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a FEATURES 6 (Max) On Resistance 0.8 (Max) On-Resistance Flatness 2.7 V to 5.5 V Single Supply 2.7 V to 5.5 V Dual Supply Rail-to-Rail Operation 8-Lead SOT-23 Package, 8-Lead Micro-SOIC Package Typical Power Consumption (<0.1 W) TTL/CMOS Compatible Inputs APPLICATIONS Automatic Test Equipment Power Routing Communication Systems Data Acquisition Systems Sample and Hold Systems Avionics Relay Replacement Battery-Powered Systems 4 CMOS 5 V/+5 V Single SPDT Switches ADG619/ADG620 ADG619/ADG620 S2 S1 D FUNCTIONAL BLOCK DIAGRAM IN SWITCHES SHOWN FOR A LOGIC "1" INPUT GENERAL DESCRIPTION Table I. Truth Table for the ADG619/ADG620 The ADG619 and the ADG620 are monolithic, CMOS SPDT (single pole, double throw) switches. Each switch conducts equally well in both directions when on. The ADG619/ADG620 offers low On-Resistance of 4 , which is matched to within 0.7 between channels. These switches also provide low power dissipation yet give high switching speeds.The ADG619 exhibits break-before-make switching action, thus preventing momentary shorting when switching channels. The ADG620 exhibits make-before-break action. The ADG619/ADG620 are available in 8-lead SOT-23 packages and 8-lead Micro-SOIC packages. IN 0 1 Switch S1 ON OFF Switch S2 OFF ON PRODUCT HIGHLIGHTS 1. Low On Resistance (RON) (4 typ) 2. Dual 2.7 V to 5.5 V or Single 2.7 V to 5.5 V 3. Low Power Dissipation. CMOS construction ensures low power dissipation. 4. Fast tON/tOFF 5. Tiny 8-Lead SOT-23 Package and 8-Lead Micro-SOIC Package REV. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 (c) Analog Devices, Inc., 2001 ADG619/ADG620-SPECIFICATIONS DUAL SUPPLY1 (V Parameter ANALOG SWITCH Analog Signal Range On Resistance (RON) On Resistance Match Between Channels (RON) On-Resistance Flatness (RFLAT(ON)) LEAKAGE CURRENTS Source OFF Leakage IS (OFF) Channel ON Leakage ID, IS (ON) DIGITAL INPUTS Input High Voltage, VINH Input Low Voltage, VINL Input Current IINL or IINH CIN, Digital Input Capacitance DYNAMIC CHARACTERISTICS ADG619 tON tOFF Break-Before-Make Time Delay, tBBM ADG620 tON tOFF Make-Before-Break Time Delay, tMBB Charge Injection Off Isolation Channel-to-Channel Crosstalk Bandwidth -3 dB CS (OFF) CD, CS (ON) POWER REQUIREMENTS IDD ISS 2 DD = +5 V 10%, VSS = -5 V 10%, GND = 0 V. All specifications -40 C to +85 C unless otherwise noted.) B Version -40 C to +85 C VSS to VDD +25 C Unit V typ max typ max typ max nA typ nA max nA typ nA max V min V max A typ A max pF typ Test Conditions/Comments VDD = +4.5 V, VSS = -4.5 V VS = 4.5 V, IS = -10 mA, Test Circuit 1 VS = 4.5 V, IS = -10 mA VS = 3.3 V, IS = -10 mA VDD = +5.5 V, VSS = -5.5 V VS = 4.5 V, VD = 4.5 V, Test Circuit 2 VS = VD = 4.5 V, Test Circuit 3 4 6 0.7 1.1 0.7 8 1.35 0.8 1.2 0.01 0.25 0.01 0.25 1 1 2.4 0.8 0.005 0.1 2 VIN = VINL or VINH 80 120 45 75 40 155 90 10 ns typ ns max ns