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Features * * * * * * * * Data Rate up to 50 MHz (2 Outputs at 25 MHz Each) Pixel Size: 10 m x 10 m (10 m Pitch) 300 to 1100 nm Spectral Range High Sensitivity and Lag Free Photodiodes Very Low Noise (30 pJ/cm2 Noise Equivalent Illumination) Antiblooming Exposure Control 20-lead 0.4" DIL Package Description TH7815 linear arrays are based on Atmel's most recent technology in terms of design and performance. The flexibility and performance of these devices provide the opportunity to use them in most vision systems for industrial applications (web inspection, process control, sorting and inspection of various parts), document scanning up to 200 dpi and metrology. 50 MHz 4096 Linear CCDs TH7815ACC Pin Identification All pins must be connected. Pin Number 4, 17 3, 18 5 20 2 14 13 15 10 7 8 11 1, 6, 9, 12, 16, 19 Symbol VDD1,2 VOS1,2 VS VDR VGS L1 L2 R A VA VST P VSS Function Output Amplifiers Drain Supply Video Outputs Output Amplifiers Substate Bias Reset Drain Supply Output Gate Bias Readout Register Clocks Reset Clock Antiblooming Gate Bias/Clock Antiblooming Drain Bias Storage Gate Bias Transfer Gate Clock Ground, Optical Grounding (Internally Connected) VSS VGS VOS1 VDD1 VS VSS VA VST VSS A 1 20 2 19 3 18 4 17 5 16 TH7815ACC 6 15 7 14 8 13 9 12 10 11 VDR VSS VOS2 VDDR VSS R L1 L2 VSSP Rev. 1995A-IMAGE-04/02 1 Absolute Maximum Ratings* Storage Temperature Range ......................... -55C to +150C Operating Temperature Range........................ -40C to +85C Thermal Cycling........................................................ 15C/min Maximum Applied Voltages: * Pins 2, 8, 10, 11, 13, 14, 15 ................................. -0.3 to 15V * Pins 4, 5, 7, 17, 20 .............................................. -0.3 to 16V * Pins 1, 6, 9, 12, 16, 19 ........................................0V (ground) Note: Stresses above those listed under absolute maximum ratings may cause permanent device failure. Functionally at or above these limits is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability. - - Operating range defines the limits within which the functionality is guaranteed. Electrical limits of applied signals are given in operating conditions section. Operating Precautions Shorting the video outputs to any other pin, even temporarily, can permanently damage the on-chip output amplifier. 2 TH7815ACC 1995A-IMAGE-04/02 TH7815ACC Operating Conditions Table 1. DC Characteristics Value Parameter Output Amplifier Drain Supply Storage Gate Bias Antiblooming Gate (See Pixel Saturation Adjustment) Reset Bias Antiblooming Diode Bias Register Output Gate Bias Output Amplifier Source Supply Ground Symbol VDD1, VDD2 VST A VDR VA VGS VS VSS Min. 14.5 2.2 2 13.5 14.5 2.2 Typ. 15 2.4 4 14 15 2.4 0 0 Max. 15.5 2.6 7 14.5 15.5 2.6 Unit V V V V V V V V Table 2. Drive Clocks Characteristics Value Parameter Reset Gate High Level Low Level Transfer Gate High Level Low Level L1, 2 Readout Register Clocks High Level Low Level 8.5 -0.1 9 0 9.5 0.4 V V L1 460 pF 200 pF L2 500 pF Symbol R Min. 8.5 -0.1 Typ. 9 0 9 0 Max. 9.5 0.4 9.5 0.4 Unit V V Remarks Clock Capacitance < 50 pF P 8.5 -0.1 V V Clock Capacitance < 200 pF Maximum Readout Register Frequency FH 10 25 MHz 3 1995A-IMAGE-04/02 Timing Diagrams The following diagram shows the general clocking scheme for TH7815ACC. The line is composed as follows: Number of Prescan Pixels Per Output 4 Number of Useful Pixels Per Output 2048 Total Number of Pixels Per Output 2052 Synopsis TH7815ACC Postscan elements may be added in order to either increase the exposure time, or to provide a voltage reference level. Figure 1. Line Timing Diagram Line Period A P L1 L2 R Transfer Period The following diagram shows the timing for the transfer period: Figure 2. Line Transfer Period > 300 ns > 10 ns A P L1 L2 R (700 ns typ.) > 10 ns first prescan pixel R clock may also be held in high state during line transfer period. 4 TH7815ACC 1995A-IMAGE-04/02 TH7815ACC The following diagram shows the detailed timing for the pixel readout: Figure 3. Pixel Readout Timing Diagram Tpixel 90% L1 tr 10% 90% Duty cycle: 50% 10% Crossover at 50% 10% Rise and fall time 10 ns L2 0 ns R 50% tf 10% 10 ns Rise and fall time 8 ns floating diode level Reset Feedthrough Video outputs are synchronous Video signal occurs on L2 falling edge Offset in darkness Video signal VIDEO OUTPUTS First useful pixel occurs on 5th falling edge of L2 after P Exposure Time Reduction Antiblooming Gate High Level Low Level Pulse Min. The TH7815ACC antiblooming structure provides an electronic shutter capability by clocking phase A during the line period. The timing diagram is described below: A Min. 8.5 2 200 ns Typ. 9 4 Max. 9.5 7 Unit V V Clock