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| www..com REVISIONS LTR A DESCRIPTION Change to military drawing format. Changes to output adjustment range. Add conditions for load regulation test at -55C and +125C. Change group A subgroups for load regulation and line regulation tests, and output voltage temperature coefficient. Add vendor CAGE 64155. Editorial changes throughout. Add vendor CAGE 07933. Add vendor CAGE 54186. Add case outline 2. Change output voltage temperature coefficient test limits. Add device type 02. Editorial changes throughout. Delete vendors CAGEs 54186 and 07933. Add vendor CAGE 1ES66. Add class V devices. Replace CAGE 06665 with 24355. Add case outline H and TABLE IIB. Make changes to 1.2.2 and TABLE II. Add radiation hardness assurance requirements. - ro Make changes to 1.5, table IIA, 4.4.1b, and output voltage temperature coefficient test as specified in table I. - ro Add device types 03 and 04. Make changes 1.2.2 and to the output voltage noise test as specified under TABLE I. - ro Drawing updated to reflect current requirements. -rrp DATE (YR-MO-DA) 88-03-17 APPROVED M. A. FRYE B 89-04-12 M. A. FRYE C 92-11-25 M. A. FRYE D 97-06-10 R. MONNIN E F 98-08-07 00-01-21 R. MONNIN R. MONNIN G 01-02-07 R. MONNIN H 05-12-07 R. MONNIN THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. DataShee .com CURRENT CAGE CODE 67268 REV SHEET REV SHEET REV STATUS OF SHEETS PMIC N/A REV SHEET H 1 H 2 H 3 H 4 H 5 H 6 H 7 H 8 H 9 H 10 PREPARED BY DONALD OSBORNE STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY DANIEL A. DiCENZO DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http://www.dscc.dla.mil APPROVED BY N. A. HAUCK MICROCIRCUIT, LINEAR, RADIATION HARDENED, +5 VOLT ADJUSTABLE PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON DRAWING APPROVAL DATE 86-03-08 AMSC N/A REVISION LEVEL H SIZE A SHEET CAGE CODE 14933 1 OF 10 85514 .com DSCC FORM 2233 APR 97 5962-E061-06 DataSheet 4 U .com www..com 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following examples. For device classes M and Q: 85514 01 G X Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) For device class V: 5962 R 85514 01 V G X Federal stock class designator \ RHA designator (see 1.2.1) / Device type (see 1.2.2) Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) \/ Drawing number t4U.com 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. .com 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type 01 02 03 04 Generic number REF02A REF02 REF02A REF02 Circuit function Precision reference +5-volt adjustable output Precision reference +5-volt adjustable output Precision reference +5-volt adjustable output Precision reference +5-volt adjustable output Output voltage noise 18 VP-P 18 VP-P 100 VP-P 100 VP-P DataShee 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q designators will not be included in the PIN and will not be marked on the device. Device class M Device requirements documentation Vendor self-certification to the requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Certification and qualification to MIL-PRF-38535 Q or V STANDARD MICROCIRCUIT DRAWING .com DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL 85514 SHEET H 2 DataSheet 4 U .com www..com 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter G H P 2 Descriptive designator MACY1-X8 GDFP1-F10 or CDFP2-F10 GDIP1-T8 or CDIP2-T8 CQCC1-N20 Terminals 8 10 8 20 Package style Can Flat pack Dual-in-line Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) ........................................................................................ 40 V dc Power dissipation (PD) ................................................................................. Output short circuit duration.......................................................................... Storage temperature..................................................................................... Lead temperature (soldering, 10 seconds) ................................................... Junction temperature (TJ)............................................................................. 500 mW 2/ Indefinite -65C to +150C +300C +150C Thermal resistance, junction-to-case (JC)................................................... See MIL-STD-1835 1.4 Recommended operating conditions. Ambient operating temperature range (TA) .................................................. -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 50 - 300 rads(Si)/s) ......................... 