typ ns max ns typ ns min ns typ ns max ns typ ns max ns typ ns min pC typ dB typ dB typ MHz typ pF typ pF typ A typ A max A typ A max RL = 300 , CL = 35 pF VS = 3.3 V, Test Circuit 4 RL = 300 , CL = 35 pF VS = 3.3 V, Test Circuit 4 RL = 300 , CL = 35 pF VS1 = VS2 = 3.3 V, Test Circuit 5 RL = 300 , CL = 35 pF VS = 3.3 V, Test Circuit 4 RL = 300 , CL = 35 pF VS = 3.3 V, Test Circuit 4 RL = 300 , CL = 35 pF VS = 0 V, Test Circuit 6 VS = 0 V, RS = 0 , CL = 1 nF, Test Circuit 7 RL = 50 , CL = 5 pF, f = 1 MHz, Test Circuit 8 RL = 50 , CL = 5 pF, f = 1 MHz, Test Circuit 10 RL = 50 , CL = 5 pF, Test Circuit 9 f = 1 MHz f = 1 MHz VDD = +5.5 V, VSS = -5.5 V Digital Inputs = 0 V or 5.5 V Digital Inputs = 0 V or 5.5 V 40 65 200 330 160 110 -67 -67 190 25 95 0.001 85 400 10 1.0 0.001 1.0 NOTES 1 Temperature ranges are as follows: B Version, -40C to +85C. 2 Guaranteed by design, not subject to production test. Specifications subject to change without notice. -2- REV. 0 ADG619/ADG620 SINGLE SUPPLY1 Parameter ANALOG SWITCH Analog Signal Range On Resistance (RON) On Resistance Match Between Channels (RON) On-Resistance Flatness (RFLAT(ON)) LEAKAGE CURRENTS Source OFF Leakage IS (OFF) Channel ON Leakage ID, IS (ON) DIGITAL INPUTS Input High Voltage, VINH Input Low Voltage, VINL Input Current IINL or IINH CIN, Digital Input Capacitance DYNAMIC CHARACTERISTICS2 ADG619 tON tOFF Break-Before-Make Time Delay, tBBM ADG620 tON tOFF Make-Before-Break Time Delay, tMBB Charge Injection Off Isolation Channel-to-Channel Crosstalk Bandwidth -3 dB CS (OFF) CD, CS (ON) POWER REQUIREMENTS IDD (VDD = +5 V 10%, VSS = 0 V, GND = 0 V. All specifications -40 C to +85 C unless otherwise noted.) B Version -40 C to +25 C +85 C 0 V to VDD 7 10 0.8 1 0.5 12.5 1.2 0.5 0.8 Unit V typ max typ max typ max nA typ nA max nA typ nA max V min V max A typ A max pF typ Test Conditions/Comments VDD = 4.5 V, VSS = 0 V VS = 0 V to 4.5 V, IS = -10 mA, Test Circuit 1 VS = 0 V to 4.5 V, IS = -10 mA VS = 1.5 V to 3.3 V, IS = -10 mA VDD = 5.5 V VS = 1 V/4.5 V, VD = 4.5 V/1 V, Test Circuit 2 VS = VD = 1 V/4.5 V, Test Circuit 3 0.01 0.25 0.01 0.25 1 1 2.4 0.8 0.005 0.1 2 VIN = VINL or VINH 120 220 50 75 70 280 110 10 ns typ ns max ns typ ns max ns typ ns min ns typ ns max ns typ ns max ns typ ns min pC typ dB typ dB typ MHz typ pF typ pF typ A typ A max RL = 300 , CL = 35 pF VS = 3.3 V, Test Circuit 4 RL = 300 , CL = 35 pF VS = 3.3 V, Test Circuit 4 RL = 300 , CL = 35 pF, VS1 = VS2 = 3.3 V, Test Circuit 5 RL = 300 , CL = 35 pF VS = 3.3 V, Test Circuit 4 RL = 300 , CL = 35 pF VS = 3.3 V, Test Circuit 4 RL = 300 , CL = 35 pF VS = 3.3 V, Test Circuit 6 VS = 0 V, RS = 0 , CL = 1 nF, Test Circuit 7 RL = 50 , CL = 5 pF, f = 1 MHz, Test Circuit 8 RL = 50 , CL = 5 pF, f = 1 MHz, Test Circuit 10 RL = 50 , CL = 5 pF, Test Circuit 9 f = 1 MHz f = 1 MHz VDD = 5.5 V Digital Inputs = 0 V or 5.5 V 50 85 210 340 170 6 -67 -67 190 25 95 0.001 110 420 10 1.0 NOTES 1 Temperature ranges are as follows: B Version, -40C to +85C. 2 Guaranteed by design, not subject to production test. Specifications subject to change without notice. REV. 0 -3- ADG619/ADG620 ABSOLUTE MAXIMUM RATINGS 1 (TA = 25C unless otherwise noted) PIN CONFIGURATIONS 8-Lead SOT-23 (RT-8) VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 V VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . -0.3 V to +6.5 V VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to -6.5 V Analog Inputs2 . . . . . . . . . . . . . . . . VSS -0.3 V to VDD +0.3 V Digital Inputs2 . . . . . . . . . . . . . . . . . -0.3 V to VDD +0.3 V or 30 mA, Whichever Occurs First Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA (Pulsed at 1 ms, 10% Duty Cycle max) Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . 50 mA Operating Temperature Range Industrial (B Version) . . . . . . . . . . . . . . . -40C to +85C Storage Temperature Range . . . . . . . . . . . . -65C to +150C Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . 150C Micro-SOIC Package JA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 206C/W JC Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 44C/W SOT-23 Package JA Thermal Impedance . . . . . . . . . . . . . . . . . . 229.6C/W JC Thermal Impedance . . . . . . . . . . . . . . . . . . 91.99C/W Lead Temperature, Soldering (10 seconds) . . . . . . . . . 300C IR Reflow, Peak Temperature . . . . . . . . . . . . . . . . . . . 220C NOTES 1 Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time. 2 Overvoltages at IN, S or D will be clamped by internal diodes. Current should be limited to the maximum ratings given. D1 S1 2 GND 3 8 S2 VSS IN ADG619/ ADG620 7 6 TOP VIEW VDD 4 (Not to Scale) 5 NC NC = NO CONNECT 8-Lead Micro-SOIC (RM-8) D1 S1 2 GND 3 8 S2 6 IN TOP VIEW VDD 4 (Not to Scale) 5 NC ADG619/ ADG620 7 VSS NC = NO CONNECT ORDERING GUIDE Model ADG619BRM ADG619BRT ADG620BRM ADG620BRT Temperature Range -40C to +85C -40C to +85C -40C to +85C -40C to +85C Branding Information* SVB SVB SWB SWB Package Description Micro-SOIC (microSmall Outline IC) SOT-23 (Plastic Surface Mount) Micro-SOIC (microSmall Outline IC) SOT-23 (Plastic Surface Mount) Package Option RM-8 RT-8 RM-8 RT-8 *Branding on SOT-23 and Micro-SOIC packages is limited to three characters due to space constraints. CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the ADG619/ADG620 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. WARNING! ESD SENSITIVE DEVICE -4- REV. 0 ADG619/ADG620 TERMINOLOGY Mnemonic V DD VSS GND IDD ISS S D IN RON DRON RFLAT(ON) IS (OFF) ID, IS (ON) VD (VS) VINL VINH IINL(IINH) CS (OFF) CD, CS (ON) tON tOFF tMBB t BBM Charge Injection Crosstalk Off Isolation Bandwidth Insertion Loss Description Most Positive Power Supply Potential Most Negative Power Supply in a Dual Supply Application. In single supply