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1N3768 2309NZ 2409S TR711 P010033 BB510 1N3768 10023
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 Silicon N Channel MOS FET Triode
Preliminary Data
q q
BF 543
For RF stages up to 300 MHz preferably in FM applications IDSS = 4 mA, gfs = 12 mS
ESD: Electrostatic discharge sensitive device, observe handling precautions! Type BF 543 Marking LDs Ordering Code (tape and reel) Q62702-F1372 Pin Configuration 1 2 3 G D S Package1) SOT-23
Maximum Ratings Parameter Drain-source voltage Drain current Gate-source peak current Total power dissipation, TA 60 C Storage temperature range Channel temperature Ambient temperature range Thermal Resistance Junction - ambient2) Rth JA
Symbol VDS ID
IGSM
Values 20 30 10 200 150 - 55 ... + 150
Unit V mA mW
Ptot Tstg Tch TA
- 55 ... + 150 C
450
K/W
1) 2)
For detailed information see chapter Package Outlines. Package mounted on alumina 15 mm x 16.7 mm x 0.7 mm.
Semiconductor Group
1
07.94
BF 543
Electrical Characteristics at TA = 25 C, unless otherwise specified. Parameter Symbol min. DC Characteristics Drain-source breakdown voltage ID = 10 A, - VGS = 4 V Gate-source breakdown voltage IGS = 10 mA, VDS = 0
Values typ. max.
Unit
V(BR)DS
V(BR)GSS IGSS
20 7 - 2.0 -
- - - 4 0.7
- 12 50 6.0 1.5
V
Gate cutoff current VGS = 6 V, VDS = 0
nA mA V
Drain current VDS = 10 V, VGS = 0 Gate-source pinch-off voltage VDS = 10 V, ID = 20 A AC Characteristics Forward transconductance VDS = 10 V, ID = 4 mA, f = 1 kHz Gate-1 input capacitance VDS = 10 V, ID = 4 mA, f = 1 MHz Reverse transfer capacitance VDS = 10 V, ID = 4 mA, f = 1 MHz Output capacitance VDS = 10 V, ID = 4 mA, f = 1 MHz Power gain (test circuit) VDS = 10 V, ID = 4 mA, f = 200 MHz GG = 2 mS, GL = 0.5 mS Noise figure (test circuit) VDS = 10 V, ID = 4 mA, f = 200 MHz GG = 2 mS, GL = 0.5 mS
IDSS - VGS(p)
gfs Cgss Cdg Cdss Gp
9.5 - - - -
12 2.7 18 0.9 22
- - - - -
mS pF fF pF dB
F
-
1
-
Semiconductor Group
2
BF 543
Total power dissipation Ptot = f (TA)
Typ. output characteristics ID = f (VDS)
Gate transconductance gfs = f (VGS) VDS = 10 V, IDSS = 4 mA, f = 1 kHz
Drain current ID = f (VGS) VDS = 10 V
Semiconductor Group
3
BF 543
Gate input capacitance Cgss = f (VGS) VDS = 10 V, IDSS = 4 mA, f = 1 MHz
Output capacitance Cdss = f (VDS) VGS = 0, IDSS = 4 mA, f = 1 MHz
Reverse transfer capacitance Cdg = f (VDS) VGS = 0, IDSS = 4 mA, f = 1 MHz
Gate 1 input admittance y11s VDS = 10 V, IDSS = 4 mA, VGS = 0 (source circuit)
Semiconductor Group
4
BF 543
Gate 1 transconductance y21s VDS = 10 V, IDSS = 4 mA, VGS = 0 (source circuit)
Output admittance y22s VDS = 10 V, IDSS = 10 mA, VGS = 0 (source circuit)
Test circuit for power gain Gp and noise figure F f= 200 MHz, GG = 2 mS, GL = 0.5 mS
Semiconductor Group
5


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