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GeneSiC Semiconductor, Inc.
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| Part No. |
GA100SBJT12-FR4
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| OCR Text |
... be conn ected to isolated hotplates while connected to the test board f or high- temperature testing as desired. it is also recommended to probe any device voltages (i.e. v gs , v ds ) as close as possible to the device for a... |
| Description |
Double Pulse Test Board
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| File Size |
524.66K /
6 Page |
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