| PART |
Description |
Maker |
| 6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 |
Test Clip To Multi-Stacking Banana Plug Test Lead
|
Pomona Electronics
|
| 4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
| 50PA-393 |
HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
| 50PA-420 |
LC HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
| 50PA-560 |
HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
| SG5010 |
Programmable Audio Test System
|
TeGam
|
| MC33390 ON1047 |
Class B Serlal Llnk Transceiver
J-1850 SERIAL LINK TRANSCEIVER
From old datasheet system
|
Motorola
ON Semi
|
| 4082F |
Flash Memory Cell Parametric Test System
|
Keysight Technologies
|
| 74F646B 74F646 74F648 74F646BSCX 74F646MSAX |
Single 8-bit Bus Transceiver 位总线收发
From old datasheet system
Octal Transceiver/Register with 3-STATE Outputs
|
Fairchild Semiconductor, Corp.
|
| MTC24 74LCX652 74LCX652MSA 74LCX652MTC 74LCX652WM |
Single 8-bit Bus Transceiver
From old datasheet system
Low Voltage Transceiver/Register with 5V Tolerant Inputs and Outputs
|
FAIRCHILD[Fairchild Semiconductor]
|
| DK-17600-A1 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
| DK-21169 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
