PART |
Description |
Maker |
NRC02ZO NRC04J560TRF NRC04J151TRF NRC01 NRC06F1002 |
Thick Film Chip Resistors METAL GLAZED THICK FILM ON HIGH PURITY ALUMINA SUBSTRATE ..(CERMET) PROVIDES UNIFORM QUALITY AND HIGH RELIABILITY
|
List of Unclassifed Manufacturers NIC-Components Corp. List of Unclassifed Man...
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TMP91C824F TMP91CU10F TMP91C829F TMP91CW11F TMP93P |
CABLE 32-Bit Microcontroller Quality And Reliability Assurance / Handling Precautions 质量与可靠性保操作注意事项
|
Toshiba Corporation Toshiba, Corp.
|
E909-11 |
Far reaching, stable proximity detection and an ALS input enables highly improved quality for well known features. Proven optical reliability
|
ELMOS Semiconductor AG
|
1406261 |
This change is considered a minor change which does not affect form, fit, function, quality, or reliability.
|
Silicon Laboratories
|
1406262 |
This change is considered a minor change which does not affect form, fit, function, quality, or reliability.
|
Silicon Laboratories
|
XQV1000 XQC100-4CG560M XQC1000-4CG560M XQC300-4CG5 |
QPro Virtex 2.5V QML high-reliability FPGA. SMD number 5962-9957201NNA. QPro Virtex 2.5V QML High-Reliability FPGAs FPGA, 1536 CLBS, 322970 GATES, PBGA352 QPro Virtex 2.5V QML High-Reliability FPGAs FPGA, 661111 GATES, PBGA432 QPro Virtex 2.5V QML High-Reliability FPGAs QPro的Virtex 2.5V的QML第高可靠性的FPGA QPro Virtex 2.5V QML high-reliability FPGA. SMD number 5962-9957301NUA QPro Virtex 2.5V QML high-reliability FPGA. SMD number 5962-9957201NUA.
|
Xilinx, Inc.
|
ERO25THD1002 EROS2THD1002 ERO-S2PHF3301 EROS2C ERO |
Metal Film Resistors Performance, Reliability Low T.C.R. and noise, high reliability
|
Panasonic Semiconductor
|
1609012 EFR32BG1B132F128GM48-C0R EFR32BG1B132F128G |
This change is considered a minor change which does not affect form, fit, function, quality, or reliability.
|
Silicon Laboratories
|
EC10P16/20 |
HIGH POWER 125W HIGH QUALITY AUDIO AMPLIFIER APPLICATIONS
|
ETC
|
CX24302 |
High-Quality MPEG Decoder
|
Conexant Systems
|
MAX64180CXO |
High-Quality Video and Audio Encoding
|
Maxim Integrated Produc...
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