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EMIF04-MMC02F2 4-line IPADTM, EMI filter including ESD protection Features EMI symmetrical (I/O) low-pass filter High efficiency in EMI filtering Lead-free package Very low PCB space occupation: 1.57 mm x 2.07 mm Very thin package: 0.65 mm High efficiency in ESD suppression High reliability offered by monolithic integration High reduction of parasitic elements through integration and wafer level packaging Figure 1. Pin layout (bump side) 3 I1 Flip Chip 11 bumps 2 O1 1 A O2 Complies with the standards: IEC 61000-4-2 Level 4 - 15 kV (air discharge) - 8 kV (contact discharge) I2 VD2 B C D I3 VD1 O3 Application Where EMI filtering in ESD sensitive equipment is required: I4 GND O4 Figure 2. Device configuration VD2 VD1 MultiMediaCard for mobile phones, personal digital assistant, digital camera, MP3 players... R1 I1 I2 I3 R2 R3 R20 R10 O1 (Data) O2 (CLK) O3 (CMD) O4 Description The EMIF04-MMC02 is a highly integrated device designed to suppress EMI/RFI noise for a MultiMediaCard port. The EMIF04 Flip Chip packaging means the package size is equal to the die size. This filter includes ESD protection circuitry, which prevents damage to the application when it is subjected to ESD surges up to 15 kV. I4 R4 Cline = 20pF max. GND TM: IPAD is a trademark of STMicroelectronics. April 2008 Rev 4 1/8 www.st.com 8 Electrical characteristics EMIF04-MMC02F2 1 Electrical characteristics Table 1. Symbol PR Tj Top Tstg DC power per resistor Junction temperature Operating temperature range Storage temperature range Absolute maximum ratings (Tamb = 25 C) Parameter Value 70 125 -40 to + 85 -55 to +150 Unit mW C C C Table 2. Symbol VBR IRM VRM VCL Rd IPP RI/O Cline Symbol VBR IRM Cline \ Electrical characteristics (Tamb = 25 C) Parameters Breakdown voltage Leakage current @ VRM Stand-off voltage Clamping voltage Dynamic impedance Peak pulse current Series resistance between input and output Input capacitance per line Test conditions IR = 1 mA VRM = 3 V @0V 47 13 56 Min 6 0.1 0.5 20 Typ Max Unit V A pF k k R1,R2,R3,R4 Tolerance 5% R10 R20 Tolerance 5% Tolerance 5% 2/8 EMIF04-MMC02F2 Electrical characteristics Figure 3. S21 (dB) attenuation measurement Figure 4. and Aplac simulation EMIF04-MMC02F2: Aplac vs measurement (C3/C1 line) Cross talk measurement Xtalk measurements C3/B1 0.00 dB - 5.00 - 10.00 Simulation 0.00 dB -10.00 -20.00 - 15.00 - 20.00 - 25.00 - 30.00 - 35.00 Measurement -30.00 -40.00 -50.00 -60.00 - 40.00 - 45.00 - 50.00 1.0M 3.0M 10.0M 30.0M 100.0M f/Hz 300.0M 1.0G 3.0G -70.00 -80.00 1.0M 3.0M 10.0M 30.0M 100.0M 300.0M f/Hz 1.0G 3.0G Figure 5. ESD response to IEC 61000-4-2 (+15kV contact discharge) on one input (Vin) and one output (Vout) Figure 6. ESD response to IEC 61000-4-2 (-15kV contact discharge) on one input (Vin) and one output (Vout) Vin Vin Vout Vout Figure 7. Junction capacitance versus reverse applied voltage typical values C(pF) 20 18 16 14 12 10 8 6 4 2 0 0.0 0.5 1.0 1.5 2.0 VR(V) 2.5 3.0 3.5 4.0 F=1MHz Vosc=30mVRMS Tj=25C 3/8 Application information EMIF04-MMC02F2 2 Application information Figure 8. Device structure B22 C22 R20 R1 A33 R2 B33 C33 D33 MODEL = demif04 R3 R4 R10 A22 B11 C11 D11 MODEL = demif04 bulk MODEL = demif04_gnd D2 Model demif04 BV = 7 IBV = 1m CJO = Cz M = 0.3333 RS = 1 VJ = 0.6 TT = 100n Model demif04 gnd BV = 7 IBV = 1m CJO = Cz_gnd M = 0.3333 RS = RS_gnd VJ = 0.6 TT = 100n Figure 9. Aplac model connections Rbump Lbump D2 Rbump Lbump A33 A2 A22 A3 + Cbump Rbump Lbump Rbump Lbump B3 bulk + Cbump Rbump Rbump Lbump bulk Rbump Lbump B22 B1 B11 B33 B2 + Rbump Cbump Rbump Rbump Lbump C3 bulk + Cbump Rbump Rbump Lbump bulk + Cbump Rbump Rbump Lbump Device aplacvar R1 50.053 aplacvar R2 50.053 aplacvar R3 50.053 aplacvar R4 50.053 aplacvar R10 13 k aplacvar R20 56 k aplacvar Rsub 120 m Diodes aplacvar Cz 14.9pF aplacvar Cz_gnd 47.9pF aplacvar Rs_gnd 480 m Bumps aplacvar Rbump 20 m aplacvar Lbump 50 pH aplacvar Cbump 1.5 p Gnd aplacvar Lgnd 95 pH aplacvar Rgnd 100 m aplacvar Cgnd 0.6 pF bulk C33 C2 C22 C1 C11 + Lgnd Cgnd D3 Rgnd Cbump Rbump Rbump Lbump bulk + Cbump Rbump bulk + Cbump Rbump Rbump Lbump D1 bulk D33 D11 + Cbump Rbump bulk + Cbump Rbump bulk 4/8 EMIF04-MMC02F2 Ordering information scheme 3 Ordering information scheme Figure 10. Ordering information scheme EMIF EMI Filter Number of lines Information x = resistance value (Ohms) z = capacitance value / 10(pF) or 3 letters = application 2 digits = version Package F = Flip Chip x = 2: Lead-free, pitch = 500 m, bump = 315 m yy - xxx zz Fx 4 Package information In order