table 14. write operation status ................................................... 34 absolute maximum ratings . . . . . . . . . . . . . . . . 35 figure 7. maximum negative overshoot waveform ...................... 35 figure 8. maximum positive overshoot waveform........................ 35 dc characteristics . . . . . . . . . . . . . . . . . . . . . . . . 36 figure 9. i cc1 current vs. time (showing active and automatic sleep currents) ............................................................. 37 figure 10. typical i cc1 vs. frequency ............................................ 37 test conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 38 figure 11. test setup.................................................................... 38 figure 12. input waveforms and measurement levels ................. 38 ac characteristics . . . . . . . . . . . . . . . . . . . . . . . . 39 read-only operations ........................................................... 39 figure 13. read operation timings ............................................... 39 hardware reset (reset#) .................................................... 40 figure 14. reset timings ............................................................... 40 erase and program operations .............................................. 41 figure 15. program operation timings.......................................... 42 figure 16. accelerated program timing diagram.......................... 42 figure 17. chip/sector erase operation timings .......................... 43 figure 18. back-to-back read/write cycle timings ...................... 44 figure 19. data# polling timings (during embedded algorithms). 44 figure 20. toggle bit timings (d uring embedded algorithms)...... 45 figure 21. dq2 vs. dq6................................................................. 45 temporary sector unprotect .................................................. 46 figure 22. temporary sector u nprotect timing diagram .............. 46 figure 23. sector/sector block protect and unprotect timing diagram ............................................................. 47 alternate ce# controlled erase and program operations ..... 48 figure 24. alternate ce# cont rolled write (erase/program) operation timings.......................................................................... 49 erase and programming performance . . . . . . . 50 latchup characteristics . . . . . . . . . . . . . . . . . . . . 50 data retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 physical dimensions . . . . . . . . . . . . . . . . . . . . . . 51 fsd063?63-ball fine-pitch ball grid array (fbga) 10.95 x 11.95 mm package .................................................... 51 revision summary . . . . . . . . . . . . . . . . . . . . . . . . 52
4 am29dl642g june 10, 2005 preliminary product selector guide note: see ?ac characteristics? for full specifications. part number am29dl642g speed rating regulated voltage range: v cc = 2.7?3.6 v 70 90 max access time (ns) 70 90 ce# access time (ns) 70 90 oe# access time (ns) 30 30
june 10, 2005 am29dl642g 5 preliminary block diagram input/output buffers x-decoder y-decoder chip enable output enable logic erase voltage generator pgm voltage generator timer v cc detector state control command register v cc v ss we# acc ce# oe# stb stb sector switches ry/by# reset# data latch y-gating cell matrix address latch input/output buffers x-decoder y-decoder chip enable output enable logic erase voltage generator pgm voltage generator timer v cc detector state control command register stb stb dq15 ? dq0 sector switches ry/by# data latch y-gating cell matrix address latch a21?a0 a21?a0 a21?a0 ce#2 dq15 ? dq0
6 am29dl642g june 10, 2005 preliminary connection diagram special handling instructions for bga package special handling is required for flash memory products in bga packages. flash memory devices in bga packages may be damaged if exposed to ultrasonic cleaning methods. the package and/or data integrity may be compromised if the package body is exposed to temperatures above 150 c for prolonged periods of time. 63-ball fine-pitch bga top view, balls facing down c2 d2 e2 f2 g2 h2 j2 k2 c3 d3 e3 f3 g3 h3 j3 k3 c4 d4 e4 f4 g4 h4 j4 k4 c5 d5 e5 f5 g5 h5 j5 k5 c6 d6 e6 f6 g6 h6 j6 k6 c7 d7 a7 b7 a8 b8 a1 b1 a2 e7 f7 g7 h7 j7 k7 l7 l8 m7 m8 l1 l2 m1 m2 nc* nc* nc* nc* nc* nc* nc* nc* nc* nc* nc* nc nc nc nc dq15 v ss ce2# a16 a15 a14 a12 a13 dq13 dq6 dq14 dq7 a11 a10 a8 a9 v cc dq4 dq12 dq5 a19 a21 reset# we# dq11 dq3 dq10 dq2 a20 a18 wp#/acc ry/by# dq9 dq1 dq8 dq0 a5 a6 a17 a7 oe# v ss ce# a0 a1 a2 a4 a3 * balls are shorted together via the substrate but not connected to the die.
june 10, 2005 am29dl642g 7 preliminary pin description a21?a0 = 22 addresses inputs dq15?dq0 = 16 data inputs/outputs ce# = chip enable input ce2# = chip enable input for second die oe# = output enable input we# = write enable input wp#/acc = hardware write protect/acceleration pin reset# = hardware reset pin input ry/by# = ready/busy output v cc = 3.0 volt-only single power supply (see product selector guide for speed options and voltage supply tolerances) v ss = device ground nc = pin not connected internally logic symbol 22 16 dq15?dq0 a21?a0 ce# ce2# oe# wp#/acc ry/by# we# reset#
8 am29dl642g june 10, 2005 preliminary ordering information standard products amd standard products are available in several packages and o perating ranges. the order number (valid combination) is formed by a combination of the following: valid combinations valid combinations list configurations planned to be sup- ported in volume for this device. consult the local amd sales office to confirm availability of specific valid combinations and to check on newly released combinations. am29dl642g 70 md i temperature range i = industrial (?40 c to +85 c) package type md = 63-ball fine-pitch ball grid array (fbga) 0.8 mm pitch, 10.95 x 11.95 mm package (fsd063) speed option see product selector guide and valid combinations device number/description am29dl642g 128 megabit (2 x 8 m x 16-bit) cmos simultaneous operation flash memory 3.0 volt-only read, program, and erase valid combinations for fine-pitch bga packages speed order number package marking am29dl642g70 mdi d642g70v i 70 ns am29dl642g90 d642g90v i 90 ns
june 10, 2005 am29dl642g 9 preliminary device bus operations this section describes the requirements and use of the device bus operations, which are initiated through the internal command register. the command register itself does not occupy any addressable memory loca- tion. the register is a latch used to store the com- mands, along with the address and data information needed to execute the command. the contents of the register serve as inputs to the internal state machine. the state machine outputs dictate the function of the device. table 1 lists the device bus operations, the in- puts and control levels they require, and the resulting output. the following subsections describe each of these operations in further detail. table 1. am29dl642g device bus operations legend: l = logic low = v il , h = logic high = v ih , v id = 11.5?12.5 v, v hh = 9.0 0.5 v, x = don?t care, sa = sector address, a in = address in, d in = data in, d out = data out notes: 1. addresses are a21:a0. 2. the sector protect and sector unprotect functions may also be implemented via programming equi pment. see the ?sector/sector block protection and unprotection? section. 3. ce# can be replaced with ce2# when referring to the second die in the package. ce# and ce2# must not both be driven at the same time. 4. if wp#/acc = v il , sectors 0, 1, 140, and 141 re main protected. if wp#/acc = v ih , protection on sectors 0, 1, 140, and 141 depends on whether they were last protec ted or unprotected using the method described in ?sector/sector block protection and unprotection?. if wp#/acc = v hh , all sectors wi ll be unprotected. requirements for reading array data to read array data from the outputs, the system must drive the ce# and oe# pins to v il . ce# is the power control and selects the device. oe# is the output con- trol and gates array data to the output pins. we# should remain at v ih . the internal state machine is set for reading array data upon device power-up, or after a hardware reset. this ensures that no spurious alteration of the memory content occurs during the power transition. no com- mand is necessary in this mode to obtain array data. standard microprocessor read cycles that assert valid addresses on the device address inputs produce valid data on the device data outputs. each bank remains enabled for read access until the command register contents are altered. refer to the ac read-only operations table for timing specifications and to figure 13 for the timing diagram. i cc1 in the dc characteristics table represents the ac- tive current specification for reading array data. writing commands/command sequences to write a command or command sequence (which in- cludes programming data to the device and erasing sectors of memory), the system must drive we# and ce# (or ce2#) to v il , and oe# to v ih . operation ce# (note 3) oe# we# reset# wp#/acc addresses (note 1) dq15? dq0 read l l h h l/h a in d out write l h l h (note 4) a in d in standby v cc 0.3 v xx v cc 0.3 v l/h x high-z output disable l h h h l/h x high-z reset x x x l l/h x high-z sector protect (note 2) l h l v id l/h sa, a6 = l, a1 = h, a0 = l d in sector unprotect (note 2) l h l v id (note 4) sa, a6 = h, a1 = h, a0 = l d in temporary sector unprotect x x x v id (note 4) a in d in
10 am29dl642g june 10, 2005 preliminary the device features an unlock bypass mode to facili- tate faster programming. once a bank enters the un- lock bypass mode, only two write cycles are required to program a word, instead of four. the ?word pro- gram command sequence? section has details on programming data to the device using both standard and unlock bypass command sequences. an erase operation can erase one sector, multiple sec- tors, or the entire device. table 2 indicates the address space that each sector occupies. similarly, a ?sector address? is the address bits required to uniquely select a sector. the ?command definitions? section has de- tails on erasing a sector or the entire chip, or suspend- ing/resuming the erase operation. the device address space is divided into four banks. a ?bank address? is the address bits required to uniquely select a bank. i cc2 in the dc characteristics table represents the ac- tive current specification for the write mode. the ac characteristics section contains timing specification tables and timing diagrams for write operations. accelerated program operation the device offers accelerated program operations through the acc function. this is one of two functions provided by the wp#/acc pin. this function is prima- rily intended to allow faster manufacturing throughput at the factory. if the system asserts v hh on this pin, the device auto- matically enters the aforementioned unlock bypass mode, temporarily unprotects any protected sectors, and uses the higher voltage on the pin to reduce the time required for program operations. the system would use a two-cycle program command sequence as required by the unlock bypass mode. removing v hh from the wp#/acc pin returns the device to nor- mal operation. note that v hh must not be asserted on wp#/acc for operations other than accelerated pro- gramming, or device damage may result. in addition, the wp#/acc pin must not be left floating or uncon- nected; inconsistent behavior of the device may result . see ?write protect (wp#)? on page 20. for related in- formation. autoselect functions if the system writes the autoselect command se- quence, the device enters the autoselect mode. the system can then read autoselect codes from the inter- nal