PART |
Description |
Maker |
SRF-1016Z SRF-2016Z SRQ-2116Z |
Reliability Qualification Report 可靠性鉴定报
|
Electronic Theatre Controls, Inc. Stanford Microdevices
|
STQ1016Z STQ3016Z STQ-1016Z STQ-3016Z |
(STQ-x016Z) Reliability Qualification Report
|
ETC
|
GET-30497 |
Qualification Test Results
|
CEL
|
GET-30704 |
Qualification Test Results on Si MMIC
|
CEL[California Eastern Labs]
|
GET-BC-0006 |
Qualification Test Results on Si MMIC
|
CEL[California Eastern Labs]
|
AS8221-ASSP |
FlexRay??Standard Transceiver; Package Type: SSOP-20; Temperature Range: -40 - 125 掳C; Automotive Qualification: X
|
Austriamicrosystems AG
|
AT17LV65 |
65/128/256/512K-bit and 1/2/4M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification
|
Atmel Corp
|
DVFL283R3SR/ES-XXX DVFL2805SDL/H-XXX DVFL2815SDL/H |
HIGH RELIABILITY HYBRID DC-DC CONVERTERS 高可靠性的混合型DC - DC变换 HIGH RELIABILITY HYBRID DC-DC CONVERTERS 高可靠性的混合DC - DC变换
|
Delta Electronics, Inc.
|
2N3904CSM |
GENERAL PURPOSE NPN TRANSISTOR IN A HERMETICALLY SEALED CERAMIC SURFACE MOUNT PACKAGE FOR HIGH RELIABILITY APPLICATIONS General Purpose NPN Transistor In a Hermetic Surface Mount Package For High Reliability Application(通用NPN晶体管(高可靠性、表贴型封装
|
SemeLAB SEME-LAB[Seme LAB]
|
5962F9671701VRC 5962F9671701VXC ACTS240MS ACTS240K |
High Reliability/ Radiation Hardened Octal Buffer/Line Driver/ Three-State High Reliability, Radiation Hardened Octal Buffer/Line Driver, Three-State High Reliability Radiation Hardened Octal Buffer/Line Driver Three-State From old datasheet system
|
INTERSIL[Intersil Corporation]
|
HPH12002M HPH12001M HPH05001M HPH05002M |
High Reliability
|
SHINDENGEN[Shindengen Electric Mfg.Co.Ltd]
|