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 PD - 9.1508C
IRLMS1503
HEXFET(R) Power MOSFET
l l l l
Generation V Technology Micro6 Package Style Ultra Low Rds(on) N-Channel MOSFET
, ,
$
, , 5
VDSS = 30V
#
Description
Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The Micro6 package with its customized leadframe produces a HEXFET power MOSFET with Rds(on) 60% less than a similar size SOT-23. This package is ideal for applications where printed circuit board space is at a premium. It's unique thermal design and RDS(on) reduction enables a current-handling increase of nearly 300% compared to the SOT-23.
/
!
"
RDS(on) = 0.10
Top View
M icro6
Absolute Maximum Ratings
Parameter
ID @ TA = 25C ID @ TA = 70C IDM PD @TA = 25C VGS dv/dt TJ, TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Peak Diode Recovery dv/dt Junction and Storage Temperature Range
Max.
3.2 2.6 18 1.7 13 20 5.0 -55 to + 150
Units
A W
mW/C
V V/ns C
Thermal Resistance Ratings
Parameter
RJA Maximum Junction-to-Ambient
Min.
---
Typ.
---
Max
75
Units
C/W
1/12/98
IRLMS1503
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
V(BR)DSS
V(BR)DSS/TJ
Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance
RDS(on) VGS(th) gfs IDSS IGSS Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss
Min. 30 --- --- --- 1.0 1.1 --- --- --- --- --- --- --- --- --- --- --- --- --- ---
Typ. --- 0.037 --- --- --- --- --- --- --- --- 6.4 1.1 1.9 4.6 4.4 10 2.0 210 90 32
Max. Units Conditions --- V V GS = 0V, ID = 250A --- V/C Reference to 25C, ID = 1mA 0.10 VGS = 10V, ID = 2.2A 0.20 VGS = 4.5V, ID = 1.1A --- V VDS = V GS, ID = 250A --- S V DS = 10V, ID = 1.1A 1.0 VDS = 24V, VGS = 0V A 25 VDS = 24V, VGS = 0V, TJ = 125C -100 VGS = -20V nA 100 VGS = 20V 9.6 ID = 2.2A 1.7 nC VDS = 24V 2.8 VGS = 10V, See Fig. 6 and 9 --- VDD = 15V --- ID = 2.2A ns --- RG = 6.0 --- RD = 6.7, See Fig. 10 --- VGS = 0V --- pF VDS = 25V --- = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
IS
ISM
VSD trr Qrr
Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge
Min. Typ. Max. Units --- --- --- --- --- --- --- --- 36 39 1.7 A 18 1.2 54 58 V ns nC
Conditions MOSFET symbol showing the G integral reverse p-n junction diode. TJ = 25C, IS = 2.2A, VGS = 0V TJ = 25C, I F = 2.2A di/dt = 100A/s
D
S
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Pulse width 300s; duty cycle 2%. Surface mounted on FR-4 board, t 5sec.
ISD 2.2A, di/dt 150A/s, VDD V(BR)DSS,
TJ 150C
IRLMS1503
100
VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOTTOM 3.0V TOP
100
I D , Drain-to-Source Current (A)
I D , Drain-to-Source Current (A)
VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOTTOM 3.0V TOP
10
10
1
1
3.0V
3.0V
20s PULSE WIDTH TJ = 25 C
1 10
0.1 0.1
0.1 0.1
20s PULSE WIDTH TJ = 150 C
1 10
VDS , Drain-to-Source Voltage (V)
VDS , Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
100
2.0
TJ = 25 C
10
R DS(on) , Drain-to-Source On Resistance (Normalized)
ID = 2.2A
I D , Drain-to-Source Current (A)
1.5
TJ = 150 C
1.0
1
0.5
0.1 3.0
V DS = 10V 20s PULSE WIDTH 4.0 5.0 6.0 7.0 8.0
0.0 -60 -40 -20
VGS = 10V
0 20 40 60 80 100 120 140 160
VGS , Gate-to-Source Voltage (V)
TJ , Junction Temperature ( C)
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance Vs. Temperature
IRLMS1503
350 300
VGS, Gate-to-Source Voltage (V)
VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd
20
ID = 2.2A VDS = 24V VDS = 15V
16
C, Capacitance (pF)
250 200 150 100 50 0 1
Ciss
12
Coss
8
Crss
4
10
100
0 0 2 4
FOR TEST CIRCUIT SEE FIGURE 9
6 8 10
VDS , Drain-to-Source Voltage (V)
QG , Total Gate Charge (nC)
Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage
Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage
100
100
ISD , Reverse Drain Current (A)
OPERATION IN THIS AREA LIMITED BY RDS(on)
10us 10 100us
10
TJ = 150 C
TJ = 25 C
1
I D , Drain Current (A)
1ms 1 10ms
0.1 0.4
V GS = 0 V
0.6 0.8 1.0 1.2 1.4 1.6 0.1 1
TC = 25 C TJ = 150 C Single Pulse
10 100
VSD ,Source-to-Drain Voltage (V)
VDS , Drain-to-Source Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
IRLMS1503
QG
VDS VGS
RD
10V
QGS VG QGD
D.U.T.
