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| a 1 pC Charge Injection, 100 pA Leakage CMOS 5 V/5 V/3 V 4-Channel Multiplexer ADG604 FUNCTIONAL BLOCK DIAGRAM ADG604 S1 4 S2 5 6 FEATURES 1 pC Charge Injection (Over the Full Signal Range) 2.7 V to 5.5 V Dual Supply 2.7 V to 5.5 V Single Supply Automotive Temperature Range: -40 C to +125 C 100 pA Max @ 25 C Leakage Currents 85 Typ On Resistance Rail-to-Rail Operation Fast Switching Times Typical Power Consumption (<0.1 W) TTL/CMOS Compatible Inputs 14-Lead TSSOP Package APPLICATIONS Automatic Test Equipment Data Acquisition Systems Battery-Powered Instruments Communication Systems Sample and Hold Systems Remote-Powered Equipment Audio and Video Signal Routing Relay Replacement Avionics D S3 11 S4 10 1 OF 4 DECODER 1 14 2 A0 A1 EN GENERAL DESCRIPTION PRODUCT HIGHLIGHTS The ADG604 is a CMOS analog multiplexer, comprising four single channels. It operates from a dual supply of 2.7 V to 5.5 V, or from a single supply of 2.7 V to 5.5 V. The ADG604 switches one of four inputs to a common output, D, as determined by the 3-bit binary address lines, A0, A1, and EN. A Logic "0" on the EN pin disables the device. The ADG604 offers ultralow charge injection of 1.5 pC over the entire signal range and leakage currents of 10 pA typical at 25C. It offers on resistance of 85 typ, which is matched to within 2 between channels. The ADG604 also has low power dissipation yet gives high switching speeds. The ADG604 is available in a 14-lead TSSOP package. 1. Ultralow Charge Injection (Q INJ: 1.5 pC Typ over the Full Signal Range) 2. Leakage Current <0.5 nA max @ 85C 3. Dual 2.7 V to 5.5 V or Single 2.7 V to 5.5 V Supply 4. Fully Specified to 125C 5. Small 14-Lead TSSOP Package REV. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 (c) Analog Devices, Inc., 2002 ADG604-SPECIFICATIONS DUAL SUPPLY1 Parameter ANALOG SWITCH Analog Signal Range On Resistance (RON) On Resistance Match Between Channels ( RON) On-Resistance Flatness (RFLAT(ON)) LEAKAGE CURRENTS Source OFF Leakage IS (OFF) Drain OFF Leakage ID (OFF) Channel ON Leakage ID, IS (ON) DIGITAL INPUTS Input High Voltage, VINH Input Low Voltage, VINL Input Current IINL or IINH CIN, Digital Input Capacitance DYNAMIC CHARACTERISTICS Transition Time tON Enable tOFF Enable Break-Before-Make Time Delay, tBBM Charge Injection Off Isolation Channel-to-Channel Crosstalk Bandwidth -3 dB CS (OFF) CD (OFF) CD, CS (ON) POWER REQUIREMENTS IDD Iss 2 (VDD = +5 V 10%, VSS = -5 V 25 C 10%, GND = 0 V. All specifications -40 C to +125 C unless otherwise noted.) -40 C to +85 C -40 C to +125 C VSS to VDD Unit V Typ Max Typ Max Typ Max nA Typ nA Max nA Typ nA Max nA Typ nA Max V Min V Max A Typ A Max pF Typ ns Typ ns Max ns Typ ns Max ns Typ ns Max ns Typ ns Min pC Typ dB Typ dB Typ MHz Typ pF Typ pF Typ pF Typ A Typ A Max A Typ A Max VIN = VINL or VINH VDD = +4.5 V, VSS = -4.5 V VS = 3 V, IS = -1 mA, Test Circuit 1 VS = 3 V, IS = -1 mA VS = 3 V, IS = -1 mA VDD = +5.5 V, VSS = -5.5 V VS = 4.5 V, VD = 4.5 V, Test Circuit 2 VS = 4.5 V, VD = 4.5 V, Test Circuit 2 VS = VD = 4.5 V, Test Circuit 3 Test Conditions/Comments 85 115 2 4 25 40 0.01 0.1 0.01 0.1 0.01 0.1 140 160 5.5 55 6.5 60 0.25 0.5 0.5 4 8 10 2.4 0.8 0.005 