register (which is separate from the memory array) on dq15?dq0. standard read cycle timings apply in this mode. refer to the autoselect mode and autose- lect command sequence sections for more informa- tion. simultaneous read/write operations with zero latency this device is capable of reading data from one bank of memory while programming or erasing in the other bank of memory. an erase operation may also be sus- pended to read from or program to another location within the same bank (except the sector being erased). figure 18 shows how read and write cycles may be initiated for simultaneous operation with zero latency. i cc6 and i cc7 in the dc characteristics table represent the current specifications for read-while-pro- gram and read-while-erase, respectively. standby mode when the system is not reading or writing to the de- vice, it can place the device in the standby mode. in this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the oe# input. the device enters the cmos standby mode when the ce# or ce2# and reset# pins are both held at v cc 0.3 v. (note that this is a more restricted voltage range than v ih .) if ce# and reset# are held at v ih , but not within v cc 0.3 v, the device will be in the standby mode, but the standby current will be greater. the de- vice requires standard access time (t ce ) for read ac- cess when the device is in either of these standby modes, before it is ready to read data. if the device is deselected during erasure or program- ming, the device draws active current until the operation is completed. i cc3 in the dc characteristics table represents the standby current specification. automatic sleep mode the automatic sleep mode minimizes flash device en- ergy consumption. the device automatically enables this mode when addresses remain stable for t acc + 30 ns. the automatic sleep mode is independent of the ce#, ce2#, we#, and oe# control signals. stan- dard address access timings provide new data when addresses are changed. while in sleep mode, output data is latched and always available to the system. i cc5 in the dc characteristics table represents the automatic sleep mode current specification. reset#: hardware reset pin the reset# pin provides a hardware method of re- setting the device to reading array data. when the re- set# pin is driven low for at least a period of t rp , the device immediately terminates any operation in progress, tristates all output pins, and ignores all read/write commands for the duration of the reset# pulse. the device also resets the internal state ma- chine to reading array data. the operation that was in-
june 10, 2005 am29dl642g 11 preliminary terrupted should be reinitiated once the device is ready to accept another command sequence, to en- sure data integrity. current is reduced for the duration of the reset# pulse. when reset# is held at v ss 0.3 v, the device draws cmos standby current (i cc4 ). if reset# is held at v il but not within v ss 0.3 v, the standby current will be greater. the reset# pin may be tied to the system reset cir- cuitry. a system reset would thus also reset the flash memory, enabling the system to read the boot-up firm- ware from the flash memory. if reset# is asserted during a program or erase op- eration, the ry/by# pin remains a ?0? (busy) until the internal reset operation is complete, which requires a time of t ready (during embedded algorithms). the sys- tem can thus monitor ry/by# to determine whether the reset operation is complete. if reset# is asserted when a program or erase operation is not executing (ry/by# pin is ?1?), the reset operation is completed within a time of t ready (not during embedded algo- rithms). the system can read data t rh after the re- set# pin returns to v ih . refer to the ac characteristics tables for reset# pa- rameters and to figure 14 for the timing diagram. output disable mode when the oe# input is at v ih , output from the device is disabled. the output pins are placed in the high impedance state. table 2. am29dl642g sector architecture bank sector sector address a21?a12 sector size (kwords) (x16) address range bank 1 sa0 0000000000 4 00000h?00fffh sa1 0000000001 4 01000h?01fffh sa2 0000000010 4 02000h?02fffh sa3 0000000011 4 03000h?03fffh sa4 0000000100 4 04000h?04fffh sa5 0000000101 4 05000h?05fffh sa6 0000000110 4 06000h?06fffh sa7 0000000111 4 07000h?07fffh sa8 0000001xxx 32 08000h?0ffffh sa9 0000010xxx 32 10000h?17fffh sa10 0000011xxx 32 18000h?1ffffh sa11 0000100xxx 32 20000h?27fffh sa12 0000101xxx 32 28000h?2ffffh sa13 0000110xxx 32 30000h?37fffh sa14 0000111xxx 32 38000h?3ffffh sa15 0001000xxx 32 40000h?47fffh sa16 0001001xxx 32 48000h?4ffffh sa17 0001010xxx 32 50000h?57fffh sa18 0001011xxx 32 58000h?5ffffh sa19 0001100xxx 32 60000h?67fffh sa20 0001101xxx 32 68000h?6ffffh sa21 0001101xxx 32 70000h?77fffh sa22 0001111xxx 32 78000h?7ffffh
12 am29dl642g june 10, 2005 preliminary bank 2 sa23 0010000xxx 32 80000h?87fffh sa24 0010001xxx 32 88000h?8ffffh sa25 0010010xxx 32 90000h?97fffh sa26 0010011xxx 32 98000h?9ffffh sa27 0010100xxx 32 a0000h?a7fffh sa28 0010101xxx 32 a8000h?affffh sa29 0010110xxx 32 b0000h?b7fffh sa30 0010111xxx 32 b8000h?bffffh sa31 0011000xxx 32 c0000h?c7fffh sa32 0011001xxx 32 c8000h?cffffh sa33 0011010xxx 32 d0000h?d7fffh sa34 0011011xxx 32 d8000h?dffffh sa35 0011000xxx 32 e0000h?e7fffh sa36 0011101xxx 32 e8000h?effffh sa37 0011110xxx 32 f0000h?f7fffh sa38 0011111xxx 32 f8000h?fffffh sa39 0100000xxx 32 f9000h?107fffh sa40 0100001xxx 32 108000h?10ffffh sa41 0100010xxx 32 110000h?117fffh sa42 0101011xxx 32 118000h?11ffffh sa43 0100100xxx 32 120000h?127fffh sa44 0100101xxx 32 128000h?12ffffh sa45 0100110xxx 32 130000h?137fffh sa46 0100111xxx 32 138000h?13ffffh sa47 0101000xxx 32 140000h?147fffh sa48 0101001xxx 32 148000h?14ffffh sa49 0101010xxx 32 150000h?157fffh sa50 0101011xxx 32 158000h?15ffffh sa51 0101100xxx 32 160000h?167fffh sa52 0101101xxx 32 168000h?16ffffh sa53 0101110xxx 32 170000h?177fffh sa54 0101111xxx 32 178000h?17ffffh sa55 0110000xxx 32 180000h?187fffh sa56 0110001xxx 32 188000h?18ffffh sa57 0110010xxx 32 190000h?197fffh sa58 0110011xxx 32 198000h?19ffffh sa59 0100100xxx 32 1a0000h?1a7fffh sa60 0110101xxx 32 1a8000h?1affffh sa61 0110110xxx 32 1b0000h?1b7fffh sa62 0110111xxx 32 1b8000h?1bffffh sa63 0111000xxx 32 1c0000h?1c7fffh sa64 0111001xxx 32 1c8000h?1cffffh sa65 0111010xxx 32 1d0000h?1d7fffh sa66 0111011xxx 32 1d8000h?1dffffh sa67 0111100xxx 32 1e0000h?1e7fffh sa68 0111101xxx 32 1e8000h?1effffh sa69 0111110xxx 32 1f0000h?1f7fffh sa70 0111111xxx 32 1f8000h?1fffffh table 2. am29dl642g sector architecture (continued) bank sector sector address a21?a12 sector size (kwords) (x16) address range
june 10, 2005 am29dl642g 13 preliminary bank 3 sa71 1000000xxx 32 200000h?207fffh sa72 1000001xxx 32 208000h?20ffffh sa73 1000010xxx 32 210000h?217fffh sa74 1000011xxx 32 218000h?21ffffh sa75 1000100xxx 32 220000h?227fffh sa76 1000101xxx 32 228000h?22ffffh sa77 1000110xxx 32 230000h?237fffh sa78 1000111xxx 32 238000h?23ffffh sa79 1001000xxx 32 240000h?247fffh sa80 1001001xxx 32 248000h?24ffffh sa81 1001010xxx 32 250000h?257fffh sa82 1001011xxx 32 258000h?25ffffh sa83 1001100xxx 32 260000h?267fffh sa84 1001101xxx 32 268000h?26ffffh sa85 1001110xxx 32 270000h?277fffh sa86 1001111xxx 32 278000h?27ffffh sa87 1010000xxx 32 280000h?28ffffh sa88 1010001xxx 32 288000h?28ffffh sa89 1010010xxx 32 290000h?297fffh sa90 1010011xxx 32 298000h?29ffffh sa91 1010100xxx 32 2a0000h?2a7fffh sa92 1010101xxx 32 2a8000h?2affffh sa93 1010110xxx 32 2b0000h?2b7fffh sa94 1010111xxx 32 2b8000h?2bffffh sa95 1011000xxx 32 2c0000h?2c7fffh sa96 1011001xxx 32 2c8000h?2cffffh sa97 1011010xxx 32 2d0000h?2d7fffh sa98 1011011xxx 32 2d8000h?2dffffh sa99 1011100xxx 32 2e0000h?2e7fffh sa100 1011101xxx 32 2e8000h?2effffh sa101 1011110xxx 32 2f0000h?2fffffh sa102 1011111xxx 32 2f8000h?2fffffh sa103 1100000xxx 32 300000h?307fffh sa104 1100001xxx 32 308000h?30ffffh sa105 1100010xxx 32 310000h?317fffh sa106 1100011xxx 32 318000h?31ffffh sa107 1100100xxx 32 320000h?327fffh sa108 1100101xxx 32 328000h?32ffffh sa109 1100110xxx 32 330000h?337fffh sa110 1100111xxx 32 338000h?33ffffh sa111 1101000xxx 32 340000h?347fffh sa112 1101001xxx 32 348000h?34ffffh sa113 1101010xxx 32 350000h?357fffh sa114 1101011xxx 32 358000h?35ffffh sa115 1101100xxx 32 360000h?367fffh sa116 1101101xxx 32 368000h?36ffffh sa117 1101110xxx 32 370000h?377fffh sa118 1101111xxx 32 378000h?37ffffh table 2. am29dl642g sector architecture (continued) bank sector sector address a21?a12 sector size (kwords) (x16) address range
14 am29dl642g june 10, 2005 preliminary bank 4 sa119 1110000xxx 32 380000h?387fffh sa120 1110001xxx 32 388000h?38ffffh sa121 1110010xxx 32 390000h?397fffh sa122 1110011xxx 32 398000h?39ffffh sa123 1110100xxx 32 3a0000h?3a7fffh sa124 1110101xxx 32 3a8000h?3affffh sa125 1110110xxx 32 3b0000h?3b7fffh sa126 1110111xxx 32 3b8000h?3bffffh sa127 1111000xxx 32 3c0000h?3c7fffh sa128 1111001xxx 32 3c8000h?3cffffh sa129 1111010xxx 32 3d0000h?3d7fffh sa130 1111011xxx 32 3d8000h?3dffffh sa131 1111100xxx 32 3e0000h?3e7fffh sa132 1111101xxx 32 3e8000h?3effffh sa133 1111110xxx 32 3f0000h?3f7fffh sa134 1111111000 4 3f8000h?3f8fffh sa135 1111111001 4 3f9000h?3f9fffh sa136 1111111010 4 3fa000h?3fafffh sa137 1111111011 4 3fb000h?3fbfffh sa138 1111111100 4 3fc000h?3fcfffh sa139 1111111101 4 3fd000h?3fdfffh sa140 1111111110 4 3fe000h?3fefffh sa141 1111111111 4 3ff000h?3fffffh table 2. am29dl642g sector architecture (continued) bank sector sector address a21?a12 sector size (kwords) (x16) address range table 3. am29dl642g sector architecture for ce2# bank sector sector address a21?a12 sector size (kwords) (x16) address range bank 1 sa0 0000000000 4 00000h?00fffh sa1 0000000001 4 01000h?01fffh sa2 0000000010 4 02000h?02fffh sa3 0000000011 4 03000h?03fffh sa4 0000000100 4 04000h?04fffh sa5 0000000101 4 05000h?05fffh sa6 0000000110 4 06000h?06fffh sa7 0000000111 4 07000h?07fffh sa8 0000001xxx 32 08000h?0ffffh sa9 0000010xxx 32 10000h?17fffh sa10 0000011xxx 32 18000h?1ffffh sa11 0000100xxx 32 20000h?27fffh sa12 0000101xxx 32 28000h?2ffffh sa13 0000110xxx 32 30000h?37fffh sa14 0000111xxx 32 38000h?3ffffh sa15 0001000xxx 32 40000h?47fffh sa16 0001001xxx 32 48000h?4ffffh sa17 0001010xxx 32 50000h?57fffh sa18 0001011xxx 32 58000h?5ffffh sa19 0001100xxx 32 60000h?67fffh sa20 0001101xxx 32 68000h?6ffffh sa21 0001101xxx 32 70000h?77fffh sa22 0001111xxx 32 78000h?7ffffh
june 10, 2005 am29dl642g 15 preliminary bank 2 sa23 0010000xxx 32 80000h?87fffh sa24 0010001xxx 32 88000h?8ffffh sa25 0010010xxx 32 90000h?97fffh sa26 0010011xxx 32 98000h?9ffffh sa27 0010100xxx 32 a0000h?a7fffh sa28 0010101xxx 32 a8000h?affffh sa29 0010110xxx 32 b0000h?b7fffh sa30 0010111xxx 32 b8000h?bffffh sa31 0011000xxx 32 c0000h?c7fffh sa32 0011001xxx 32 c8000h?cffffh sa33 0011010xxx 32 d0000h?d7fffh sa34 0011011xxx 32 d8000h?dffffh sa35 0011000xxx 32 e0000h?e7fffh sa36 0011101xxx 32 e8000h?effffh sa37 0011110xxx 32 f0000h?f7fffh sa38 0011111xxx 32 f8000h?fffffh sa39 0100000xxx 32 f9000h?107fffh sa40 0100001xxx 32 108000h?10ffffh sa41 0100010xxx 32 110000h?117fffh sa42 0101011xxx 32 118000h?11ffffh sa43 0100100xxx 32 120000h?127fffh sa44 0100101xxx 32 128000h?12ffffh sa45 0100110xxx 32 130000h?137fffh sa46 0100111xxx 32 138000h?13ffffh sa47 0101000xxx 32 140000h?147fffh sa48 0101001xxx 32 148000h?14ffffh sa49 0101010xxx 32 150000h?157fffh sa50 0101011xxx 32 158000h?15ffffh sa51 0101100xxx 32 160000h?167fffh sa52 0101101xxx 32 168000h?16ffffh sa53 0101110xxx 32 170000h?177fffh sa54 0101111xxx 32 178000h?17ffffh sa55 0110000xxx 32 180000h?187fffh sa56 0110001xxx 32 188000h?18ffffh sa57 0110010xxx 32 190000h?197fffh sa58 0110011xxx 32 198000h?19ffffh sa59 0100100xxx 32 1a0000h?1a7fffh sa60 0110101xxx 32 1a8000h?1affffh sa61 0110110xxx 32 1b0000h?1b7fffh sa62 0110111xxx 32 1b8000h?1bffffh sa63 0111000xxx 32 1c0000h?1c7fffh sa64 0111001xxx 32 1c8000h?1cffffh sa65 0111010xxx 32 1d0000h?1d7fffh sa66 0111011xxx 32 1d8000h?1dffffh sa67 0111100xxx 32 1e0000h?1e7fffh sa68 0111101xxx 32 1e8000h?1effffh sa69 0111110xxx 32 1f0000h?1f7fffh sa70 0111111xxx 32 1f8000h?1fffffh table 3. am29dl642g sector architecture for ce2# (continued) bank sector sector address a21?a12 sector size (kwords) (x16) address range
