| PART |
Description |
Maker |
| TLP3116 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS/MEMORY TESTERS BOARD TESTERS/SCANNERS
From old datasheet system
|
Toshiba Corporation
TOSHIBA[Toshiba Semiconductor]
|
| TLP209D-14 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Semiconductor
|
| TLP3230 TLP323007 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| 1680A 1680AD 1681A 1681AD 1682A 1682AD 1683A 1683A |
1680A Standalone Logic Analyzer with 800 MHz Timing/200 MHz State, 136 Channels, 1M Memory
1680AD Standalone Logic Analyzer with 800 MHz Timing/200 MHz State, 136 Channels, 4M Memory
1681A Standalone Logic Analyzer with 800 MHz Timing/200 MHz State, 102 Channels, 1M Memory
1681AD Standalone Logic Analyzer with 800 MHz Timing/200 MHz State, 102 Channels, 4M Memory
1682A Standalone Logic Analyzer with 800 MHz Timing/200 MHz State, 68 Channels, 1M Memory
1682AD Standalone Logic Analyzer with 800 MHz Timing/200 MHz State, 68 Channels, 4M Memory
1683A Standalone Logic Analyzer with 800 MHz Timing/200 MHz State, 34 Channels, 1M Memory
1683AD Standalone Logic Analyzer with 800 MHz Timing/200 MHz State, 34 Channels, 4M Memory
1690A PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State, 136 Channels, 1M Memory
1690AD PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State, 136 Channels, 4M Memory
1691A PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State, 102 Channels, 1M Memory
1691AD PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State, 102 Channels, 4M Memory
1692A PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State, 68 Channels, 1M Memory
1692AD PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State, 68 Channels, 4M Memory
1693A PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State, 34 Channels, 1M Memory
1693AD PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State, 34 Channels, 4M Memory
|
Agilent (Hewlett-Packard)
|
| AT17LV256A-10JC AT17LV040A-10BJC AT17LV010A-10BJC |
FPGA Configuration EEPROM Memory 2M X 1 CONFIGURATION MEMORY, PQCC44
5015 RR 19#16 PIN PLUG FPGA配置EEPROM存储
FPGA Configuration EEPROM Memory 4M X 1 CONFIGURATION MEMORY, PQCC44
FPGA Configuration EEPROM Memory 1M X 1 CONFIGURATION MEMORY, DSO8
FPGA Configuration EEPROM Memory 2M X 1 CONFIGURATION MEMORY, PQFP44
High Speed CMOS Logic Dual Monostable Multivibrators with Reset 16-TSSOP -55 to 125 FPGA配置EEPROM存储
High Speed CMOS Logic Dual Monostable Multivibrators with Reset 16-SOIC -55 to 125 高速CMOS逻辑可复位双重单稳态多谐振荡器 SOIC-16封装 工作温度55℃_125
FPGA Configuration EEPROM Memory FPGA配置EEPROM存储
高速CMOS逻辑可复位双重单稳态多谐振荡器 PDIP-16封装 工作温度55℃_125
5015 RR 19#16 SKT PLUG
High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-PDIP -55 to 125
5015 RR 8#16 PIN PLUG L/C
High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-SO -55 to 125
PhotoMOS Relay; Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No; Supply Voltage:5V RoHS Compliant: No
Connector assemblies, Ribbon (Flat); Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No RoHS Compliant: No
High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-SOIC -55 to 125
High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-TSSOP -55 to 125
5015 RR 4#12 SKT PLUG
High Speed CMOS Logic 4-Bit Parallel Access Register 16-TSSOP -55 to 125
High Speed CMOS Logic Dual 4-Input AND Gates 14-SOIC -55 to 125
High Speed CMOS Logic Dual 4-Input AND Gates 14-PDIP -55 to 125
HV7 33W WCDMA NH780HS
|
Atmel, Corp.
Atmel Corp.
