| PART |
Description |
Maker |
| EVAL-AD5522EBDZ EVAL-AD5522EBUZ |
Quad Parametric Measurement Unit with Integrated 16-Bit Level Setting DACs
|
Analog Devices
|
| AD5522JSVUZ |
Quad Parametric Measurement Unit With Integrated 16-Bit Level Setting DACs SPECIALTY ANALOG CIRCUIT, PQFP80
|
Analog Devices, Inc.
|
| MAX9952 |
Dual Per-Pin Parametric Measurement Units
|
Maxim
|
| AD5520JST AD5520JST-REEL |
Per-pin Parametric Measurement Unit / Source Measure Unit
|
Analog Devices
|
| TLP202A-14 |
Telecommunications Measurement and Control Equipment Data Acquisition System Measurement Equipment
|
Toshiba Semiconductor
|
| TLP592A |
Telecommunications Measurement and Control Equipment Data Acquisition System Measurement Equipment
|
Toshiba Semiconductor
|
| AT49F001 AT49F001T |
1-megabit 5-volt Only Flash Memory(1M5V闪速存储器)
From old datasheet system
128K x 8 (1M bit), 5-Volt-Only, Top or Bottom Boot Parametric Block Flash
|
Atmel Corp.
|
| CD4043BMS CD4043BMSH CD4044BMS CD4044BMSH FN3311 C |
Single 100Mbps Digital Isolator with Enable 8-SOIC -40 to 125
CMOS Quad Clocked “DLatch
R/S Latches, Tri-State, Quad, Rad-Hard, CMOS, Logic
CMOS Quad Clocked “D” Latch
From old datasheet system
CMOS Quad 3 State R/S Latches
CMOS Quad Clocked D Latch
CMOS Quad Clocked “D Latch
|
INTERSIL[Intersil Corporation]
|
| B57861S0103040 B57861S0104040 B57861S0202 B57861S0 |
Temperature Measurement
|
EPCOS
|
| B57885S0303_000 B57885S0103_001 B57885S0103_002 B5 |
Temperature Measurement
|
EPCOS[EPCOS]
|