0.1 2 70 100 80 105 30 45 20 -1 -75 -70 280 5 17 18 0.001 1.0 0.001 1.0 120 130 55 150 150 65 10 VS1 = +3 V, VS4 = -3 V, RL = 300 , CL = 35 pF, Test Circuit 4 RL = 300 , CL = 35 pF VS = 3 V, Test Circuit 6 RL = 300 , CL = 35 pF VS = 3 V, Test Circuit 6 RL = 300 , CL = 35 pF, VS1 = VS2 = 3 V, Test Circuit 5 VS = 0 V, RS = 0 , CL = 1nF, Test Circuit 7 RL = 50 , CL = 5 pF, f = 10 MHz, Test Circuit 8 RL = 50 , CL = 5 pF, f = 10 MHz, Test Circuit 10 RL = 50 , CL = 5 pF, Test Circuit 9 f = 1 MHz f = 1 MHz f = 1 MHz VDD = +5.5 V, VSS = -5.5 V Digital Inputs = 0 V or 5.5 V Digital Inputs = 0 V or 5.5 V NOTES 1 Y Version Temperature Range: -40C to +125C 2 Guaranteed by design, not subject to production test. Specifications subject to change without notice. -2- REV. 0 ADG604 SINGLE SUPPLY1 (V Parameter ANALOG SWITCH Analog Signal Range On Resistance (RON) On Resistance Match Between Channels ( RON) LEAKAGE CURRENTS Source OFF Leakage IS (OFF) Drain OFF Leakage ID (OFF) Channel ON Leakage ID, IS (ON) DIGITAL INPUTS Input High Voltage, VINH Input Low Voltage, VINL Input Current IINL or IINH CIN, Digital Input Capacitance DYNAMIC CHARACTERISTICS Transition Time tON Enable tOFF Enable Break-Before-Make Time Delay, tBBM Charge Injection Off Isolation Channel-to-Channel Crosstalk Bandwidth -3 dB CS (OFF) CD (OFF) CD, CS (ON) POWER REQUIREMENTS IDD 0.001 1.0 NOTES 1 Y Version Temperature Range: -40C to +125C 2 Guaranteed by design, not subject to production test. Specifications subject to change without notice. 2 DD =5V 10%, VSS = 0 V, GND = 0 V. All specifications -40 C to +125 C unless otherwise noted.) 25 C -40 C to +85 C -40 C to +125 C 0 V to VDD 210 290 3 12 0.01 0.1 0.01 0.1 0.01 0.1 13 350 380 Unit V Typ Max Typ Max nA Typ nA Max nA Typ nA Max nA Typ nA Max V Min V Max A Typ A Max pF Typ ns Typ ns Max ns Typ ns Max ns Typ ns Max ns Typ ns Min pC Typ dB Typ dB Typ MHz Typ pF Typ pF Typ pF Typ VIN = VINL or VINH VDD = 4.5 V, VSS = 0 V VS = 3.5 V, IS = -1 mA, Test Circuit 1 VS = 3.5 V, IS = -1 mA VDD = 5.5 V VS = 1 V/4.5 V, VD = 4.5 V/1 V, Test Circuit 2 VS = 1 V/4.5 V, VD = 4.5 V/1 V, Test Circuit 2 VS = VD = 4.5 V/1 V, Test Circuit 3 Test Conditions/Comments 0.25 0.5 0.5 4 8 10 2.4 0.8 0.005 0.1 2 90 150 105 150 45 70 30 0.3 -65 -70 250 5 17 18 185 190 80 210 220 90 10 VS1 = 3 V, VS4 = 0 V, RL = 300 , CL = 35 pF, Test Circuit 4 RL = 300 , CL = 35 pF VS = 3 V, Test Circuit 6 RL = 300 , CL = 35 pF VS = 3 V, Test Circuit 6 RL = 300 , CL = 35 pF, VS1 = VS2 = 3 V, Test Circuit 5 VS = 0 V , RS = 0 , CL = 1 nF, Test Circuit 7 RL = 50 , CL = 5 pF, f = 10 MHz, Test Circuit 8 RL = 50 , CL = 5 pF, f = 10 MHz, Test Circuit 10 RL = 50 , CL = 5 pF, Test Circuit 9 f = 1 MHz f = 1 MHz f = 1 MHz VDD = 5.5 V Digital Inputs = 0 V or 5.5 V A Typ A Max REV. 0 -3- ADG604-SPECIFICATIONS SINGLE SUPPLY1 Parameter ANALOG SWITCH Analog Signal Range On Resistance (RON) On Resistance Match Between Channels ( RON) LEAKAGE CURRENTS Source OFF Leakage IS (OFF) Drain OFF Leakage ID (OFF) Channel ON Leakage ID, IS (ON) DIGITAL INPUTS Input High Voltage, VINH Input Low Voltage, VINL Input Current IINL or IINH CIN, Digital Input Capacitance DYNAMIC CHARACTERISTICS Transition Time tON Enable tOFF Enable Break-Before-Make Time Delay, tBBM Charge Injection Off Isolation Channel-to-Channel Crosstalk Bandwidth -3 dB CS (OFF) CD (OFF) CD, CS (ON) POWER REQUIREMENTS IDD 0.001 1.0 NOTES 1 Y Version Temperature Range: -40C to +125C 2 Guaranteed by design, not subject to production test. Specifications subject to change without notice. 