+
RG
- VDD
10V
Charge
Pulse Width 1 s Duty Factor 0.1 %
Fig 9a. Basic Gate Charge Waveform
Current Regulator Same Type as D.U.T.
Fig 10a. Switching Time Test Circuit
VDS
50K 12V .2F .3F
90%
D.U.T. VGS
3mA
+ V - DS
10% VGS
td(on)
IG ID
tr
t d(off)
tf
Current Sampling Resistors
Fig 9b. Gate Charge Test Circuit
100 D = 0.50
Fig 10b. Switching Time Waveforms
Thermal Response (Z thJA )
0.20 10 0.10 0.05 0.02 1 0.01 SINGLE PULSE (THERMAL RESPONSE) Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJA + TA 0.0001 0.001 0.01 0.1 1 10 100
P DM t1 t2
0.1 0.00001
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
IRLMS1503
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
+
Circuit Layout Considerations * Low Stray Inductance * Ground Plane * Low Leakage Inductance Current Transformer
-
+
RG * * * * dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test
+ VDD
Driver Gate Drive P.W. Period D=
P.W. Period VGS=10V
*
D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt
VDD
Re-Applied Voltage Inductor Curent
Body Diode
Forward Drop
Ripple 5%
ISD
* VGS = 5V for Logic Level Devices Fig 13. For N-Channel HEXFETS
IRLMS1503
Package Outline
Micro6 Outline
3 .0 0 (.1 1 8 ) 2 .8 0 (.1 1 1 )
LE AD A SS IG N MEN T S
-B D D S
R EC O MME N D E D FO O T PR IN T
2 X 0. 9 5 (.0 3 7 5 ) 6 X (1 .06 (.0 4 2 )
1 .7 5 (.0 6 8 ) 1 .5 0 (.0 6 0 ) -A -
6 1
5 2
4 3
3 .00 (.1 1 8 ) 2 .60 (.1 0 3 )
6 1
5 2
4 3 2 .20 (.0 8 7 )
0.9 5 ( .0 3 7 5 ) 2X 0 .1 5 6X
D 0 .5 0 (.0 19 ) 0 .3 5 (.0 14 )
D
G 6 X 0 .6 5 (. 02 5 )
(.0 06 ) M C A S B S
0 -1 0 1 .30 (.0 5 1 ) 0 .90 (.0 3 6 ) -C 0 .1 5 (.0 0 6 ) M A X. 1 .45 (.0 5 7 ) 0 .90 (.0 3 6 ) 0 .1 0 (.0 0 4 ) 6 SU R F A C E S
O
O
6X
0 .2 0 (.0 0 7 ) 0 .0 9 (.0 0 4 )
0 .6 0 (.0 2 3 ) 0 .1 0 (.0 0 4 )
NO TES : 1 . D IM E NS IO N IN G & T O L E R A N C IN G P E R A NS I Y 1 4 .5 M -1 98 2 . 2 . C O NT R O L L IN G D IM E NS IO N : M IL L IM E T E R . 3 . D IM E NS IO N S A R E S HO W N IN M IL L IM E T E R S (IN C H E S ).
Part Marking Information
Micro6
E X A M P L E : T H IS IS A N IR L M S 6 7 0 2 PA RT N U MBE R DATE CODE WORK W EEK 01 02 03 04 Y EA R 2001 2002 2003 2004 2005 1996 1997 1998 1999 2000 Y A B C D E F G H J K W O RK W E EK 27 28 29 30 W A B C D
YEAR 2 001 2 002 2 003 2 004 2 005 1 996 1 997 1 998 1 999 2 000
Y 1 2 3 4 5 6 7 8 9 0
W A B C D
TOP W AFE R LO T NUMBER CO DE
B OT TO M
P A R T N U M B E R E X AM P L E S : 2 A = IR L M S 1 9 0 2 2 B = IR L M S 1 5 0 3 2 C = IR L M S 6 7 0 2 2 D = IR L M S 5 7 0 3 D ATE C O DE EXA M PLES: YW W = 9 6 03 = 6 C YW W = 9 6 32 = F F
24 25 26
X Y Z
50 51 52
X Y Z
W O R K W E EK = (1 -2 6 ) IF P R E C E D ED B Y L AS T D IG IT O F C A LE N D E R Y EA R W O R K W E E K = ( 2 7 -5 2 ) IF P R E C E D E D B Y A L E T T E R
IRLMS1503
Tape & Reel Information
Micro6
8m m
4mm
F E E D D IR E C T IO N
N OTE S : 1 . O U T L IN E C O N F O R M S T O E IA -4 8 1 & E IA -5 4 1 .
1 7 8.0 0 ( 7 .0 08 ) M AX .
9 .9 0 ( .3 90 ) 8 .4 0 ( .3 31 ) NO T E S : 1. C O N T R O L L IN G D IM E NS IO N : M IL L IM E T E R. 2. O U T L IN E CO NF O R M S T O E IA -4 8 1 & E IA -5 4 1 .
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 http://www.irf.com/ Data and specifications subject to change without notice. 1/98


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