16 am29dl642g june 10, 2005 preliminary bank 3 sa71 1000000xxx 32 200000h?207fffh sa72 1000001xxx 32 208000h?20ffffh sa73 1000010xxx 32 210000h?217fffh sa74 1000011xxx 32 218000h?21ffffh sa75 1000100xxx 32 220000h?227fffh sa76 1000101xxx 32 228000h?22ffffh sa77 1000110xxx 32 230000h?237fffh sa78 1000111xxx 32 238000h?23ffffh sa79 1001000xxx 32 240000h?247fffh sa80 1001001xxx 32 248000h?24ffffh sa81 1001010xxx 32 250000h?257fffh sa82 1001011xxx 32 258000h?25ffffh sa83 1001100xxx 32 260000h?267fffh sa84 1001101xxx 32 268000h?26ffffh sa85 1001110xxx 32 270000h?277fffh sa86 1001111xxx 32 278000h?27ffffh sa87 1010000xxx 32 280000h?28ffffh sa88 1010001xxx 32 288000h?28ffffh sa89 1010010xxx 32 290000h?297fffh sa90 1010011xxx 32 298000h?29ffffh sa91 1010100xxx 32 2a0000h?2a7fffh sa92 1010101xxx 32 2a8000h?2affffh sa93 1010110xxx 32 2b0000h?2b7fffh sa94 1010111xxx 32 2b8000h?2bffffh sa95 1011000xxx 32 2c0000h?2c7fffh sa96 1011001xxx 32 2c8000h?2cffffh sa97 1011010xxx 32 2d0000h?2d7fffh sa98 1011011xxx 32 2d8000h?2dffffh sa99 1011100xxx 32 2e0000h?2e7fffh sa100 1011101xxx 32 2e8000h?2effffh sa101 1011110xxx 32 2f0000h?2fffffh sa102 1011111xxx 32 2f8000h?2fffffh sa103 1100000xxx 32 300000h?307fffh sa104 1100001xxx 32 308000h?30ffffh sa105 1100010xxx 32 310000h?317fffh sa106 1100011xxx 32 318000h?31ffffh sa107 1100100xxx 32 320000h?327fffh sa108 1100101xxx 32 328000h?32ffffh sa109 1100110xxx 32 330000h?337fffh sa110 1100111xxx 32 338000h?33ffffh sa111 1101000xxx 32 340000h?347fffh sa112 1101001xxx 32 348000h?34ffffh sa113 1101010xxx 32 350000h?357fffh sa114 1101011xxx 32 358000h?35ffffh sa115 1101100xxx 32 360000h?367fffh sa116 1101101xxx 32 368000h?36ffffh sa117 1101110xxx 32 370000h?377fffh sa118 1101111xxx 32 378000h?37ffffh table 3. am29dl642g sector architecture for ce2# (continued) bank sector sector address a21?a12 sector size (kwords) (x16) address range
june 10, 2005 am29dl642g 17 preliminary table 4. bank address table 5. secsi tm sector addresses autoselect mode the autoselect mode provides manufacturer and de- vice identification, and sector protection verification, through identifier codes output on dq7?dq0. this mode is primarily intended for programming equip- ment to automatically match a device to be pro- grammed with its corresponding programming algorithm. however, the autoselect codes can also be accessed in-system through the command register. when using programming equipment, the autoselect mode requires v id on address pin a9. address pins must be as shown in table 6. in addition, when verify- ing sector protection, the sector address must appear on the appropriate highest order address bits (see table 2). table 6 shows the remaining address bits that are don?t care. when all necessary bits have been set as required, the programming equipment may then read the corresponding identifier code on dq7?dq0. however, the autoselect codes can also be accessed in-system through the command register, for instances when the am29dl642g is erased or programmed in a system without access to high voltage on the a9 pin. the command sequence is illustrated in table 13. note that if a bank address (ba) on address bits a21, a20, and a19 is asserted during the third write cycle of the autoselect command, the host system can read autoselect data from that bank and then immediately read array data from the other bank, without exiting the autoselect mode. bank 4 sa119 1110000xxx 32 380000h?387fffh sa120 1110001xxx 32 388000h?38ffffh sa121 1110010xxx 32 390000h?397fffh sa122 1110011xxx 32 398000h?39ffffh sa123 1110100xxx 32 3a0000h?3a7fffh sa124 1110101xxx 32 3a8000h?3affffh sa125 1110110xxx 32 3b0000h?3b7fffh sa126 1110111xxx 32 3b8000h?3bffffh sa127 1111000xxx 32 3c0000h?3c7fffh sa128 1111001xxx 32 3c8000h?3cffffh sa129 1111010xxx 32 3d0000h?3d7fffh sa130 1111011xxx 32 3d8000h?3dffffh sa131 1111100xxx 32 3e0000h?3e7fffh sa132 1111101xxx 32 3e8000h?3effffh sa133 1111110xxx 32 3f0000h?3f7fffh sa134 1111111000 4 3f8000h?3f8fffh sa135 1111111001 4 3f9000h?3f9fffh sa136 1111111010 4 3fa000h?3fafffh sa137 1111111011 4 3fb000h?3fbfffh sa138 1111111100 4 3fc000h?3fcfffh sa139 1111111101 4 3fd000h?3fdfffh sa140 1111111110 4 3fe000h?3fefffh sa141 1111111111 4 3ff000h?3fffffh table 3. am29dl642g sector architecture for ce2# (continued) bank sector sector address a21?a12 sector size (kwords) (x16) address range bank a21?a19 1 000 2 001, 010, 011 3 100, 101, 110 4 111 device sector size (x16) address range am29dl642g 128 words 00000h?0007fh
18 am29dl642g june 10, 2005 preliminary to access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in table 13. this method does not require v id . refer to the autoselect com- mand sequence section for more information. table 6. am29dl642g autoselect codes, (high voltage method) legend: l = logic low = v il , h = logic high = v ih , ba = bank address, sa = sector address, x = don?t care . description ce# oe# we# a21 to a12 a11 to a10 a9 a8 to a7 a6 a5 to a4 a3 a2 a1 a0 dq15 to dq0 dq7 to dq0 manufacturer id : amd llhbax v id xlxllll x 01h device id read cycle 1 llhbax v id x l x l l l h 22h 7eh read cycle 2 l h h h l 22h 02h read cycle 3 l hhhh 22h 01h sector protection verification llhsax v id xlx hl x 01h (protected), 00h (unprotected) secsi indicator bit (dq7) llhbax v id xlxllhh x 80h (factory locked), 00h (not factory locked)
june 10, 2005 am29dl642g 19 preliminary sector/sector block protection and unprotection (note: for the following discussion, the term ?sector? applies to both sectors and sector blocks. a sector block consists of two or more adjacent sectors that are protected or unprotected at the same time (see table 7). the hardware sector protection feature disables both program and erase operations in any sector. the hard- ware sector unprotection feature re-enables both pro- gram and erase operations in previously protected sectors. sector protection/unprotection can be imple- mented via two methods. table 7. am29dl642g boot sector/sector block addresses for protection/unprotection the primary method requires v id on the reset# pin only, and can be implemented either in-system or via programming equipment. figure 2 shows the algo- rithms and figure 23 shows the timing diagram. this method uses standard microprocessor bus cycle tim- ing. for sector unprotect, all unprotected sectors must first be protected prior to the first sector unprotect write cycle. note that the sector unprotect algorithm unprotects all sectors in parallel. all previously pro- tected sectors must be individually re-protected. to change data in protected sectors efficiently, the tem- porary sector unprotect function is available. see ?temporary sector unprotect?. sector a21?a12 sector/ sector block size sa0 0000000000 4 kwords sa1 0000000001 4 kwords sa2 0000000010 4 kwords sa3 0000000011 4 kwords sa4 0000000100 4 kwords sa5 0000000101 4 kwords sa6 0000000110 4 kwords sa7 0000000111 4 kwords sa8?sa10 0000001xxx, 0000010xxx, 0000011xxx, 96 (3x32) kwords sa11?sa14 00001xxxxx 128 (4x32) kwords sa15?sa18 00010xxxxx 128 (4x32) kwords sa19?sa22 00011xxxxx 128 (4x32) kwords sa23?sa26 00100xxxxx 128 (4x32) kwords sa27-sa30 00101xxxxx 128 (4x32) kwords sa31-sa34 00110xxxxx 128 (4x32) kwords sa35-sa38 00111xxxxx 128 (4x32) kwords sa39-sa42 01000xxxxx 128 (4x32) kwords sa43-sa46 01001xxxxx 128 (4x32) kwords sa47-sa50 01010xxxxx 128 (4x32) kwords sa51-sa54 01011xxxxx 128 (4x32) kwords sa55?sa58 01100xxxxx 128 (4x32) kwords sa59?sa62 01101xxxxx 128 (4x32) kwords sa63?sa66 01110xxxxx 128 (4x32) kwords sa67?sa70 01111xxxxx 128 (4x32) kwords sa71?sa74 10000xxxxx 128 (4x32) kwords sa75?sa78 10001xxxxx 128 (4x32) kwords sa79?sa82 10010xxxxx 128 (4x32) kwords sa83?sa86 10011xxxxx 128 (4x32) kwords sa87?sa90 10100xxxxx 128 (4x32) kwords sa91?sa94 10101xxxxx 128 (4x32) kwords sa95?sa98 10110xxxxx 128 (4x32) kwords sa99?sa102 10111xxxxx 128 (4x32) kwords sa103?sa106 11000xxxxx 128 (4x32) kwords sa107?sa110 11001xxxxx 128 (4x32) kwords sa111?sa114 11010xxxxx 128 (4x32) kwords sa115?sa118 11011xxxxx 128 (4x32) kwords sa119?sa122 11100xxxxx 128 (4x32) kwords sa123?sa126 11101xxxxx 128 (4x32) kwords sa127?sa130 11110xxxxx 128 (4x32) kwords sa131?sa133 1111100xxx, 1111101xxx, 1111110xxx 96 (3x32) kwords sa134 1111111000 4 kwords sa135 1111111001 4 kwords sa136 1111111010 4 kwords sa137 1111111011 4 kwords sa138 1111111100 4 kwords sa139 1111111101 4 kwords sa140 1111111101 4 kwords sa141 1111111111 4 kwords sector a21?a12 sector/ sector block size
20 am29dl642g june 10, 2005 preliminary the alternate method intended only for programming equipment requires v id on address pin a9 and oe#. this method is compatible with programmer routines written for earlier 3.0 volt-only amd flash devices. the device is shipped with all sectors unprotected. amd offers the option of programming and protecting sectors at its factory prior to shipping the device through amd?s expressflash? service. contact an amd representative for details. it is possible to determine whether a sector is pro- tected or unprotected. see the autoselect mode sec- tion for details. write protect (wp#) the write protect function provides a hardware method of protecting without using v id . this function is one of two provided by the wp#/acc pin. if the system asserts v il on the wp#/acc pin, the de- vice disables program and erase functions in sectors 0, 1, 140, and 141, independently of whether those sectors were protected or unprotected using the method described in ?sector/sector block protection and unprotection?. if the system asserts v ih on the wp#/acc pin, the de- vice reverts to whether sectors 0, 1, 140, and 141 were last set to be protected or unprotected. that is, sector protection or unprotection for these sectors de- pends on whether they were last protected or unpro- tected using the method described in ?sector/sector block protection and unprotection?. note that the wp#/acc pin must not be left floating or unconnected; inconsistent behavior of the device may result. table 8. wp#/acc modes temporary sector unprotect (note: for the following discussion, the term ?sector? applies to both sectors and sector blocks. a sector block consists of two or more adjacent sectors that are protected or unprotected at the same time (see table 7). this feature allows temporary unprotection of previ- ously protected sectors to change data in-system. the sector unprotect mode is activated by setting the re- set# pin to v id . during this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. once v id is removed from the re- set# pin, all the previously protected sectors are protected again. figure 1 shows the algorithm, and figure 22 shows the timing diagrams, for this feature. if the wp#/acc pin is at v il , sectors 0, 1, 140, and 141 will remain protected during the temporary sector unprotect mode. figure 1. temporary sector unprotect operation wp# input voltage device mode v il disables programming and erasing in sa0, sa1, sa140, and sa141 v ih enables programming and erasing in sa0, sa1, sa140, and sa141 v hh enables accelerated progamming (acc). see ?accelerated program operation? on page 10.. start perform erase or program operations reset# = v ih temporary sector unprotect completed (note 2) reset# = v id (note 1) notes: 1. all protected sectors unprotected (if wp#/acc = v il , sectors 0, 1, 140, and 141 will remain protected). 2. all previously protected sectors are protected once again.