2 (VDD = 3 V 10%, VSS = 0 V, GND = 0 V. All specifications -40 C to +125 C unless otherwise noted.) 25 C -40 C to +85 C -40 C to +125 C 0 V to VDD 380 420 460 Unit V Typ Typ nA Typ nA Max nA Typ nA Max nA Typ nA Max V Min V Max A Typ A Max pF Typ ns Typ ns Max ns Typ ns Max ns Typ ns Max ns Typ ns Min pC Typ dB Typ dB Typ MHz Typ pF Typ pF Typ pF Typ VIN = VINL or VINH VDD = 2.7 V, VSS = 0 V VS = 1.5 V, IS = -1 mA, Test Circuit 1 VS = 1.5 V, IS = -1 mA VDD = 3.3 V VS = 1 V/3 V, VD = 3 V/1 V, Test Circuit 2 VS = 1 V/3 V, VD = 3 V/1 V, Test Circuit 2 VS = VD = 1 V/3 V, Test Circuit 3 Test Conditions/Comments 5 0.01 0.1 0.01 0.1 0.01 0.1 0.25 0.5 0.5 4 8 10 2.0 0.8 0.005 0.1 2 170 320 180 250 100 160 100 0.3 -65 70 250 5 17 18 390 265 205 450 390 225 10 VS1 = 2 V, VS4 = 0 V, RL = 300 , CL = 35 pF, Test Circuit 4 RL = 300 , CL = 35 pF VS = 2 V, Test Circuit 6 RL = 300 , CL = 35 pF VS = 2 V, Test Circuit 6 RL = 300 , CL = 35 pF, VS1 = VS2 = 2 V, Test Circuit 5 VS = 0 V to 3.3 V, RS = 0 , CL = 1 F, Test Circuit 7 RL = 50 , CL = 5 pF, f = 10 MHz, Test Circuit 8 RL = 50 , CL = 5 pF, f = 10 MHz, Test Circuit 10 RL = 50 , CL = 5 pF, Test Circuit 9 f = 1 MHz f = 1 MHz f = 1 MHz VDD = 3.3 V Digital Inputs = 0 V or 3.3 V A Typ A Max -4- REV. 0 ADG604 ABSOLUTE MAXIMUM RATINGS 1 (TA = 25C unless otherwise noted) VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 V VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . -0.3 V to +6.5 V VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to -6.5 V Analog Inputs2 . . . . . . . . . . . . . . . . VSS -0.3 V to VDD + 0.3 V Digital Inputs2 . . . . . . . . . . . . . . . . . -0.3 V to VDD + 0.3 V or . . . . . . . . . . . . . . . . . . . . . . 30 mA, Whichever Occurs First Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA (Pulsed at 1 ms, 10% Duty Cycle Max) Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . 10 mA Operating Temperature Range Automotive (Y Version) . . . . . . . . . . . . . . -40C to +125C Storage Temperature Range . . . . . . . . . . . . -65C to +150C Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . 150C TSSOP Package JA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 150C/W JC Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 27C/W Lead Temperature, Soldering (10 seconds) . . . . . . . . . 300C IR Reflow, Peak Temperature . . . . . . . . . . . . . . . . . 220C NOTES 1 Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time. 2 Overvoltages at EN, A0, A1, S, or D will be clamped by internal diodes. Current should be limited to the maximum ratings given. ORDERING GUIDE Model Option ADG604YRU Temperature Range -40C to +125C Package Description Thin Shrink Small Outline (TSSOP) Package RU-14 PIN CONFIGURATION Table I. Truth Table A1 A0 1 EN 2 VSS 3 14 A1 13 GND A0 X 0 1 0 1 EN 0 1 1 1 1 ON Switch None 1 2 3 4 12 VDD TOP VIEW S1 4 (Not To Scale) 11 S3 ADG604 S2 5 D6 NC 7 10 S4 9 8 X 0 0 1 1 NC NC NC = NO