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ST75C540 - SUPER INTEGRATED DEVICES WITH DSP, AFE & MEMORIES FOR TELEPHONY, MODEM, FAX OVER INTERNET & POTS LINES SUPER INTEGRATED DEVICESWITH DSP, AFE & MEMORIES FORTELEPHONY,MODEM, FAXOVERINTERNET& POTSLINES

ST75C540_1358104.PDF Datasheet

 
Part No. ST75C540 ST75C530FP-A ST75C540FP-A
Description SUPER INTEGRATED DEVICES WITH DSP, AFE & MEMORIES FOR TELEPHONY, MODEM, FAX OVER INTERNET & POTS LINES
SUPER INTEGRATED DEVICESWITH DSP, AFE & MEMORIES FORTELEPHONY,MODEM, FAXOVERINTERNET& POTSLINES

File Size 602.98K  /  84 Page  

Maker

SGS Thomson Microelectronics
ST Microelectronics



JITONG TECHNOLOGY
(CHINA HK & SZ)
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Part: ST75C540
Maker: ST
Pack: QFP
Stock: Reserved
Unit price for :
    50: $4.55
  100: $4.33
1000: $4.10

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 Full text search : SUPER INTEGRATED DEVICES WITH DSP, AFE & MEMORIES FOR TELEPHONY, MODEM, FAX OVER INTERNET & POTS LINES SUPER INTEGRATED DEVICESWITH DSP, AFE & MEMORIES FORTELEPHONY,MODEM, FAXOVERINTERNET& POTSLINES
 Product Description search : SUPER INTEGRATED DEVICES WITH DSP, AFE & MEMORIES FOR TELEPHONY, MODEM, FAX OVER INTERNET & POTS LINES SUPER INTEGRATED DEVICESWITH DSP, AFE & MEMORIES FORTELEPHONY,MODEM, FAXOVERINTERNET& POTSLINES


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W4NRD0X-0000 W4NRD8C-U000 W4NXD8C-0000 W4NXD8C-L00 Diameter: 50.8mm; LCW substrates; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; ultra-low mircopipe density; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; standatd mircopipe density; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; low mircopipe density; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; select mircopipe density; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 76.2mm; LCW type; 6H-silicon carbide. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; LCW type; 6H-silicon carbide. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; lsemi-insulating (prototype); 6H-silicon carbide. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
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