| PART |
Description |
Maker |
| AD5522 AD552208 |
Quad Parametric Measurement Unit with Integrated 16-Bit Level Setting DACs
|
Analog Devices
|
| E4287AHFT |
Dual Channel Per-Pin Parametric Measurement Unit
|
Semtech Corporation
|
| AD1382 AD1392KD AD1392 AD1382KD AD1382TD AD1382TD8 |
16-Bit 500 kHz Sampling ADC
18V; 900mW; 16-bit 500kHz sampling ADC. For medical imaging, CAT, magnetic resonance, vibration analysis, parametric measurement unit (ATE)
|
Analog Devices, Inc.
AD[Analog Devices]
|
| EVM4707BBG EDGE4707B |
Quad Channel Per-Pin Precision Measurement Unit
|
Semtech Corporation
|
| TLP592A |
Telecommunications Measurement and Control Equipment Data Acquisition System Measurement Equipment
|
Toshiba Semiconductor
|
| TLP222A-2F TLP222AF |
Telecommunications Measurement and Control Equipment Data Acquisition System Measurement Equipment
|
Toshiba Corporation
Toshiba Semiconductor
|
| N9201A |
Array Structure Parametric Test Option
|
Agilent(Hewlett-Packard...
|
| ML925J11F ML920AA11S ML920J11S ML920L11S ML925AA11 |
Notice : Some parametric limits are subject to change InGaAsP DFB LASER DIODES 请注意：某些参数的限制可能会有所变化InGaAsP的DFB激光器
|
Mitsubishi Electric, Corp.
Mitsubishi Electric Corporation
MITSUBISHI[Mitsubishi Electric Semiconductor]
|
| 1N750A |
Online technical data and parametric search
|
Central Semiconductor C...
|
| TLP313107 TLP3131 |
MEASUREMENT INSTRUMENTS
|
Toshiba Semiconductor
|
| TLP3220 |
Measurement Instrument
|
Toshiba Semiconductor
|
