| PART |
Description |
Maker |
| MAX9951DCCB MAX9951FCCB MAX9952 |
Dual Per-Pin Parametric Measurement Units
|
Maxim Integrated Products, Inc.
|
| MAX9949 |
(MAX9949 / MAX9950) Dual Per-Pin Parametric Measurement Units
|
Maxim Integrated Products
|
| AT49BV002A AT49BV002AN AT49V002ANT AT49V002AT AT49 |
AT49BV002A(N)(T) [Updated 8/03. 19 Pages] 256K x 8 (2M bit). 2.7-Volt Read and 2.7-Vold Write. Top or Bottom Boot Parametric Block Flash
256K x 8 (2M bit), 2.7-Volt Read and 2.7-Volt Write, Top Boot Parametric Block Flash
256K x 8 (2M bit), 2.7-Volt Read and 2.7-Volt Write, Bottom Boot Parametric Block Flash
|
Atmel
|
| 4082A |
Parametric Test System
|
Keysight Technologies
|
| AT49F002T |
256K x 8 (2M bit), 5-Volt-Only, Top Boot Parametric Block Flash
|
Atmel
|
| AD5522 AD552208 |
Quad Parametric Measurement Unit with Integrated 16-Bit Level Setting DACs
|
Analog Devices
|
| ML9XX1104 ML925B11F |
Notice : Some parametric limits are subject to change InGaAsP DFB LASER DIODES
|
Mitsubishi Electric Semiconductor
Mitsubishi Electric Semicon...
|
| MAX522 MAX522CPA MAX522CSA MAX522EPA MAX522ESA 112 |
From old datasheet system
Dual, 8-Bit, Voltage-Output Serial DAC in 8-Pin SO Package
Dual / 8-Bit / Voltage-Output Serial DAC in 8-Pin SO Package
Dual Differential Drivers and Receivers With /-15-kV IEC ESD Protection 16-VQFN -40 to 85
|
MAXIM - Dallas Semiconductor
MAXIM[Maxim Integrated Products]
Maxim Integrated Products, Inc.
|
| AT49F002 AT49F002N-55TC |
x8 Flash EEPROM
From old datasheet system
256K x 8 (2M bit), 5-Volt-Only, Top or Bottom Boot Parametric Block Flash
|
Atmel Corp
|
| EN4514B EN4514 |
PIN Diode, 50V, 50mA, rs=2.5 Ohm(typ), Dual CP
PIN Diode for VHF, UHF, AGC Applications
|
ON Semiconductor
Sanyo Semicon Device
|
| AT49F001AT-55VI AT49F001A AT49F001A-45JI AT49F001A |
128K x 8 (1M bit), 5-Volt-Only, Top or Bottom Boot Parametric Block Flash.
1-MEGABIT (128 X 8) 5-VOLT ONLY FLASH MEMORY
|
ATMEL[ATMEL Corporation]
|
| CPC2014NTR |
8-Pin SOIC Dual OptoMOS垄莽 Relay
8-Pin SOIC Dual OptoMOS? Relay
|
Clare, Inc.
|