CONNECT CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the ADG604 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. WARNING! ESD SENSITIVE DEVICE REV. 0 -5- ADG604 TERMINOLOGY VDD VSS GND IDD ISS S D RON RON RFLAT(ON) IS (OFF) ID (OFF) ID, IS (ON) V D , VS VINL VINH IINL (IINH) CS (OFF) CD (OFF) CD, CS (ON) CIN tON (EN) tOFF (EN) tTRANSITION tBBM Charge Injection Crosstalk Off Isolation Bandwidth Insertion Loss Most Positive Power Supply Potential Most Negative Power Supply in a Dual Supply Application. In single supply applications, this should be tied to ground at the device. Ground (0 V) Reference Positive Supply Current Negative Supply Current Source Terminal. May be an input or output. Drain Terminal. May be an input or output. Ohmic Resistance between D and S On Resistance Match between any two channels, i.e., RON Max - RON Min Flatness is defined as the difference between the maximum and minimum value of On resistance as measured over the specified analog signal range. Source Leakage Current with the Switch "OFF" Drain Leakage Current with the Switch "OFF" Channel Leakage Current with the Switch "ON" Analog Voltage on Terminals D, S Maximum Input Voltage for Logic "0" Minimum Input Voltage for Logic "1" Input Current of the Digital Input Channel Input Capacitance for "OFF" Condition Channel Output Capacitance for "OFF" Condition "On" Switch Capacitance Digital Input Capacitance Delay time between the 50% and 90% points of the digital input and switch "ON" condition. Delay time between the 50% and 90% points of the digital input and switch "OFF" condition. Delay time between the 50% and 90% points of the digital input and switch "ON" condition when switching from one address state to another. "OFF" time or "ON" time measured between the 80% points of both switches, when switching from one address state to another. A measure of the glitch impulse transferred from the digital input to the analog output during switching. A measure of unwanted signal that is coupled through from one channel to another as a result of parasitic capacitance. A measure of unwanted signal coupling through an "On" switch. Frequency Response of the "On" Switch Loss Due to the On Resistance of the Switch -6- REV. 0 Typical Performance Characteristics-ADG604 250 TA = 25 C VDD , V SS = 200 VDD , V SS = ON RESISTANCE - 350 VDD = 5V VSS = 0V 300 250 ON RESISTANCE - 2.5V 3V VDD , V SS = 150 3.3V TA = +125 C 200 TA = +85 C 150 100 50 0 0.0 TA = +25 C TA = -40 C 0.5 1.0 1.5 2.0 2.5 3.0 VD, VS - V 3.5 4.0 4.5 5.0 100 50 VDD , V SS = 0 -5 -4 -3 -2 -1 0 VD, VS - V 1 2 VDD , V SS = 5V 3 4 4.5V 5 TPC 1. On Resistance vs. VD (VS), Dual Supply TPC 4. On Resistance vs. VD (VS) for Different Temperatures, Single Supply 500 VDD = 2.7V 450 400 350 ON RESISTANCE - 3 TA = 25 C VSS = 0V 2 1 CURRENT - nA VDD = +5V VSS = -5V ID (OFF) IS (OFF) 0 -1 ID, IS (ON) -2 -3 -4 300 250 200 VDD = 4.5V 150 100 50 0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 VD, VS - V 3.5 4.0 4.5 5.0 VDD = 3V VDD = 3.3V VDD = 5V -5 -6 0 20 40 60 80 TEMPERATURE - C 100 120 TPC 2. On Resistance vs. VD (VS), Single Supply TPC 5. Leakage Currents vs. Temperature, Dual Supply 180 160 140 TA = +125 C VDD = +5V VSS = -5V 3 2 1 CURRENT - nA VDD = 5V VSS = 0V IS (OFF) ON RESISTANCE - 120 100 80 60 40 TA = +25 C 20 0 -5 TA = -40 C TA = +85 C 0 -1 ID (OFF) -2 -3 ID, IS (ON) -4 -5 -6 0 20 40 60 80 TEMPERATURE - C 100 120 -4 -3 -2 -1 0 1 VD, VS - V 2 3 4 5 TPC 3. On Resistance vs. VD (VS) for Different Temperatures, Dual Supply TPC 6. Leakage Currents vs. Temperature, Single Supply REV. 0 -7- ADG604 1.0 TA = 25 C -10 0 TA = 25 C 0.5 CHARGE INJECTION - pC -20 0 VDD = 3V VSS = 0V ATTENUATION - dB -30 -40 -50 -60 -70 -80 VDD = +5V VSS = -5V VDD = +5V VSS = 0V -0.5 VDD = +5V VSS = 0V -1.0 VDD = +5V VSS = -5V -1.5 -2.0 -5 -4 -3 -2 -1 0 VS - V 1 2 3 4 5 -90 0.3 1 10 100 FREQUENCY - MHz 1000 TPC 7. Charge Injection vs. Source Voltage TPC 10. Crosstalk vs. Frequency 160 140 120 100 TIME - ns 0 TA = 25 C -2 -4 ATTENUATION - dB VDD = 5V VSS = 0V VDD = +5V VSS = -5V -6 -8 -10 -12 -14 VDD = +5V VSS = 0V tON 80 60 40 20 0 -40 VDD = 5V VSS = 0V VDD = +5V VSS = -5V tOFF VDD = +5V VSS = -5V -20 0 20 40 60 80 100 120 -16 -18 0.3 1 TEMPERATURE - C 10 100 FREQUENCY - MHz 1000 TPC 8. tON/tOFF Times vs. Temperature TPC 11. On Response vs. Frequency 0 TA = 25 C -10 -20 ATTENUATION - dB -30 -40 -50 -60 -70 -80 -90 0.3 VDD = +5V VSS = 0V VDD = +5V VSS = -5V 1 10 100 FREQUENCY - MHz 1000 TPC 9. Off Isolation vs. Frequency -8- REV. 0 ADG604 Test Circuits IDS V1 S VS D VS IS (OFF) A S D ID (OFF) A VD ID (ON) NC S D A VD RON = V1/IDS Test Circuit 1. On Resistance VDD 0.1 F Test Circuit 2. Off Leakage Test Circuit 3. On Leakage VSS 0.1 F ADDRESS DRIVE (VIN) S1 S2 S3 S4 VS1 3V 50% 0V 50% VDD A1 A0 VSS VS VS2 VOUT VOUT 90% 90% D +2.4V EN GND RL 300 CL 35pF tTRANSITION tTRANSITION Test Circuit 4. Switching Time of Multiplexer, tTRANSITION VDD 0.1 F VSS 0.1 F VDD A1 A0 VSS S1 S2 S3 S4 VS ADDRESS DRIVE (VIN) 3V 0V VS 50 D +2.4V EN GND RL 300 CL 35pF VOUT VOUT 80% 80% tBBM Test Circuit 5. Break-Before-Make Delay, tBBM VDD 0.1 F VSS 0.1 F 3V 50% 0V 50% VDD A1 A0 VSS S1 S2 S3 S4 VS ENABLE DRIVE (VIN) V0 OUTPUT 0V VOUT RL 300 CL 35pF 0.9V0 0.9V0 EN VS 50 GND D tON(EN) tOFF(EN) Test Circuit 6. Enable Delay, tON (EN), tOFF (EN) REV. 0 -9- ADG604 VDD VSS VOUT VDD RS VS DECODER GND SW OFF CL S VSS D CL 1nF VOUT VIN QINJ = CL VOUT VOUT SW OFF SW ON SW ON SW ON SW OFF A1 A2 EN VIN SW OFF CHARGE INJECTION = VOUT Test Circuit 7. Charge Injection VDD 0.1 F VSS 0.1 F NETWORK ANALYZER NETWORK ANALYZER VOUT VS VOUT 50 VS GND 0.1 F VDD VSS 0.1 F VDD S VSS VDD S1 VSS 50 D 50 RL 50 S2 D R 50 GND RL 50 OFF ISOLATION = 20 LOG VOUT VS CHANNEL-TO-CHANNEL CROSSTALK = 20 LOG VOUT VS Test Circuit 8. Off Isolation VDD 0.1 F VSS 0.1 F NETWORK ANALYZER Test Circuit 10. Channel-to-Channel Crosstalk VDD S VSS 50 VS D RL 50 VOUT GND INSERTION LOSS = 20 LOG VOUT WITH SWITCH VOUT WITHOUT SWITCH Test Circuit 9. Bandwidth -10- REV. 0 ADG604 OUTLINE DIMENSIONS Dimensions shown in inches and (mm). 14-Lead TSSOP Package (RU-14) 0.201 (5.10) 0.193 (4.90) 14 8 0.177 (4.50) 0.169 (4.30) 0.256 (6.50) 0.246 (6.25) 1 7 PIN 1 0.006 (0.15) 0.002 (0.05) 0.0433 (1.10) MAX SEATING PLANE 0.0256 (0.65) BSC 0.0118 (0.30) 0.0075 (0.19) 0.0079 (0.20) 0.0035 (0.090) 8 0 0.028 (0.70) 0.020 (0.50) REV. 0 -11- -12- C02752-0-2/02(0) PRINTED IN U.S.A. |
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