| PART |
Description |
Maker |
| GET-BC-0006 |
Qualification Test Results on Si MMIC
|
CEL[California Eastern Labs]
|
| GET-30497 |
Qualification Test Results on Si MMIC 资质测试结果对硅单片
|
California Eastern Laboratories, Inc.
|
| AT25F512A |
SPI EEPROM PRODUCT QUALIFICATION
|
ATMEL Corporation
|
| ISL6405ERZ-T ISL6367CRZ ISL6367CRZ-T ISL6367CRZ-TS |
PCN13024 ?ASECL Reliability Qualification Summary
|
Intersil Corporation
|
| TS87C51RD2 TS83C51RD2 |
Qualification Package TS87C51RD2 / TS83C51RD2 CMOS 0.5Um
|
ATMEL[ATMEL Corporation]
|
| KDB15N50 |
Low Gate Charge Qg results in Simple Drive Requirement Reduced rDS(ON)
|
TY Semiconductor Co., L...
|
| 4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
| EFM32G290F32-BGA112 EFM32G890F32-BGA112 EFM32G840F |
Updated specifications based on the results of additional silicon characterization
|
Silicon Laboratories
|
| 6470 |
Test Probe; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes RoHS Compliant: Yes INTERCONNECTION DEVICE
SMD Microtip Test Probe Set
|
Pomona Electronics
|
| TC57 TC572502ECT TC573002ECT TC573302ECT TC573002 |
The TC57 is a low dropout regulator controller that operates with an external PNP pass transistor, allowing the user to tailor the LDO characteristics to suit the application at hand. This results in lower dropout operation (and often lowe
Line Regulator Controller
|
MICROCHIP[Microchip Technology]
|