applications, this should be tied to ground at the device. Ground (0 V) Reference Positive Supply Current Negative Supply Current Source Terminal. May be an input or output. Drain Terminal. May be an input or output. Logic Control Input Ohmic Resistance Between D and S On Resistance Match Between Any Two Channels, i.e., RON Max - RON Min. Flatness is Defined as the Difference Between the Maximum and Minimum Value of On Resistance as Measured Over the Specified Analog Signal Range. Source Leakage Current With the Switch "OFF" Channel Leakage Current With the Switch "ON" Analog Voltage on Terminals D, S Maximum Input Voltage for Logic "0" Minimum Input Voltage for Logic "1" Input Current of the Digital Input "OFF" Switch Source Capacitance "ON" Switch Capacitance Delay Between Applying the Digital Control Input and the Output Switching On Delay Between Applying the Digital Control Input and the Output Switching Off "ON" Time, Measured Between the 80% Points of Both Switches, When Switching From One Address State to Another "OFF" Time or "ON" Time Measured Between the 90% Points of Both Switches, When Switching from One Address State to Another A Measure of the Glitch Impulse Transfered From the Digital Input to the Analog Output During Switching A Measure of Unwanted Signal that is Coupled Through From One Channel to Another as a Result of Parasitic Capacitance A Measure of Unwanted Signal Coupling Through an "OFF" Switch The Frequency Response of the "ON" Switch The Loss Due to the ON Resistance of the Switch Typical Performance Characteristics 8 VDD, VSS = 7 6 VDD, VSS = 3V ON RESISTANCE - 18 2.5V 16 14 12 10 8 6 4 VDD = 2.7V VDD = 3V 6 TA = 25 C VSS = 0V 5 TA = +85 C TA = +25 C TA = -40 C 2 1 VDD = +5V VSS = -5V ON RESISTANCE - 5 4 3 2 1 TA = 25 C -3 -2 -1 0 1 VD, VS - V 2 3 4 5 VDD, VSS = VDD, VSS = 4.5V 3.3V VDD, VSS = 5V VDD = 3.3V VDD = 4.5V VDD = 5V ON RESISTANCE - 5 4 3 2 0 0 1 3 2 VD, VS - V 4 0 -5 -4 0 -5 -4 -3 -2 1 -1 0 VD, VS - V 2 3 4 5 TPC 1. On Resistance vs. VD (VS) - Dual Supply TPC 2. On Resistance vs. VD (VS) - Single Supply TPC 3. On Resistance vs. VD (VS) for Different Temperatures - Dual Supply REV. 0 -5- ADG619/ADG620-Typical Performance Characteristics 10 9 LEAKAGE CURRENTS - nA 0.5 0.4 0.3 0.2 0.1 0 -0.1 -0.2 -0.3 -0.4 ID, I S (ON) VDD = +5V VSS = -5V VD = 4.5V VS = 4.5V 0.5 0.4 VDD = 5V VSS = 0V VD = 4.5V/1V VS = 1V/4.5V ID, I S (ON) ON RESISTANCE - 7 6 5 4 3 2 1 0 0 1 VDD = 5V VSS = 0V TA = +85 C TA = +25 C TA = -40 C IS (OFF) LEAKAGE CURRENTS - nA 8 0.3 0.2 0.1 0 -0.1 -0.2 -0.3 -0.4 IS (OFF) 3 2 VD, VS - V 4 5 -0.5 0 10 20 30 40 50 60 TEMPERATURE - C 70 80 0 -0.5 0 10 20 30 40 50 60 TEMPERATURE - C 70 80 0 TPC 4. On Resistance vs. VD (VS) for Different Temperatures - Single Supply TPC 5. Leakage Currents vs. Temperature - Dual Supply TPC 6. Leakage Currents vs. Temperature - Single Supply 250 TA = 25 C 180 160 -10 -20 CHARGE