100 Krads(Si) 3/ t4U.com 2. APPLICABLE DOCUMENTS DataShee .com 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate 7.1 mW/C above +80C for the "G" and "H" packages, 6.6 mW/C above +75C for the "P" package, and 7.8 mW/C above +72C for the "2" package. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. STANDARD MICROCIRCUIT DRAWING .com DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL 85514 SHEET H 3 DataSheet 4 U .com www..com DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 List of Standard Microcircuit Drawings. Standard Microcircuit Drawings. (Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test.com the subgroups specified in table IIA. The electrical requirements shall be tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. t4U.com DataShee STANDARD MICROCIRCUIT DRAWING .com DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL 85514 SHEET H 4 DataSheet 4 U .com www..com TABLE I. Electrical performance characteristics. Conditions 1/ -55C TA +125C unless otherwise specified No load Test Symbol Group A subgroups 1 2,3 Device type Min All Limits Max 1.4 2.0 Unit Quiescent supply current ISY mA M,D,P,L,R 2/ 3/ Output adjustment 4/ range Output voltage VTRIM VO RP = 10 k, TA = +25C IL = 0 mA 1 1 1 01 All 01,03 02,04 3.0 4.985 4.975 4.978 4.953 4.975 +15 -0.3 1.4 % 5.015 5.025 5.022 5.047 5.025 +60 mA mA 0.01 0.015 0.012 0.015 0.010 0.012 0.015 0.030 10 18 100 8.5 25 ppm/C mA VP-P %/V %/mA V 2,3 M,D,P,L,R 2/ 3/ Short circuit current 4/ Sink current 4/ Load regulation IOS IS LD reg VO = 0 V, TA = +25C TA = +25C IL = 0 mA to 10 mA 5/ M,D,P,L,R 2/ 3/ IL = 0 mA to 8 mA 5/ Line regulation LN reg VIN = 8 V to 33 V 5/ 1 1 1 1 1 2,3 01,03 02,04 01 All All All 01 01,03 02,04 t4U.com 1 01,03 02,04 DataShee .com M,D,P,L,R 2/ 3/ Load current Output voltage noise IL enp-p TA = +25C 4/ 6/ 0.1 Hz to 10 Hz 4/ 2,3 1 1 4 All 01 All 01,02 03,04 Output voltage temperature coefficient TCVO 4/ 7/ 8 01,03 02,04 1/ VIN = 15 V. 2/ Devices supplied to this drawing have been characterized through all levels M, D, P, L, and R of irradiation. However, this device is only tested at the "R" level. Pre and Post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA = +25C. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. 4/ This parameter is not tested to post irradiation. 5/ Line and load regulation specifications include the effect of self heating. 6/ Minimum of 10 mA load current guaranteed by load regulation test. 6 7/ TCVO = (VMAX - VMIN) / 5 V x ((-55C to +125C) x (1 x 10 )) / 180C. STANDARD MICROCIRCUIT DRAWING .com DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL 85514 SHEET H 5 DataSheet 4 U .com www..com Device types Case outlines Terminal number 1 2 3 4 5 6 7 8 9 10 01,02,03,04 G and P 01 H Terminal symbol 01,02,03,04 2 NC VIN TEMP GND TRIM VOUT NC NC ------- NC VIN TEMP GND TRIM VOUT NC NC NC NC --- NC NC NC NC VIN NC TEMP NC NC GND NC TRIM NC NC VOUT NC NC NC NC NC t4U.com 11 12 13 14 15 16 17 18 19 20 NC = No connection DataShee --.com ----------------------------------- FIGURE 1. Terminal connections. STANDARD MICROCIRCUIT DRAWING .com DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL 85514 SHEET H 6 DataSheet 4 U .com www..com t4U.com DataShee .com FIGURE 2. Radiation exposure circuit. STANDARD MICROCIRCUIT DRAWING .com DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL 85514 SHEET H 7 DataSheet 4 U .com www..com 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 59 (see MIL-PRF-38535, appendix A). 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table IIA herein. t4U.com 4.2.2 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and .comapproved alternatives shall be as specified in the test temperature, or device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. Interim and final electrical test parameters shall be as specified in table IIA herein. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. DataShee b. c. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. a. b. Tests shall be as specified in table IIA herein. Subgroups 5, 6, 7, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. STANDARD MICROCIRCUIT DRAWING .com DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL 85514 SHEET H 8 DataSheet 4 U .com www..com TABLE IIA. Electrical test requirements. Test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Device class M --1,2,3,4 1/ 1,2,3,8 1,2,3 1,2,3 --Subgroups (in accordance with MIL-PRF-38535, table III) Device class Q --1,2,3,4 1/ 1,2,3,8 1,2,3 1,2,3 --Device class V --1,2,3,4 1/ 2/ 1,2,3,8 1,2,3 2/ 1,2,3 1 Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group A test requirements (see 4.4) Group C end-point electrical parameters (see 4.4) Group D end-point electrical parameters (see 4.4) Group E end-point electrical parameters (see 4.4) 1/ PDA applies to subgroup 1. 2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits shall be computed with reference to the previous interim electrical parameters. t4U.com TABLE IIB. 240 hour and 1000 hour life test deltas. DataShee Units .com Test Symbol End point Min Output voltage VO 4.985 Max 5.015 3 mV Delta 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition B or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MILSTD-883. TA = +125C, minimum. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. b. c. STANDARD MICROCIRCUIT DRAWING .com DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL 85514 SHEET H 9 DataSheet 4 U .com www..com 4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). RHA levels for device classes M, Q, and V shall be as specified in MIL-PRF-38535. End-point electrical parameters shall be as specified in table IIA herein. 4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883 method 1019, condition A and as specified herein. 4.4.4.1.1 Accelerated aging test. Accelerated aging tests shall be performed on all devices requiring a RHA level greater than 5k rads(Si). The post-anneal end-point electrical parameter limits shall be as specified in table I herein and shall be the preirradiation end-point electrical parameter limit at 25C 5C. Testing shall be performed at initial qualification and after any design or process changes which may affect the RHA response of the device. 4.4.4.2 Dose rate burnout. When required by the customer test shall be performed on devices, SEC, or approved test structures at technology qualifications and after any design or process changes which may effect the RHA capability of the process. Dose rate burnout shall be performed in accordance with test method 1023 of MIL-STD-883 and as specified herein. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. t4U.com 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. .com 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0525. 6.4 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0547. 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331. 6.6 Sources of supply. 6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to this drawing. 6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA. DataShee STANDARD MICROCIRCUIT DRAWING .com DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL 85514 SHEET H 10 DataSheet 4 U .com www..com STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 05-12-07 Approved sources of supply for SMD 85514 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/ . Standard microcircuit drawing PIN 1/ 8551401GA Vendor CAGE number 24355 3/ Vendor similar PIN 2/ REF02AJ/883 REF-02AH/883 REF02AJ/883B REF02AZ/883 REF-02AJ8/883 REF02AZ/883B REF-02ARC/883 REF02J/883B REF02Z/883B REF02RC/883B REF02AJ/QMLV REF02AL/QMLV REF02AZ/QMLV REF02ARC/QMLV REF02AJ/QMLR REF02AL/QMLR REF02AZ/QMLR REF02ARC/QMLR REF02AJ/883B REF02AZ/883B 8551401GC 8551401PA 3/ 24355 3/ 3/ 85514012A 24355 3/ 3/ .com 3/ 24355 24355 24355 24355 24355 24355 24355 24355 1ES66 1ES66 t4U.com 8551402GC 8551402PA 85514022C 5962-8551401VGA 5962-8551401VHA 5962-8551401VPA 5962-8551401V2A 5962R8551401VGA 5962R8551401VHA 5962R8551401VPA 5962R8551401V2A 8551403GC 8551403PA DataShee 1 of 2 .com DataSheet 4 U .com www..com STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued Standard microcircuit drawing PIN 1/ 8551404GC 8551404PA 85514042C Vendor CAGE number 1ES66 1ES66 1ES66 Vendor similar PIN 2/ REF02J/883B REF02Z/883B REF02RC/883B 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from an approved source of supply. Vendor CAGE number 24355 Vendor name and address Analog Devices RT 1 Industrial Park P.O. Box 9106 Norwood, MA 02062 Point of contact: 1500 Space Park Drive P.O. Box 58020 .com Santa Clara, CA 95050-8020 Maxim Integrated Products 120 San Gabriel Drive Sunnyvale, CA 94086-5125 t4U.com 1ES66 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin. 2 of 2 .com DataSheet 4 U .com |
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