ATMEL Corporation
|
| 1N974B 1N963B 1N965B 1N962B 1N970B 1N960B 1N968D 1 |
0.5W, silicon zener diode. Zener voltage 56V. Test current 2.2mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 30V. Test current 4.2mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 62V. Test current 2.0mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 120V. Test current 1.0mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 120V. Test current 1.0mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 75V. Test current 1.7mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 22V. Test current 5.6mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 39V. Test current 3.2mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 68V. Test current 1.8mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 160V. Test current 0.80mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 150V. Test current 0.85mA. -20% tolerance.
0.5W SILICON ZENER DIODES
Low Current Operation at 250??A???Low Reverse Leakage,Low Noise Zener Diode(250??A?・￥?????μ?μ?????°????????????μ?μ?????????a?￡°???é???o3?o???????) 50μA低电流操作，低反向漏，低噪声稳压二极管（250μA工作电流，小反向漏电流，低噪声，齐纳二极管）
PC 4/ 5-ST-7,62 .5W硅稳压二极管
Low Current Operation at 250?录A茂录?Low Reverse Leakage,Low Noise Zener Diode(250?录A氓路楼盲陆?莽?碌忙碌?茫??氓掳?氓??氓??忙录?莽?碌忙碌?茫??盲陆?氓?陋氓拢掳茫??茅陆?莽潞鲁盲潞?忙??莽庐隆)
0.5W, silicon zener diode. Zener voltage 180V. Test current 0.68mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 180V. Test current 0.68mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 200V. Test current 0.65mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 150V. Test current 0.85mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 68V. Test current 1.8mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 22V. Test current 5.6mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 7.5V. Test current 16.5mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 130V. Test current 0.95mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 51V. Test current 2.5mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 62V. Test current 2.0mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 56V. Test current 2.2mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 47V. Test current 2.7mA. -10% tolerance.
|
JGD[Jinan Gude Electronic Device]
济南固锝电子器件有限公司
Jinan Gude Electronic Device Co., Ltd.
Semtech, Corp.
娴???洪??靛??ㄤ欢??????
Jinan Gude Electronic D...
|
| XC17S50APDG8C XC17S50ASO20C |
XC2S50 PROM C grade 559200 X 1 CONFIGURATION MEMORY, PDIP8
SERIAL PROM FOR 50000 SYSTEM GATE LOGIC 559200 X 1 CONFIGURATION MEMORY, PDSO20
|
Xilinx, Inc.
|
| IT3M-200S-BGA IT3D-200S-BGA IT3D-300S-BGA IT3M-300 |
IT3 Test Vehicle Assembly Yield Test
|
Hirose Electric
|
| B10-05 B10-03 |
RF Relays / BGA Surface Mount / Ability to pass GHz signals IC Testers
|
Electronic Theatre Controls, Inc.
|
| CAT28F002 CAT28F002PI-90BT CAT28F002NI-90BT CAT28F |
90ns 2M-bit CMOS boot block flash memory
150ns 2M-bit CMOS boot block flash memory
120ns 2M-bit CMOS boot block flash memory
2 Megabit CMOS Boot Block Flash Memory
High Speed CMOS Logic 8-Stage Shift-and-Store Bus Register with 3-Stage Outputs 16-PDIP -55 to 125
|
http://
CATALYST[Catalyst Semiconductor]
|
| 1760 |
WOODHEAD? TESTERS PERFORM BASIC-VERIFICATION AND MULTIFUNCTION WIRE TESTING WITH COMPACT, SIMPLE-TO-USE DEVICES THAT
|
Molex Electronics Ltd.
|
| AT29LV512-25TI AT29LV512-25TC AT29LV512-25JI |
512K 64K x 8 3-volt Only CMOS Flash Memory
High Speed CMOS Logic Quad 2-Input NAND Gates 14-PDIP -55 to 125
High Speed CMOS Logic 4-Bit Binary Ripple Counter 14-SOIC -55 to 125
|
Atmel Corp.
|
|