june 10, 2005 am29dl642g 21 preliminary figure 2. in-system sector protect/unprotect algorithms sector group protect: write 60h to sector group address with a6 = 0, a1 = 1, a0 = 0 set up sector group address wait 150 s verify sector group protect: write 40h to sector group address twith a6 = 0, a1 = 1, a0 = 0 read from sector group address with a6 = 0, a1 = 1, a0 = 0 start plscnt = 1 reset# = v id wait 1 s first write cycle = 60h? data = 01h? remove v id from reset# write reset command sector group protect complete yes yes no plscnt = 25? yes device failed increment plscnt temporary sector group unprotect mode no sector group unprotect: write 60h to sector group address with a6 = 1, a1 = 1, a0 = 0 set up first sector group address wait 15 ms verify sector group unprotect: write 40h to sector group address with a6 = 1, a1 = 1, a0 = 0 read from sector group address with a6 = 1, a1 = 1, a0 = 0 start plscnt = 1 reset# = v id wait 1 s data = 00h? last sector group verified? remove v id from reset# write reset command sector group unprotect complete yes no plscnt = 1000? yes device failed increment plscnt temporary sector group unprotect mode no all sector groups protected? yes protect all sector groups: the indicated portion of the sector group protect algorithm must be performed for all unprotected sector groups prior to issuing the first sector group unprotect address set up next sector group address no yes no yes no no yes no sector group protect algorithm sector group unprotect algorithm first write cycle = 60h? protect another sector group? reset plscnt = 1
22 am29dl642g june 10, 2005 preliminary secsi? (secured silicon) sector flash memory region the secsi (secured silicon) sector feature provides a flash memory region that enables permanent part identification through an electronic serial number (esn). the secsi sector is 256 bytes in length, and uses a secsi sector indicator bit (dq7) to indicate whether or not the secsi sector is locked when shipped from the factory. this bit is permanently set at the factory and cannot be changed, which prevents cloning of a factory locked part. this ensures the secu- rity of the esn once the product is shipped to the field. amd offers the device with the secsi sector either factory locked or customer lockable. the fac- tory-locked version is always protected when shipped from the factory, and has the secsi (secured silicon) sector indicator bit permanently set to a ?1.? the cus- tomer-lockable version is shipped with the secsi sec- tor unprotected, allowing customers to utilize the that sector in any manner they choose. the customer-lock- able version has the secsi (secured silicon) sector indicator bit permanently set to a ?0.? thus, the secsi sector indicator bit prevents customer-lockable de- vices from being used to replace devices that are fac- tory locked. the system accesses the secsi sector secure through a command sequence (see ?enter secsi? sector/exit secsi sector command sequence?). after the system has written the enter secsi sector com- mand sequence, it may read the secsi sector by using the addresses normally occupied by the boot sectors. this mode of operation continues until the system issues the exit secsi sector command se- quence, or until power is removed from the device. on power-up, or following a hardware reset, the device re- verts to sending commands to the first 256 bytes of sector 0. factory locked: secsi sector programmed and protected at the factory in a factory locked device, the secsi sector is pro- tected when the device is shipped from the factory. the secsi sector cannot be modified in any way. the device is preprogrammed with both a random number and a secure esn. the 8-word random number is at addresses 000000h?000007h. the secure esn is pro- grammed in the next 8 words at addresses 000008h?00000fh. the device is available prepro- grammed with one of the following: a random, secure esn only customer code through the expressflash service both a random, secure esn and customer code through the expressflash service. customers may opt to have their code programmed by amd through the amd expressflash service. amd programs the customer?s code, with or without the ran- dom esn. the devices are then shipped from amd?s factory with the secsi sector permanently locked. contact an amd representative for details on using amd?s expressflash service. customer lockable: secsi sector not programmed or protected at the factory if the security feature is not required, the secsi sector can be treated as an additional flash memory space. the secsi sector can be read any number of times, but can be programmed and locked only once. note that the accelerated programming (acc) and unlock bypass functions are not available when programming the secsi sector. the secsi sector area can be protected using one of the following procedures: write the three-cycle enter secsi sector region command sequence, and then follow the in-system sector protect algorithm as shown in figure 2, ex- cept that reset# may be at either v ih or v id . this allows in-system protection of the secsi sector re- gion without raising any device pin to a high voltage. note that this method is only applicable to the secsi sector. write the three-cycle enter secsi sector secure region command sequence, and then use the alter- nate method of sector protection described in the ?sector/sector block prot ection and unprotection? section. once the secsi sector is locked and verified, the sys- tem must write the exit secsi sector region com- mand sequence to return to reading and writing the remainder of the array. the secsi sector lock must be used with caution since, once locked, there is no procedure available for unlocking the secsi sector area and none of the bits in the secsi sector memory space can be modified in any way. hardware data protection the command sequence requirement of unlock cycles for programming or erasing provides data protection against inadvertent writes (refer to table 13 for com- mand definitions). in addition, the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by spurious system level signals during v cc power-up and power-down transitions, or from system noise. low v cc write inhibit when v cc is less than v lko , the device does not ac- cept any write cycles. this protects data during v cc
june 10, 2005 am29dl642g 23 preliminary power-up and power-down. the command register and all internal program/erase circuits are disabled, and the device resets to the read mode. subsequent writes are ignored until v cc is greater than v lko . the system must provide the proper signals to the control pins to prevent unintentional writes when v cc is greater than v lko . write pulse ?glitch? protection noise pulses of less than 5 ns (typical) on oe#, ce# or we# do not initiate a write cycle. logical inhibit write cycles are inhibited by holding any one of oe# = v il , ce# = v ih or we# = v ih . to initiate a write cycle, ce# and we# must be a logical zero while oe# is a logical one. power-up write inhibit if we# = ce# = v il and oe# = v ih during power up, the device does not accept commands on the rising edge of we#. the internal state machine is automati- cally reset to the read mode on power-up. common flash memory interface (cfi) the common flash interface (cfi) specification out- lines device and host system software interrogation handshake, which allows specific vendor-specified software algorithms to be used for entire families of devices. software support can then be device-inde- pendent, jedec id-independent, and forward- and backward-compatible for the specified flash device families. flash vendors can standardize their existing interfaces for long-term compatibility. this device enters the cfi query mode when the sys- tem writes the cfi query command, 98h, to address 55h, any time the device is ready to read array data. the system can read cfi information at the addresses given in tables 9?12. to terminate reading cfi data, the system must write the reset command.the cfi query mode is not accessible when the device is exe- cuting an embedded program or embedded erase al- gorithm. the system can also write the cfi query command when the device is in the autoselect mode. the device enters the cfi query mode, and the system can read cfi data at the addresses given in tables 9?12. the system must write the reset command to return the device to reading array data. for further information, please refer to the cfi specifi- cation and cfi publication 100, available via the world wide web at http://www.amd.com/us-en/as- sets/content_type/downloadableassets/cfi100.pdf and http://www.amd.com/us-en/a ssets/content_type/down loadableassets/cfiamd1.pdf. alternatively, contact an amd representative for copies of these documents. table 9. cfi query identification string addresses data description 10h 11h 12h 0051h 0052h 0059h query unique ascii string ?qry? 13h 14h 0002h 0000h primary oem command set 15h 16h 0040h 0000h address for primary extended table 17h 18h 0000h 0000h alternate oem command set (00h = none exists) 19h 1ah 0000h 0000h address for alternate oem extended table (00h = none exists)
24 am29dl642g june 10, 2005 preliminary table 10. system interface string table 11. device geometry definition addresses data description 1bh 0027h v cc min. (write/erase) d7?d4: volt, d3?d0: 100 millivolt 1ch 0036h v cc max. (write/erase) d7?d4: volt, d3?d0: 100 millivolt 1dh 0000h v pp min. voltage (00h = no v pp pin present) 1eh 0000h v pp max. voltage (00h = no v pp pin present) 1fh 0004h typical timeout per single byte/word write 2 n s 20h 0000h typical timeout for min. size buffer write 2 n s (00h = not supported) 21h 000ah typical timeout per individual block erase 2 n ms 22h 0000h typical timeout for full chip erase 2 n ms (00h = not supported) 23h 0005h max. timeout for byte/word write 2 n times typical 24h 0000h max. timeout for buffer write 2 n times typical 25h 0004h max. timeout per individual block erase 2 n times typical 26h 0000h max. timeout for full chip erase 2 n times typical (00h = not supported) addresses data description 27h 0017h device size = 2 n byte 28h 29h 0002h 0000h flash device interface description (refer to cfi publication 100) 2ah 2bh 0000h 0000h max. number of byte in multi-byte write = 2 n (00h = not supported) 2ch 0003h number of erase block regions within device 2dh 2eh 2fh 30h 0007h 0000h 0020h 0000h erase block region 1 information (refer to the cfi specification or cfi publication 100) 31h 32h 33h 34h 007dh 0000h 0000h 0001h erase block region 2 information (refer to the cfi specification or cfi publication 100) 35h 36h 37h 38h 0007h 0000h 0020h 0000h erase block region 3 information (refer to the cfi specification or cfi publication 100) 39h 3ah 3bh 3ch 0000h 0000h 0000h 0000h erase block region 4 information (refer to the cfi specification or cfi publication 100)
june 10, 2005 am29dl642g 25 preliminary table 12. primary vendor-specific extended query addresses data description 40h 41h 42h 0050h 0052h 0049h query-unique ascii string ?pri? 43h 0031h major version number, ascii (r eflects modi fications to the silicon) 44h 0033h minor version number, ascii (ref lects modifications to the cfi table) 45h 0004h address sensitive unlock (bits 1-0) 0 = required, 1 = not required silicon revision number (bits 7-2) 46h 0002h erase suspend 0 = not supported, 1 = to read only, 2 = to read & write 47h 0001h sector protect 0 = not supported, x = number of sectors in per group 48h 0001h sector temporary unprotect 00 = not supported, 01 = supported 49h 0004h sector protect/unprotect scheme 01 =29f040 mode, 02 = 29f016 mode, 03 = 29f400, 04 = 29lv800 mode 4ah 0077h simultaneous operation 00 = not supported, x = number of sectors (excluding bank 1) 4bh 0000h burst mode type 00 = not supported, 01 = supported 4ch 0000h page mode type 00 = not supported, 01 = 4 word page, 02 = 8 word page 4dh 0085h acc (acceleration) supply minimum 00h = not supported, d7-d4: volt, d3-d0: 100 mv 4eh 0095h acc (acceleration) supply maximum 00h = not supported, d7-d4: volt, d3-d0: 100 mv 4fh 0004h top/bottom boot sector flag 00h = uniform device, 01h = 8 x 8 kbyte sect ors, top and bottom boot with write protect, 02h = bottom boot device, 03h = top boot device, 04h = both top and bottom 50h 0001h program suspend 0 = not supported, 1 = supported 57h 0004h bank organization 00 = data at 4ah is zero, x = number of banks 58h 0017h bank 1 region information x = number of sectors in bank 1 59h 0030h bank 2 region information x = number of sectors in bank 2 5ah 0030h bank 3 region information x = number of sectors in bank 3 5bh 0017h bank 4 region information x = number of sectors in bank 4