Capacitance < 200 pF Low Level Sets Saturation Level See Pixel Saturation Adjustment 5 1995A-IMAGE-04/02 Figure 4. Exposure Time Reduction Line Period High l eve l A P L1 L2 R 100 ns exposure time Low level Transfer Period Electro-optical Performance General test conditions TCASE = 25C Light source: 2854K with 2 mm BG38 filter (unless specified) + F/11 optical aperture. Typical operating conditions: 2 x 10 MHz. All values are referred to prescan pixels level. Value Parameter Saturation Output Voltage Responsivity Responsivity Unbalance Photo Response Non-uniformity Peak-to-peak Dark Signal Dark Signal Non-uniformity (1) Temporal RMS Noise in Darkness Dynamic Range CTF LAG Charge Transfer Inefficiency (Per Stage) Symbol VSAT R Min. 1.3 7.5 Typ. 1.6 8.5 2 Max. 3 Unit V V/J/cm2 Remarks 5 10 0.4 0.1 % % VOS mV/ms mV/ms V VOS = 50 mV to 1.2V PRNU DS DSNU VN DR CTF LAG HCTI 4,300 5 0.1 300 5,300 65 1 8.10-5 % % 6 TH7815ACC 1995A-IMAGE-04/02 TH7815ACC Static and Dynamic Electrical Characteristics Value Parameter Output Amplifier Supply Current Output Impedance DC Output Level Output Conversion Factor Offset In Darkness Reset Feedthrough Symbol IDD ZS VREF CVF DC off Vft 200 Min. Typ. 10 225 10 5 30 400 250 Max Unit mA V V/emV mV Remarks per amplifier Electro-optical Performances Without Infrared Cutoff Filter Parameter The TH7815ACC special semiconductor process enables to exploit the silicon's high near infrared sensitivity while maintaining good imaging performances in terms of response uniformity and resolution. Typical changes in performance with and without OR filtering are summarized below: With IR Cut-off Filter VOS 5% 65% Without IR Cut-off Filter 6 x VOS 5% 40% Average Video Signal Due to a Given Scene Illumination PRNU (Single Defects Excluded) CTF at Nyquist Frequency Pixel Saturation Adjustment TH7815ACC antiblooming structure can be used to adjust the maximum saturation voltage, by adjusting the A bias voltage. The following curve shows the relationship between VSAT and VA. Figure 5. Pixel Saturation Antiblooming Bias (Typical conditions) Typical conditions 3 Saturation Voltage 2 (V) 1 0 2 3 4 (V) 5 6 7 Antiblooming Bias 7 1995A-IMAGE-04/02 Spectral Responsivity The following curve shows the typical spectral responsivity for TH7815ACC: 12 10 Responsivity (V/J/cm) 8 6 4 2 0 200 300 400 500 600 700 800 900 1000 1100 Wavelength (nm) Packaging Drawing 49.00.1 1st pixel 9.50.1 Ztop Zbot 5.1 0.1 4.5 0.1 Dimensions in mm mechanical Ztop Zbot 1.9 20.32 2 .720.25 optical 1 .610.25 3.030.28 Ordering Code TH7815ACC 8 TH7815ACC 1995A-IMAGE-04/02 Atmel Headquarters Corporate Headquarters 2325 Orchard Parkway San Jose, CA 95131 TEL 1(408) 441-0311 FAX 1(408) 487-2600 Atmel Operations Memory 2325 Orchard Parkway San Jose, CA 95131 TEL 1(408) 441-0311 FAX 1(408) 436-4314 RF/Automotive Theresienstrasse 2 Postfach 3535 74025 Heilbronn, Germany TEL (49) 71-31-67-0 FAX (49) 71-31-67-2340 1150 East Cheyenne Mtn. Blvd. Colorado Springs, CO 80906 TEL 1(719) 576-3300 FAX 1(719) 540-1759 Europe Atmel Sarl Route des Arsenaux 41 Case Postale 80 CH-1705 Fribourg Switzerland TEL (41) 26-426-5555 FAX (41) 26-426-5500 Microcontrollers 2325 Orchard Parkway San Jose, CA 95131 TEL 1(408) 441-0311 FAX 1(408) 436-4314 La Chantrerie BP 70602 44306 Nantes Cedex 3, France TEL (33) 2-40-18-18-18 FAX (33) 2-40-18-19-60 Asia Room 1219 Chinachem Golden Plaza 77 Mody Road Tsimhatsui East Kowloon Hong Kong TEL (852) 2721-9778 FAX (852) 2722-1369 Biometrics/Imaging/Hi-Rel MPU/ High Speed Converters/RF Datacom Avenue de Rochepleine BP 123 38521 Saint-Egreve Cedex, France TEL (33) 4-76-58-30-00 FAX (33) 4-76-58-34-80 ASIC/ASSP/Smart Cards Zone Industrielle 13106 Rousset Cedex, France TEL (33) 4-42-53-60-00 FAX (33) 4-42-53-60-01 1150 East Cheyenne Mtn. Blvd. Colorado Springs, CO 80906 TEL 1(719) 576-3300 FAX 1(719) 540-1759 Scottish Enterprise Technology Park Maxwell Building East Kilbride G75 0QR, Scotland TEL (44) 1355-803-000 FAX (44) 1355-242-743 Japan 9F, Tonetsu Shinkawa Bldg. 1-24-8 Shinkawa Chuo-ku, Tokyo 104-0033 Japan TEL (81) 3-3523-3551 FAX (81) 3-3523-7581 literature@atmel.com Web Site http://www.atmel.com (c) Atmel Corporation 2002. Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company's standard warranty which is detailed in Atmel's Terms and Conditions located on the Company's web site. The Company assumes no responsibility for any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel's products are not authorized for use as critical components in life support devices or systems. ATMEL (R) is the registered trademarks of Atmel. Other terms and product names may be the trademarks of others. Printed on recycled paper. 1995A-IMAGE-04/02 0M |
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