INJECTION - pC 200 VDD VSS 150 +5V -5V TIME - ns 140 120 100 80 60 40 20 tOFF tON VDD VSS 5V 0V VDD VSS +5V -5V ALTERNATION - dB -30 -40 -50 -60 -70 -80 VDD = +5V VSS = -5V TA = 25 C 1 10 FREQUENCY - MHz 100 100 VDD VSS 50 5V 0V VDD VSS -20 5V 0V VDD VSS +5V -5V 80 -90 -100 0.03 0 -5 -4 -3 -2 -1 01 VS - V 2 3 4 5 0 -40 0 20 40 60 TEMPERATURE - C TPC 7. Charge Injection vs. Source Voltage TPC 8. tON/tOFF Times vs. Temperature TPC 9. Off Isolation vs. Frequency -10 -20 ATTENUATION - dB 0 -2 VDD = +5V VSS = -5V TA = 25 C -30 -40 -50 -60 -70 -80 0.2 VDD = +5V VSS = -5V TA = 25 C 1 10 FREQUENCY - MHz 100 ATTENUATION - dB -4 -6 -8 -10 -12 0.2 1 10 100 FREQUENCY - MHz 1000 TPC 10. Crosstalk vs. Frequency TPC 11. On Response vs. Frequency -6- REV. 0 ADG619/ADG620 TEST CIRCUITS IDS V1 S VS D VS IS (OFF) S D VD ID (OFF) ID (ON) NC S D A VD RON = V1/I DS Test Circuit 1. On Resistance VDD VSS 0.1 F VDD VSS S VS IN GND D Test Circuit 2. Off Leakage Test Circuit 3. On Leakage 0.1 F VIN RL 300 VOUT CL 35pF VOUT 50% 90% 50% 90% t ON t OFF Test Circuit 4. Switching Times VDD VSS 0.1 F 0.1 F VDD VSS D S2 IN VIN GND D2 RL2 300 CL2 35pF VOUT VIN 50% 90% 0V 90% 50% VS1 VS2 S1 0V VOUT t BBM t BBM Test Circuit 5. Break-Before-Make Time Delay, tBBM (ADG619 Only) 0.1 F VDD VSS 0.1 F VDD VSS VD IN VIN GND VS1 RL2 300 CL2 35pF RL1 300 CL1 35pF VS1 VIN 0V VS1 80%VD VS2 50% 80%VD 50% t MBB Test Circuit 6. Make-Before-Break Time Delay, tMBB (ADG620 Only) VDD VDD RS VS D VSS VSS S CL 1nF GND VOUT VIN S2 VOUT VOUT QINJ = CL VOUT VOUT IN S1 Test Circuit 7. Charge Injection REV. 0 -7- ADG619/ADG620 VDD 0.1 F VSS 0.1 F NETWORK ANALYZER NETWORK ANALYZER VOUT R 50 0.1 F VDD VSS 0.1 F VDD S IN D VIN GND VSS VDD S1 S2 VSS 50 50 VS VOUT RL 50 D 50 VS IN GND OFF ISOLATION = 20 LOG VOUT VS CHANNEL-TO-CHANNEL CROSSTALK = 20 LOG VOUT VS Test Circuit 8. Off Isolation Test Circuit 10. Channel-to-Channel Crosstalk VDD 0.1 F VSS 0.1 F NETWORK ANALYZER VDD S IN D VIN GND VSS 50 VS VOUT RL 50 INSERTION LOSS = 20 LOG VOUT WITH SWITCH VS WITHOUT SWITCH Test Circuit 9. Bandwidth OUTLINE DIMENSIONS Dimensions shown in inches and (mm). 8-Lead Micro-SOIC Package (RM-8) 0.122 (3.10) 0.114 (2.90) 8-Lead Plastic Surface Mount Package (RT-8) 0.122 (3.10) 0.110 (2.80) 0.122 (3.10) 0.114 (2.90) 1 4 0.199 (5.05) 0.187 (4.75) 8 7 6 5 0.071 (1.80) 0.059 (1.50) 1 2 3 4 PIN 1 0.0256 (0.65) BSC 0.120 (3.05) 0.112 (2.84) 0.006 (0.15) 0.002 (0.05) 0.018 (0.46) SEATING 0.008 (0.20) PLANE 0.043 (1.09) 0.037 (0.94) 0.011 (0.28) 0.003 (0.08) 0.120 (3.05) 0.112 (2.84) 33 27 PIN 1 0.077 (1.95) BSC 0.051 (1.30) 0.035 (0.90) 0.026 (0.65) BSC 0.028 (0.71) 0.016 (0.41) 0.057 (1.45) 0.035 (0.90) 10 0 0.006 (0.15) 0.000 (0.00) 0.015 (0.38) 0.009 (0.22) SEATING PLANE 0.009 (0.23) 0.003 (0.08) 0.022 (0.55) 0.014 (0.35) -8- REV. 0 PRINTED IN U.S.A. 8 5 C02617-.8-10/01(0) R 50 |
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