26 am29dl642g june 10, 2005 preliminary command definitions writing specific address and data commands or se- quences into the command register initiates device op- erations. table 13 defines the valid register command sequences. writing incorrect address and data val- ues or writing them in the improper sequence resets the device to reading array data. all addresses are latched on the falling edge of we# or ce#, whichever happens later. all data is latched on the rising edge of we# or ce#, whichever happens first. refer to the ac characteristics section for timing diagrams. reading array data the device is automatically set to reading array data after device power-up. no commands are required to retrieve data. each bank is ready to read array data after completing an embedded program or embedded erase algorithm. after the device accepts an erase suspend command, the corresponding bank enters the erase-sus- pend-read mode, after which the system can read data from any non-erase-suspended sector within the same bank. the system can read array data using the standard read timing, except that if it reads at an ad- dress within erase-suspended sectors, the device out- puts status data. after completing a programming operation in the erase suspend mode, the system may once again read array data with the same excep- tion. see the erase suspend/erase resume com- mands section for more information. the system must issue the reset command to return a bank to the read (or erase-suspend-read) mode if dq5 goes high during an active program or erase opera- tion, or if the bank is in the autoselect mode. see the next section, reset command , for more information. see also requirements for reading array data in the device bus operations section for more information. the read-only operations table provides the read pa- rameters, and figure 13 shows the timing diagram. reset command writing the reset command resets the banks to the read or erase-suspend-read mode. address bits are don?t cares for this command. the reset command may be written between the se- quence cycles in an erase command sequence before erasing begins. this resets the bank to which the sys- tem was writing to the read mode. once erasure be- gins, however, the device ignores reset commands until the operation is complete. the reset command may be written between the sequence cycles in a program command sequence before programming begins. this resets the bank to which the system was writing to the read mode. if the program command sequence is written to a bank that is in the erase suspend mode, writing the reset command returns that bank to the erase-sus- pend-read mode. once programming begins, however, the device ignores reset commands until the operation is complete. the reset command may be written between the se- quence cycles in an autoselect command sequence. once in the autoselect mode, the reset command must be written to return to the read mode. if a bank entered the autoselect mode while in the erase sus- pend mode, writing the reset command returns that bank to the erase-suspend-read mode. if dq5 goes high during a program or erase operation, writing the reset command returns the banks to the read mode (or erase-suspend-read mode if that bank was in erase suspend). autoselect command sequence the autoselect command sequence allows the host system to access the manufacturer and device codes, and determine whether or not a sector is protected. the autoselect command sequence may be written to an address within a bank that is either in the read or erase-suspend-read mode. the autoselect command may not be written while the device is actively pro- gramming or erasing in the other bank. the autoselect command sequence is initiated by first writing two unlock cycles. this is followed by a third write cycle that contains the bank address and the au- toselect command. the bank then enters the autose- lect mode. the system may read any number of autoselect codes without reinitiating the command se- quence. table 13 shows the address and data requirements. to determine sector protection information, the system must write to the appropriate bank address (ba) and sector address (sa). table 2 shows the address range and bank number associated with each sector. the system must write the reset command to return to the read mode (or erase-suspend-read mode if the bank was previously in erase suspend). enter secsi? sector/exit secsi sector command sequence the secsi sector region provides a secured data area containing a random, sixteen-byte electronic serial number (esn). the system can access the secsi sector region by issuing the three-cycle enter secsi sector command sequence. the device continues to access the secsi sector region until the system is- sues the four-cycle exit secsi sector command se-
june 10, 2005 am29dl642g 27 preliminary quence. the exit secsi sector command sequence returns the device to normal operation. the secsi sector is not accessible when the device is executing an embedded program or embedded erase algorithm. table 13 shows the address and data requirements for both command sequences. see also ?secsi? (se- cured silicon) sector flash memory region? for further information. word program command sequence programming is a four-bus-cycle operation. the pro- gram command sequence is initiated by writing two unlock write cycles, followed by the program set-up command. the program address and data are written next, which in turn initiate the embedded program al- gorithm. the system is not required to provide further controls or timings. the device automatically provides internally generated program pulses and verifies the programmed cell margin. table 13 shows the address and data requirements for the word program command sequence. when the embedded program algorithm is complete, that bank then returns to the read mode and ad- dresses are no longer latched. the system can deter- mine the status of the program operation by using dq7, dq6, or ry/by#. refer to the write operation status section for information on these status bits. any commands written to the device during the em- bedded program algorithm are ignored. note that a hardware reset immediately terminates the program operation. the program command sequence should be reinitiated once that bank has returned to the read mode, to ensure data integrity. programming is allowed in any sequence and across sector boundaries. a bit cannot be programmed from ?0? back to a ?1.? attempting to do so may cause that bank to set dq5 = 1, or cause the dq7 and dq6 status bits to indicate the operation was success- ful. however, a succeeding read will show that the data is still ?0.? only erase operations can convert a ?0? to a ?1.? unlock bypass command sequence the unlock bypass feature allows the system to pro- gram words to a bank faster than using the standard program command sequence. the unlock bypass command sequence is initiated by first writing two un- lock cycles. this is followed by a third write cycle con- taining the unlock bypass command, 20h. that bank then enters the unlock bypass mode. a two-cycle un- lock bypass program command sequence is all that is required to program in this mode. the first cycle in this sequence contains the unlock bypass program com- mand, a0h; the second cycle contains the program address and data. additional data is programmed in the same manner. this mode dispenses with the initial two unlock cycles required in the standard program command sequence, resulting in faster total program- ming time. table 13 shows the requirements for the command sequence. during the unlock bypass mode, only the unlock by- pass program and unlock bypass reset commands are valid. to exit the unlock bypass mode, the system must issue the two-cycle unlock bypass reset com- mand sequence. the first cycle must contain the bank address and the data 90h. the second cycle need only contain the data 00h. the bank then returns to the read mode. the device offers accelerated program operations through the wp#/acc pin. when the system asserts v hh on the wp#/acc pin, the device automatically en- ters the unlock bypass mode. the system may then write the two-cycle unlock bypass program command sequence. the device uses the higher voltage on the wp#/acc pin to accelerate the operation. note that the wp#/acc pin must not be at v hh any operation other than accelerated programming, or device dam- age may result. in addition, the wp#/acc pin must not be left floating or unconnected; inconsistent behavior of the device may resul t. figure 3 illustrates the algorithm for the program oper- ation. refer to the erase and program operations table in the ac characteristics section for parameters, and figure 15 for timing diagrams.
28 am29dl642g june 10, 2005 preliminary figure 3. program operation chip erase command sequence chip erase is a six bus cycle operation. the chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. two additional unlock write cycles are then followed by the chip erase command, which in turn invokes the embedded erase algorithm. the device does not require the system to preprogram prior to erase. the embedded erase algo- rithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. the system is not required to provide any con- trols or timings during these operations. table 13 shows the address and data requirements for the chip erase command sequence. when the embedded erase algorithm is complete, that bank returns to the read mode and addresses are no longer latched. the system can determine the sta- tus of the erase operation by using dq7, dq6, dq2, or ry/by#. refer to the write operation status sec- tion for information on these status bits. any commands written during the chip erase operation are ignored. however, note that a hardware reset im- mediately terminates the erase operation. if that oc- curs, the chip erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. figure 4 illustrates the algorithm for the erase opera- tion. refer to the erase and program operations ta- bles in the ac characteristics section for parameters, and figure 17 section for timing diagrams. sector erase command sequence sector erase is a six bus cycle operation. the sector erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. two ad- ditional unlock cycles are written, and are then fol- lowed by the address of the sector to be erased, and the sector erase command. table 13 shows the ad- dress and data requirements for the sector erase com- mand sequence. the device does not require the system to preprogram prior to erase. the embedded erase algorithm auto- matically programs and verifies the entire memory for an all zero data pattern prior to electrical erase. the system is not required to provide any controls or tim- ings during these operations. after the command sequence is written, a sector erase time-out of 80 s occurs. during the time-out period, additional sector addresses and sector erase com- mands may be written. loading the sector erase buffer may be done in any sequence, and the number of sec- tors may be from one sector to all sectors. the time between these additional cycles must be less than 80 s, otherwise erasure may begin. any sector erase ad- dress and command following the exceeded time-out may or may not be accepted. it is recommended that processor interrupts be disabled during this time to en- sure all commands are accepted. the interrupts can be re-enabled after the last sector erase command is written. any command other than sector erase or erase suspend during the time-out period resets that bank to the read mode. the system must rewrite the command sequence and any additional addresses and commands. the system can monitor dq3 to determine if the sec- tor erase timer has timed out (see the section on dq3: sector erase timer.). the time-out begins from the ris- ing edge of the final we# pulse in the command sequence. when the embedded erase algorithm is complete, the bank returns to reading array data and addresses are no longer latched. note that while the embedded erase operation is in progress, the system can read data from the non-erasing bank. the system can de- termine the status of the erase operation by reading start write program command sequence data poll from system verify data? no yes last address? no yes programming completed increment address embedded program algorithm in progress note: see table 13 for program command sequence.