to meet environmental requirements, ST offers these devices in ECOPACK(R) packages. These packages have a lead-free second level interconnect. The category of second level interconnect is marked on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are available at www.st.com. Figure 11. Flip Chip dimensions 500 m 50 315 m 50 650 m 65 500 m 50 285 m 1.57mm 50 m 285 m 2.07mm 50 m 5/8 Ordering information EMIF04-MMC02F2 Figure 12. Footprint Copper pad Diameter: 250 m recommended, 300 m max Figure 13. Marking Dot, ST logo xx = marking z = manufacturing location yww = datecode (y = year ww = week) E Solder stencil opening: 330 m Solder mask opening recommendation: 340 m min for 315 m copper pad diameter xxz y ww Figure 14. Flip Chip tape and reel specification Dot identifying Pin A1 location 4 0.1 O 1.5 0.1 1.75 0.1 3.5 0.1 2.17 0.73 0.05 All dimensions in mm 8 0.3 ST E ST E ST E xxz yww User direction of unreeling xxz yww xxz yww 4 0.1 1.67 5 Ordering information Table 3. Ordering information Marking FH Package Flip Chip Weight 4.5 mg Base qty 5000 Delivery mode Tape and reel (7") Order code EMIF04-MMC02F2 Note: More packing information is available in the applications note: AN1235: "Flip Chip: package description and recommendations for use" AN 1751: "EMI filters: Recomendations and measurements" 6/8 EMIF04-MMC02F2 Revision history 6 Revision history Table 4. Date 14-Oct-2004 06-Apr-2005 25-Aug-2005 28-Apr-2008 Document revision history Revision 1 2 3 4 First issue Minor layout update. No content change. Reformatted to current standard, Aplac model updated in section 2. Updated ECOPACK statement. Updated Figure 10, Figure 11 and Figure 14. Reformatted to current standards. Changes 7/8 EMIF04-MMC02F2 Please Read Carefully: Information in this document is provided solely in connection with ST products. STMicroelectronics NV and its subsidiaries ("ST") reserve the right to make changes, corrections, modifications or improvements, to this document, and the products and services described herein at any time, without notice. All ST products are sold pursuant to ST's terms and conditions of sale. Purchasers are solely responsible for the choice, selection and use of the ST products and services described herein, and ST assumes no liability whatsoever relating to the choice, selection or use of the ST products and services described herein. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted under this document. If any part of this document refers to any third party products or services it shall not be deemed a license grant by ST for the use of such third party products or services, or any intellectual property contained therein or considered as a warranty covering the use in any manner whatsoever of such third party products or services or any intellectual property contained therein. UNLESS OTHERWISE SET FORTH IN ST'S TERMS AND CONDITIONS OF SALE ST DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY WITH RESPECT TO THE USE AND/OR SALE OF ST PRODUCTS INCLUDING WITHOUT LIMITATION IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE (AND THEIR EQUIVALENTS UNDER THE LAWS OF ANY JURISDICTION), OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT. UNLESS EXPRESSLY APPROVED IN WRITING BY AN AUTHORIZED ST REPRESENTATIVE, ST PRODUCTS ARE NOT RECOMMENDED, AUTHORIZED OR WARRANTED FOR USE IN MILITARY, AIR CRAFT, SPACE, LIFE SAVING, OR LIFE SUSTAINING APPLICATIONS, NOR IN PRODUCTS OR SYSTEMS WHERE FAILURE OR MALFUNCTION MAY RESULT IN PERSONAL INJURY, DEATH, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE. ST PRODUCTS WHICH ARE NOT SPECIFIED AS "AUTOMOTIVE GRADE" MAY ONLY BE USED IN AUTOMOTIVE APPLICATIONS AT USER'S OWN RISK. Resale of ST products with provisions different from the statements and/or technical features set forth in this document shall immediately void any warranty granted by ST for the ST product or service described herein and shall not create or extend in any manner whatsoever, any liability of ST. ST and the ST logo are trademarks or registered trademarks of ST in various countries. Information in this document supersedes and replaces all information previously supplied. The ST logo is a registered trademark of STMicroelectronics. All other names are the property of their respective owners. (c) 2008 STMicroelectronics - All rights reserved STMicroelectronics group of companies Australia - Belgium - Brazil - Canada - China - Czech Republic - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States of America www.st.com 8/8 |
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