june 10, 2005 am29dl642g 29 preliminary dq7, dq6, dq2, or ry/by# in the erasing bank. refer to the write operation status section for information on these status bits. once the sector erase operation has begun, only the erase suspend command is valid. all other com- mands are ignored. however, note that a hardware reset immediately terminates the erase operation. if that occurs, the sector erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. figure 4 illustrates the algorithm for the erase opera- tion. refer to the erase and program operations ta- bles in the ac characteristics section for parameters, and figure 17 section for timing diagrams. erase suspend/erase resume commands the erase suspend command, b0h, allows the sys- tem to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. the bank address is required when writing this command. this command is valid only during the sector erase operation, including the 80 s time-out period during the sector erase command sequence. the erase suspend command is ignored if written dur- ing the chip erase operation or embedded program algorithm. when the erase suspend command is written during the sector erase operation, the device requires a max- imum of 20 s to suspend the erase operation. how- ever, when the erase suspend command is written during the sector erase time-out, the device immedi- ately terminates the time-out period and suspends the erase operation. addresses are ?don?t-cares? when writing the erase suspend command. after the erase operation has been suspended, the bank enters the erase-suspend-read mode. the sys- tem can read data from or program data to any sector not selected for erasure. (the device ?erase sus- pends? all sectors selected for erasure.) reading at any address within erase-suspended sectors pro- duces status information on dq7?dq0. the system can use dq7, or dq6 and dq2 together, to determine if a sector is actively erasing or is erase-suspended. refer to the write operation status section for infor- mation on these status bits. after an erase-suspended program operation is com- plete, the bank returns to the erase-suspend-read mode. the system can determine the status of the program operation using the dq7 or dq6 status bits, just as in the standard word program operation. refer to the write operation status section for more information. in the erase-suspend-read mode, the system can also issue the autoselect command sequence. the device allows reading autoselect codes even at addresses within erasing sectors, since the codes are not stored in the memory array. when the device exits the au- toselect mode, the device reverts to the erase sus- pend mode, and is ready for another valid operation. refer to the autoselect mode and autoselect com- mand sequence sections for details. to resume the sector erase operation, the system must write the erase resume command (address bits are don?t care). the bank address of the erase-sus- pended bank is required when writing this command. further writes of the resume command are ignored. another erase suspend command can be written after the chip has resumed erasing. figure 4. erase operation start write erase command sequence (notes 1, 2) data poll to erasing bank from system data = ffh? no yes erasure completed embedded erase algorithm in progress notes: 1. see table 13 for erase command sequence. 2. see the section on dq3 for information on the sector erase timer.
30 am29dl642g june 10, 2005 preliminary table 13. am29dl642g command definitions legend: x = don?t care ra = address of the memory location to be read. rd = data read from location ra during read operation. pa = address of the memory location to be programmed. addresses latch on the falling edge of the we# or ce# pulse, whichever happens later. pd = data to be programmed at location pa. data latches on the rising edge of we# or ce# pulse, whichever happens first. sa = address of the sector to be verified (in autoselect mode) or erased. address bits a21?a12 uniquely select any sector. refer to table 2 for information on sector addresses. ba = address of the bank that is being switched to autoselect mode, is in bypass mode, or is being erased. a21?a19 uniquely select a bank. notes: 1. see table 1 for description of bus operations. 2. all values are in hexadecimal. 3. except for the read cycle and the fourth cycle of the autoselect command sequence, all bus cycles are write cycles. 4. data bits dq15?dq8 are don?t care in command sequences, except for rd and pd. 5. unless otherwise noted, address bits a21?a11 are don?t cares for unlock and command cycles, unless sa or pa is required. 6. no unlock or command cycles required when bank is reading array data. 7. the reset command is required to return to the read mode (or to the erase-suspend-read mode if previously in erase suspend) when a bank is in the autoselect mode, or if dq5 goes high (while the bank is providing status information). 8. the fourth cycle of the autoselect command sequence is a read cycle. the system must provide the bank address to obtain the manufacturer id, device id, or secsi sector factory protect information. data bits dq15?dq8 are don?t care. see the autoselect command sequence section for more information. 9. the device id must be read across the fourth, fifth, and sixth cycles. 10. the data is 80h for factory locked and 00h for not factory locked. 11. the data is 00h for an unprotected sector/sector block and 01h for a protected sector/sector block. 12. the unlock bypass command is required prior to the unlock bypass program command. 13. the unlock bypass reset command is required to return to the read mode when the bank is in the unlock bypass mode. 14. the system may read and program in non-erasing sectors, or enter the autoselect mode, when in the erase suspend mode. the erase suspend command is valid only during a sector erase operation, and requires the bank address. 15. the erase resume command is valid only during the erase suspend mode, and requires the bank address. 16. command is valid when device is ready to read array data or when device is in autoselect mode. command sequence (note 1) cycles bus cycles (notes 2?5) first second third fourth fifth sixth addr data addr data addr data addr data addr data addr data read (note 6) 1 ra rd reset (note 7) 1 xxx f0 autoselect (note 8) manufacturer id 4 555 aa 2aa 55 (ba)555 90 (ba)x00 01 device id (note 9) 6 555 aa 2aa 55 (ba)555 90 (ba)x01 7e (ba)x0e 02 (ba)x0f 01 secsi sector factory protect (note 10) 4 555 aa 2aa 55 (ba)555 90 (ba)x03 80/00 sector/sector block protect verify (note 11) 4 555 aa 2aa 55 (ba)555 90 (sa)x02 00/01 enter secsi sector region 3 555 aa 2aa 55 555 88 exit secsi sector region 4 555 aa 2aa 55 555 90 xxx 00 program 4 555 aa 2aa 55 555 a0 pa pd unlock bypass 3 555 aa 2aa 55 555 20 unlock bypass program (note 12) 2 xxx a0 pa pd unlock bypass reset (note 13) 2 ba 90 xxx 00 chip erase 6 555 aa 2aa 55 555 80 555 aa 2aa 55 555 10 sector erase 6 555 aa 2aa 55 555 80 555 aa 2aa 55 sa 30 erase suspend (note 14) 1 ba b0 erase resume (note 15) 1 ba 30 cfi query (note 16) 1 55 98
june 10, 2005 am29dl642g 31 preliminary write operation status the device provides several bits to determine the status of a program or erase operation: dq2, dq3, dq5, dq6, and dq7. table 14 and the following subsections describe the function of these bits. dq7 and dq6 each offer a method for determining whether a program or erase operation is com- plete or in progress. the device also provides a hard- ware-based output signal, ry/by#, to determine whether an embedded program or erase operation is in progress or has been completed. dq7: data# polling the data# polling bit, dq7, indicates to the host system whether an embedded program or erase algorithm is in progress or completed, or whether a bank is in erase sus- pend. data# polling is valid after the rising edge of the final we# pulse in the command sequence. during the embedded program algorithm, the device out- puts on dq7 the complement of the datum programmed to dq7. this dq7 status also applies to programming during erase suspend. when the embedded program algorithm is complete, the device outputs the datum programmed to dq7. the system must provide the program address to read valid status information on dq7. if a program address falls within a protected sector, data# polling on dq7 is ac- tive for approximately 1 s, then that bank returns to the read mode. during the embedded erase algorithm, data# polling produces a ?0? on dq7. when the embedded erase algorithm is complete, or if the bank enters the erase suspend mode, data# polling produces a ?1? on dq7. the system must provide an address within any of the sectors selected for erasure to read valid status infor- mation on dq7. after an erase command sequence is written, if all sectors selected for erasing are protected, data# poll- ing on dq7 is active for approximately 100 s, then the bank returns to the read mode. if not all selected sec- tors are protected, the embedded erase algorithm erases the unprotected sectors, and ignores the se- lected sectors that are protected. however, if the sys- tem reads dq7 at an address within a protected sector, the status may not be valid. when the system detects dq7 has changed from the complement to true data, it can read valid data at dq15?dq0 on the following read cycles. just prior to the completion of an embedded program or erase op- eration, dq7 may change asynchronously with dq15?dq8 while output enable (oe#) is asserted low. that is, the device may change from providing status information to valid data on dq7. depending on when the system samples the dq7 output, it may read the status or valid data. even if the device has com- pleted the program or erase operation and dq7 has valid data, the data outputs on dq15?dq0 may be still invalid. valid data on dq15?dq0 will appear on suc- cessive read cycles. table 14 shows the outputs for data# polling on dq7. figure 5 shows the data# polling algorithm. figure 19 in the ac characteristics section shows the data# polling timing diagram. figure 5. data# polling algorithm dq7 = data? yes no no dq5 = 1? no yes yes fail pass read dq7?dq0 addr = va read dq7?dq0 addr = va dq7 = data? start notes: 1. va = valid address for prog ramming. during a sector erase operation, a valid addres s is any sector address within the sector being erased. during chip erase, a valid address is any non-protected sector address. 2. dq7 should be rechecked even if dq5 = ?1? because dq7 may change simultaneously with dq5.
32 am29dl642g june 10, 2005 preliminary ry/by#: ready/busy# the ry/by# is a dedicated, open-drain output pin which indicates whether an embedded algorithm is in progress or complete. the ry/by# status is valid after the rising edge of the final we# pulse in the command sequence. since ry/by# is an open-drain output, sev- eral ry/by# pins can be tied together in parallel with a pull-up resistor to v cc . if the output is low (busy), the device is actively eras- ing or programming. (this includes programming in the erase suspend mode.) if the output is high (ready), the device is in the read mode, the standby mode, or one of the banks is in the erase-sus- pend-read mode. table 14 shows the outputs for ry/by#. dq6: toggle bit i toggle bit i on dq6 indicates whether an embedded program or erase algorithm is in progress or com- plete, or whether the device has entered the erase suspend mode. toggle bit i may be read at any ad- dress, and is valid after the rising edge of the final we# pulse in the command sequence (prior to the program or erase operation), and during the sector erase time-out. during an embedded program or erase algorithm op- eration, successive read cycles to any address cause dq6 to toggle. the system may use either oe# or ce# to control the read cycles. when the operation is complete, dq6 stops toggling. after an erase command sequence is written, if all sectors selected for erasing are protected, dq6 tog- gles for approximately 100 s, then returns to reading array data. if not all selected sectors are protected, the embedded erase algorithm erases the unprotected sectors, and ignores the selected sectors that are pro- tected. the system can use dq6 and dq2 together to deter- mine whether a sector is actively erasing or is erase-suspended. when the device is actively erasing (that is, the embedded erase algorithm is in progress), dq6 toggles. when the device enters the erase sus- pend mode, dq6 stops toggling. however, the system must also use dq2 to determine which sectors are erasing or erase-suspended. alternatively, the system can use dq7 (see the subsection on dq7: data# poll- ing ). if a program address falls within a protected sector, dq6 toggles for approximately 1 s after the program command sequence is written, then returns to reading array data. dq6 also toggles during the erase-suspend-program mode, and stops toggling once the embedded pro- gram algorithm is complete. table 14 shows the outputs for toggle bit i on dq6. figure 6 shows the toggle bit algorithm. figure 20 in the ?ac characteristics? section shows the toggle bit timing diagrams. figure 21 shows the differences be- tween dq2 and dq6 in graphical form. see also the subsection on dq2: toggle bit ii . figure 6. toggle bit algorithm start no yes yes dq5 = 1? no yes toggle bit = toggle? no program/erase operation not complete, write reset command program/erase operation complete read dq7?dq0 toggle bit = toggle? read dq7?dq0 twice read dq7?dq0 note: the system should recheck the toggle bit even if dq5 = ?1? because the toggle bit may stop toggling as dq5 changes to ?1.? see the subsections on dq6 and dq2 for more information.
june 10, 2005 am29dl642g 33 preliminary dq2: toggle bit ii the ?toggle bit ii? on dq2, when used with dq6, indi- cates whether a particular sector is actively erasing (that is, the embedded erase algorithm is in progress), or whether that sector is erase-suspended. toggle bit ii is valid after the rising edge of the final we# pulse in the command sequence. dq2 toggles when the system reads at addresses within those sectors that have been selected for era- sure. (the system may use either oe# or ce# to con- trol the read cycles.) but dq2 cannot distinguish whether the sector is actively erasing or is erase-sus- pended. dq6, by comparison, indicates whether the device is actively erasing, or is in erase suspend, but cannot distinguish which sectors are selected for era- sure. thus, both status bits are required for sector and mode information. refer to table 14 to compare out- puts for dq2 and dq6. figure 6 shows the toggle bit algorithm in flowchart form, and the section ?dq2: toggle bit ii? explains the algorithm. see also the dq6: toggle bit i subsection. figure 20 shows the toggle bit timing diagram. figure 21 shows the differences between dq2 and dq6 in graphical form. reading toggle bits dq6/dq2 refer to figure 6 for the following discussion. when- ever the system initially begins reading toggle bit sta- tus, it must read dq15?dq0 at least twice in a row to determine whether a toggle bit is toggling. typically, the system would note and store the value of the tog- gle bit after the first read. after the second read, the system would compare the new value of the toggle bit with the first. if the toggle bit is not toggling, the device has completed the program or erase operation. the system can read array data on dq15?dq0 on the fol- lowing read cycle. however, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the sys- tem also should note whether the value of dq5 is high (see the section on dq5). if it is, the system should then determine again whether the toggle bit is tog- gling, since the toggle bit may have stopped toggling just as dq5 went high. if the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. if it is still toggling, the de- vice did not completed the operation successfully, and the system must write the reset command to return to reading array data. the remaining scenario is that the system initially de- termines that the toggle bit is toggling and dq5 has not gone high. the system may continue to monitor the toggle bit and dq5 through successive read cy- cles, determining the status as described in the previ- ous paragraph. alternatively, it may choose to perform other system tasks. in this case, the system must start at the beginning of the algorithm when it returns to de- termine the status of the operation (top of figure 6 ). dq5: exceeded timing limits dq5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. under these conditions dq5 produces a ?1,? indicating that the program or erase cycle was not successfully completed. the device may output a ?1? on dq5 if the system tries to program a ?1? to a location that was previously pro- grammed to ?0.? only an erase operation can change a ?0? back to a ?1.? under this condition, the device halts the operation, and when the timing limit has been exceeded, dq5 produces a ?1.? under both these conditions, the system must write the reset command to return to the read mode (or to the erase-suspend-read mode if a bank was previ- ously in the erase-suspend-program mode). dq3: sector erase timer after writing a sector erase command sequence, the system may read dq3 to determine whether or not erasure has begun. (the sector erase timer does not apply to the chip erase command.) if additional sectors are selected for erasure, the entire time-out also applies after each additional sector erase com- mand. when the time-out period is complete, dq3 switches from a ?0? to a ?1.? if the time between addi- tional sector erase commands from the system can be assumed to be less than 50 s, the system need not monitor dq3. see also the sector erase command sequence section. after the sector erase command is written, the system should read the status of dq7 (data# polling) or dq6 (toggle bit i) to ensure that the device has accepted the command sequence, and then read dq3. if dq3 is ?1,? the embedded erase algorithm has begun; all fur- ther commands (except erase suspend) are ignored until the erase operation is complete. if dq3 is ?0,? the device will accept additional sector erase commands. to ensure the command has been accepted, the sys- tem software should check the status of dq3 prior to and following each subsequent sector erase com- mand. if dq3 is high on the second status check, the last command might not have been accepted. table 14 shows the status of dq3 relative to the other status bits.
34 am29dl642g june 10, 2005 preliminary table 14. write operation status notes: 1. dq5 switches to ?1? when an embedded program or embedded erase operation has exceeded the maximum timing limits. refer to the section on dq5 for more information. 2. dq7 and dq2 require a valid address when reading status info rmation. refer to the appropriate subsection for further details. 3. when reading write operation status bits , the system must always provide the bank address where the embedded algorithm is in progress. the device outputs array data if the system addresses a non-busy bank. status dq7 (note 2) dq6 dq5 (note 1) dq3 dq2 (note 2) ry/by# standard mode embedded program algorithm dq7# toggle 0 n/a no toggle 0 embedded erase algorithm 0 toggle 0 1 toggle 0 erase suspend mode erase-suspend- read erase suspended sector 1 no toggle 0 n/a toggle 1 non-erase suspended sector data data data data data 1 erase-suspend-program dq7# toggle 0 n/a n/a 0
june 10, 2005 am29dl642g 35 preliminary absolute maximum ratings storage temperature plastic packages . . . . . . . . . . . . . . . ?65 c to +150 c ambient temperature with power applied. . . . . . . . . . . . . . ?65 c to +125 c voltage with respect to ground v cc (note 1) . . . . . . . . . . . . . . . . .?0.5 v to +4.0 v a9 , oe# , and reset# (note 2) . . . . . . . . . . . . . . . . . . . .?0.5 v to +12.5 v wp#/acc . . . . . . . . . . . . . . . . . .?0.5 v to +10.5 v all other pins (note 1) . . . . . . ?0.5 v to v cc +0.5 v output short circuit current (note 3) . . . . . . 200 ma notes: 1. minimum dc voltage on input or i/o pins is ?0.5 v. during voltage transitions, input or i/o pins may overshoot v ss to ?2.0 v for periods of up to 20 ns. maximum dc voltage on input or i/o pins is v cc +0.5 v. see figure 7. during voltage transitions, input or i/o pins may overshoot to v cc +2.0 v for periods up to 20 ns. see figure 8. 2. minimum dc input voltage on pins a9, oe#, reset#, and wp#/acc is ?0.5 v. during voltage transitions, a9, oe#, wp#/acc, and reset# may overshoot v ss to ?2.0 v for periods of up to 20 ns. see figure 7. maximum dc input voltage on pin a9 is +12.5 v which may overshoot to +14.0 v for periods up to 20 ns. maximum dc input voltage on wp#/ acc is +9.5 v which may overshoot to +12.0 v for periods up to 20 ns. 3. no more than one output may be shorted to ground at a time. duration of the short circuit should not be greater than one second. stresses above those listed under ?absolute maximum ratings? may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. exposure of the device to absolute maximum rating conditions for exten ded periods may affect device reliability. figure 7. maximum negative overshoot waveform figure 8. maximum positive overshoot waveform operating ranges industrial (i) devices ambient temperature (t a ) . . . . . . . . . ?40c to +85c extended (e) devices ambient temperature (t a ) . . . . . . . . ?55c to +125c v cc supply voltages v cc for standard voltage range . . . . . . . 2.7 v to 3.6 v operating ranges de fine those limits between which the functionality of the device is guaranteed. 20 ns 20 ns +0.8 v ?0.5 v 20 ns ?2.0 v 20 ns 20 ns v cc +2.0 v v cc +0.5 v 20 ns 2.0 v
36 am29dl642g june 10, 2005 preliminary dc characteristics cmos compatible notes: 1. the i cc current listed is typically less than 2 ma/mhz, with oe# at v ih , one die active at a time. 2. maximum i cc specifications are tested with v cc = v cc max. 3. i cc active while embedded erase or embedded program is in progress. 4. automatic sleep mode enables the low power mode when addresses remain stable for t acc + 30 ns. typical sleep mode current is 200 na. 5. not 100% tested. parameter symbol parameter description test conditions min typ max unit i li input load current v in = v ss to v cc , v cc = v cc max 1.0 a i lit a9 input load current v cc = v cc max ; a9 = 12.5 v 35 a i lo output leakage current v out = v ss to v cc , v cc = v cc max 1.0 a i cc1 v cc active read current (notes 1, 2) ce# = v il , oe# = v ih 5 mhz 10 16 ma 1 mhz 2 4 i cc2 v cc active write current (notes 1, 2, 3) ce# = v il , oe# = v ih , we# = v il 15 30 ma i cc3 v cc standby current (note 2) ce#, reset# = v cc 0.3 v 0.2 10 a i cc4 v cc reset current (note 2) reset# = v ss 0.3 v 0.2 10 a i cc5 automatic sleep mode (notes 2, 4) v ih = v cc 0.3 v; v il = v ss 0.3 v 0.2 10 a i cc6 v cc active read-while-program current (notes 1, 2) ce# = v il , oe# = v ih 21 45 ma i cc7 v cc active read-while-erase current (notes 1, 2) ce# = v il , oe# = v ih 21 45 ma i cc8 v cc active program-while-erase-suspended current (notes 2, 5) ce# = v il , oe# = v ih 17 35 ma v il input low voltage ?0.5 0.8 v v ih input high voltage 0.7 x v cc v cc + 0.3 v v hh voltage for wp#/acc sector protect/unprotect and program acceleration v cc = 3.0 v 10% 8.5 9.5 v v id voltage for autoselect and temporary sector unprotect v cc = 3.0 v 10% 11.5 12.5 v v ol output low voltage i ol = 4.0 ma, v cc = v cc min 0.45 v v oh1 output high voltage i oh = ?2.0 ma, v cc = v cc min 0.85 v cc v v oh2 i oh = ?100 a, v cc = v cc min v cc ?0.4 v lko low v cc lock-out voltage (note 5) 2.3 2.5 v
june 10, 2005 am29dl642g 37 preliminary dc characteristics zero-power flash note: addresses are switching at 1 mhz figure 9. i cc1 current vs. time (showing active and automatic sleep currents) 25 20 15 10 5 0 0 500 1000 1500 2000 2500 3000 3500 4000 supply current in ma time in ns 10 8 2 0 1 2345 frequency in mhz supply current in ma note: t = 25 c figure 10. typical i cc1 vs. frequency 2.7 v 3.6 v 4 6 12
38 am29dl642g june 10, 2005 preliminary test conditions table 15. test specifications key to switching waveforms 2.7 k c l 6.2 k 3.3 v device under te s t note: diodes are in3064 or equivalent figure 11. test setup test condition 70, 90 unit output load 1 ttl gate output load capacitance, c l (including jig capacitance) 30 pf input rise and fall times 5 ns input pulse levels 0.0?3.0 v input timing measurement reference levels 1.5 v output timing measurement reference levels 1.5 v waveform inputs outputs steady changing from h to l changing from l to h don?t care, any change permitted changing, state unknown does not apply center line is high impedance state (high z) 3.0 v 0.0 v 1.5 v 1.5 v io output measurement level input figure 12. input waveforms and measurement levels
june 10, 2005 am29dl642g 39 preliminary ac characteristics read-only operations notes: 1. not 100% tested. 2. see figure 11 and table 15 for test specifications 3. ce# and ce2# must not be driven low simultaneously. 4. measurements performed by placing a 50 ohm te rmination on the data pin with a bias of v cc /2. the time from oe# high to the data bus driven to v cc /2 is taken as t df . parameter description test setup 70 90 jedec std. unit t avav t rc read cycle time (note 1) min 70 90 ns t avqv t acc address to output delay (note 3) ce# or ce2#, oe# = v il max 70 90 ns t elqv t ce chip enable to output delay oe# = v il max 70 90 ns t glqv t oe output enable to output delay max 30 35 ns t ehqz t df chip enable to output high z (notes 1, 4) max 16 ns t ghqz t df output enable to output high z (notes 1, 4) max 16 ns t axqx t oh output hold time from addresses, ce# or oe#, whichever occurs first min 0 ns t oeh output enable hold time (note 1) read min 0 ns toggle and data# polling min10ns t oh t ce outputs we# addresses ce# or ce2# oe# high z output valid high z addresses stable t rc t acc t oeh t rh t oe t rh 0 v ry/by# reset# t df figure 13. read operation timings
40 am29dl642g june 10, 2005 preliminary ac characteristics hardware reset (reset#) note: not 100% tested. parameter description 70, 90 unit jedec std t ready reset# pin low (during embedded algorithms) to read mode (see note) max 20 s t ready reset# pin low (not during embedded algorithms) to read mode (see note) max 500 ns t rp reset# pulse width min 500 ns t rh reset high time before read (see note) min 50 ns t rpd reset# low to standby mode min 20 s t rb ry/by# recovery time min 0 ns reset# ry/by# ry/by# t rp t ready reset timings not during embedded algorithms t ready ce# or ce2#, oe# t rh ce# or ce2#, oe# reset timings during embedded algorithms reset# t rp t rb figure 14. reset timings
june 10, 2005 am29dl642g 41 preliminary ac characteristics erase and program operations notes: 1. not 100% tested. 2. see the ?erase and programming performance? section for more information. parameter 70 90 jedec std description unit t avav t wc write cycle time (note 1) min 70 90 ns t avwl t as address setup time min 0 ns t aso address setup time to oe# low during toggle bit polling min 15 ns t wlax t ah address hold time min 40 45 ns t aht address hold time from ce# or oe# high during toggle bit polling min 0 ns t dvwh t ds data setup time min 40 45 ns t whdx t dh data hold time min 0 ns t oeph output enable high during toggle bit polling min 20 ns t ghwl t ghwl read recovery time before write (oe# high to we# low) min 0 ns t elwl t cs ce# or ce#2 setup time min 0 ns t wheh t ch ce# or ce#2 hold time min 0 ns t wlwh t wp write pulse width min 30 35 ns t whdl t wph write pulse width high min 30 ns t sr/w latency between read and write operations min 0 ns t whwh1 t whwh1 programming operation (note 2) typ 7 s t whwh1 t whwh1 accelerated programming operation (note 2) typ 4 s t whwh2 t whwh2 sector erase operation (note 2) typ 0.4 sec t vcs v cc setup time (note 1) min 50 s t rb write recovery time from ry/by# min 0 ns t busy program/erase valid to ry/by# delay max 90 ns
42 am29dl642g june 10, 2005 preliminary ac characteristics oe# we# ce# or ce2# v cc data addresses t ds t ah t dh t wp pd t whwh1 t wc t as t wph t vcs 555 h pa pa read status data (last two cycles) a0h t cs status d out program command sequence (last two cycles) ry/by# t rb t busy t ch pa n ote: pa = program address, pd = program data, d out is the true data at the program address. figure 15. program operation timings wp#/acc t vhh v hh v il or v ih v il or v ih t vhh figure 16. accelerated program timing diagram
june 10, 2005 am29dl642g 43 preliminary ac characteristics oe# ce# or ce2# addresses v cc we# data 2aah sa t ah t wp t wc t as t wph 555 h for chip erase 10 for chip erase 30h t ds t vcs t cs t dh 55h t ch in progress complete t whwh2 va va erase command sequence (last two cycles) read status data ry/by# t rb t busy notes: sa = sector address (for sector erase), va = valid addres s for reading status data (see ?write operation status?.) figure 17. chip/sector erase operation timings
44 am29dl642g june 10, 2005 preliminary ac characteristics oe# ce2# or ce# we# addresses t oh data valid in valid in valid pa valid ra t wc t wph t ah t wp t ds t dh t rc t ce valid out t oe t acc t oeh t ghwl t df valid in ce# or ce2# controlled write cycles we# controlled write cycle valid pa valid pa t cp t cph t wc t wc read cycle t sr/w figure 18. back-to-back read/write cycle timings we# ce# or ce2# oe# high z t oe high z dq7 dq0?dq6 ry/by# t busy complement tr u e addresses va t oeh t ce t ch t oh t df va va status data complement status data tr u e valid data valid data t acc t rc note: va = valid address. illustration shows fi rst status cycle after command sequence, la st status read cycle, and array data read cycle. figure 19. data# polling timings (during embedded algorithms)
june 10, 2005 am29dl642g 45 preliminary ac characteristics oe# ce# or ce2# we# addresses t oeh t dh t aht t aso t oeph t oe valid data (first read) (second read) (stops toggling) t ceph t aht t as dq6/dq2 valid data valid status valid status valid status ry/by# note: va = valid address; not required for dq6. illustration shows first two status cyc le after command sequence, last status read cycle, and array data read cycle figure 20. toggle bit timings (during embedded algorithms) note: dq2 toggles only when read at an address within an erase- suspended sector. the system may use oe# or ce# to toggle dq2 and dq6. figure 21. dq2 vs. dq6 enter erase erase erase enter erase suspend program erase suspend read erase suspend read erase we# dq6 dq2 erase complete erase suspend suspend program resume embedded erasing
46 am29dl642g june 10, 2005 preliminary ac characteristics temporary sector unprotect note: not 100% tested. parameter all speed options jedec std description unit t vidr v id rise and fall time (see note) min 500 ns t vhh v hh rise and fall time (see note) min 250 ns t rsp reset# setup time for temporary sector unprotect min 4 s t rrb reset# hold time from ry/by# high for temporary sector unprotect min 4 s reset# t vidr v id v ss , v il , or v ih v id v ss , v il , or v ih ce# or ce2# we# ry/by# t vidr t rsp program or erase command sequence t rrb figure 22. temporary sector unprotect timing diagram
june 10, 2005 am29dl642g 47 preliminary ac characteristics sector group protect: 150 s sector group unprot ect: 15 ms 1 s reset# sa, a6, a1, a0 data c e# or ce2# we# oe# 60h 60h 40h valid* valid* valid* status sector group protect/unprotect verify v id v ih * for sector protect, a6 = 0, a1 = 1, a0 = 0. for sector unpr otect, a6 = 1, a1 = 1, a0 = 0. figure 23. sector/sector block protect and unprotect timing diagram
48 am29dl642g june 10, 2005 preliminary ac characteristics alternate ce# controlled er ase and program operations notes: 1. not 100% tested. 2. see the ?erase and programming performance? section for more information. parameter speed options jedec std. description 70 90 unit t avav t wc write cycle time (note 1) min 70 90 ns t avwl t as address setup time min 0 ns t elax t ah address hold time min 40 45 ns t dveh t ds data setup time min 40 45 ns t ehdx t dh data hold time min 0 ns t ghel t ghel read recovery time before write (oe# high to we# low) min 0 ns t wlel t ws we# setup time min 0 ns t ehwh t wh we# hold time min 0 ns t eleh t cp ce# pulse width min 40 45 ns t ehel t cph ce# pulse width high min 30 ns t whwh1 t whwh1 programming operation (note 2) typ 7 s t whwh1 t whwh1 accelerated programming operation (note 2) typ 4 s t whwh2 t whwh2 sector erase operation (note 2) typ 0.4 sec
june 10, 2005 am29dl642g 49 preliminary ac characteristics t ghel t ws oe# ce# or ce2# we# reset# t ds data t ah addresses t dh t cp dq7# d out t wc t as t cph pa data# polling a0 for program 55 for erase t rh t whwh1 or 2 ry/by# t wh pd for program 30 for sector erase 10 for chip erase 555 for program 2aa for erase pa for program sa for sector erase 555 for chip erase t busy notes: 1. figure indicates last two bus cycl es of a program or erase operation. 2. pa = program address, sa = sector address, pd = program data. 3. dq7# is the complement of the data written to the device. d out is the data written to the device.. figure 24. alternate ce# controlled write (erase/program) operation timings
50 am29dl642g june 10, 2005 preliminary erase and programming performance notes: 1. typical program and erase times assume the following conditions: 25 c, 3.0 v v cc , 1,000,000 cycles. additionally, programming typicals assu me checkerboard pattern. 2. under worst case conditions of 90 c, v cc = 2.7 v, 1,000,000 cycles. 3. the typical chip programming time is considerably less t han the maximum chip programming ti me listed, since most bytes program faster than the ma ximum program times listed. 4. in the pre-programming step of the embedded erase algorit hm, all bytes are programmed to 00h before erasure. 5. system-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. see table 13 for further information on command definitions. 6. the device has a minimum erase and pr ogram cycle endurance of 1,000,000 cycles. latchup characteristics note: includes all pins except v cc . test conditions: v cc = 3.0 v, one pin at a time. data retention parameter typ (note 1) max (note 2) unit comments sector erase time 0.4 5 sec excludes 00h programming prior to erasure (note 4) chip erase time 56 sec accelerated word program time 4 120 s excludes system level overhead (note 5) word program time 7 210 s chip program time (note 3) 28 84 sec description min max input voltage with respect to v ss on all pins except i/o pins (including a9, oe#, and reset#) ?1.0 v 12.5 v input voltage with respect to v ss on all i/o pins ?1.0 v v cc + 1.0 v v cc current ?100 ma +100 ma parameter description t est conditions min unit minimum pattern data retention time 150 c10years 125 c20years
june 10, 2005 am29dl642g 51 preliminary physical dimensions fsd063?63-ball fine-pitch ball grid array (fbga) 10.95 x 11.95 mm package 3224 \ 16-038.14b notes: 1. dimensioning and tolerancing methods per asme y14.5m-1994. 2. all dimensions are in millimeters. 3. ball position designation per jesd 95-1, spp-010. 4. e represents the solder ball grid pitch. 5. symbol "md" is the ball matrix size in the "d" direction. symbol "me" is the ball matrix size in the "e" direction. n is the number of populated solder ball positions for matrix size md x me. 6 dimension "b" is measured at the maximum ball diameter in a plane parallel to datum c. 7 sd and se are measured with respect to datums a and b and define the position of the center solder ball in the outer row. when there is an odd number of solder balls in the outer row, sd or se = 0.000. when there is an even number of solder balls in the outer row, sd or se = e/2 8. "+" indicates the theoretical center of depopulated balls. 9. not used. 10. a1 corner to be identified by chamfer, laser or ink mark, metallized mark indentation or other means. package fsd 063 jedec n/a 10.95 mm x 11.95 mm package symbol min nom max note a --- --- 1.40 profile a1 0.25 --- --- ball height a2 1.00 --- 1.10 body thickness d 11.95 bsc. body size e 10.95 bsc. body size d1 8.80 bsc. matrix footprint e1 5.60 bsc. matrix footprint md 12 matrix size d direction me 8 matrix size e direction n 63 ball count b 0.30 0.35 0.40 ball diameter ee 0.80 bsc. ball pitch ed 0.80 bsc. ball pitch sd / se 0.40 bsc. solder ball placement a3,a4,a5,a6,b2,b3,b4,b5,b6 c1,c8,d1,d8,e1,e8,f1,f8 depopulated solder balls g1,g8,h1,h8,j1,j8,k1,k8 l3,l4,l5,l6,m3,m4,m5,m6 63x 6 b 0.20 c c 0.15 b a c c m m 0.08 c side view a2 a1 a 0.08 c 0.15 (2x) (2x) c 0.15 b a d e top view 10 index mark corner pin a1 l m ed corner e1 7 se d1 a b dc e f hg 8 7 5 6 4 2 3 j k 1 ee sd bottom view pin a1 7
52 am29dl642g june 10, 2005 preliminary revision summary revision a (june 12, 2002) initial release. revision b (august 27, 2002) global changed speed rating from 90 ns to 70 ns. deleted references and data related to byte mode. ordering information added fsd063 package drawing and part number designator. common flash interface (cfi) in 3rd paragraph, corrected last sentence to indicate that after a reset command, device returns to reading array data, not autoselect mode. dc characteristics changed maximum current for i cc3 , i cc4, i cc5 to 10 ma. in note 1, indicated that specification is for one die ac- tive at a time. ac characteristics read-only operations: changed t df from 30 to 16 ns, and t oe from 35 to 30 ns. added note reference to tacc. erase and program operations: changed t ah and t ds from 45 to 40 ns, and t wp from 35 to 30 ns. physical dimensions added fsd063 package drawing. revision b+1 (september 5, 2002) global added 90 ns speed option. dc characteristics deleted i acc parameter from table. revision b+2 (june 10, 2005) modified disclaimers trademarks copyright ?2002-2005 advanced micro devices, inc. all rights reserved. amd, the amd logo, and combinations thereof are registered trademarks of advanced micro devices, inc. expressflash is a trademark of advanced micro devices, inc. product names used in this publication are for identification purposes only and may be trademarks of their respective companies .

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